DE69119439T2 - Substratvorspannung Detektorschaltung - Google Patents

Substratvorspannung Detektorschaltung

Info

Publication number
DE69119439T2
DE69119439T2 DE69119439T DE69119439T DE69119439T2 DE 69119439 T2 DE69119439 T2 DE 69119439T2 DE 69119439 T DE69119439 T DE 69119439T DE 69119439 T DE69119439 T DE 69119439T DE 69119439 T2 DE69119439 T2 DE 69119439T2
Authority
DE
Germany
Prior art keywords
detector circuit
substrate bias
bias detector
substrate
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69119439T
Other languages
English (en)
Other versions
DE69119439D1 (de
Inventor
Ching-Yuh Tsay
Narasimhan Iyengar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=23886095&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69119439(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE69119439D1 publication Critical patent/DE69119439D1/de
Application granted granted Critical
Publication of DE69119439T2 publication Critical patent/DE69119439T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/205—Substrate bias-voltage generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • G11C5/146—Substrate bias generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Nonlinear Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dram (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
DE69119439T 1990-02-05 1991-01-25 Substratvorspannung Detektorschaltung Expired - Fee Related DE69119439T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US47506190A 1990-02-05 1990-02-05

Publications (2)

Publication Number Publication Date
DE69119439D1 DE69119439D1 (de) 1996-06-20
DE69119439T2 true DE69119439T2 (de) 1996-09-26

Family

ID=23886095

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69119439T Expired - Fee Related DE69119439T2 (de) 1990-02-05 1991-01-25 Substratvorspannung Detektorschaltung

Country Status (4)

Country Link
EP (1) EP0441201B1 (de)
JP (1) JP3258675B2 (de)
KR (1) KR100216435B1 (de)
DE (1) DE69119439T2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0154167B1 (ko) * 1994-09-12 1998-10-15 김영환 백 바이어스 검출회로
JPH09213073A (ja) * 1996-02-06 1997-08-15 Mitsubishi Electric Corp 半導体集積回路

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4288865A (en) * 1980-02-06 1981-09-08 Mostek Corporation Low-power battery backup circuit for semiconductor memory
USRE32200E (en) * 1980-11-03 1986-07-08 Fairchild Semiconductor Corporation MOS battery backup controller for microcomputer random access memory
JPS6238591A (ja) * 1985-08-14 1987-02-19 Fujitsu Ltd 相補型の半導体メモリ装置
JPS62121996A (ja) * 1985-11-22 1987-06-03 Hitachi Ltd 半導体装置
US4794278A (en) * 1987-12-30 1988-12-27 Intel Corporation Stable substrate bias generator for MOS circuits

Also Published As

Publication number Publication date
KR100216435B1 (ko) 1999-08-16
JPH07169913A (ja) 1995-07-04
EP0441201A2 (de) 1991-08-14
DE69119439D1 (de) 1996-06-20
EP0441201A3 (en) 1992-04-15
KR910015862A (ko) 1991-09-30
EP0441201B1 (de) 1996-05-15
JP3258675B2 (ja) 2002-02-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8310 Action for declaration of annulment
8313 Request for invalidation rejected/withdrawn
8339 Ceased/non-payment of the annual fee