DE69106713D1 - Detektorschaltung. - Google Patents

Detektorschaltung.

Info

Publication number
DE69106713D1
DE69106713D1 DE69106713T DE69106713T DE69106713D1 DE 69106713 D1 DE69106713 D1 DE 69106713D1 DE 69106713 T DE69106713 T DE 69106713T DE 69106713 T DE69106713 T DE 69106713T DE 69106713 D1 DE69106713 D1 DE 69106713D1
Authority
DE
Germany
Prior art keywords
detector circuit
detector
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69106713T
Other languages
English (en)
Other versions
DE69106713T2 (de
Inventor
Martin Fischer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Hewlett Packard GmbH Germany
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard GmbH Germany filed Critical Hewlett Packard GmbH Germany
Publication of DE69106713D1 publication Critical patent/DE69106713D1/de
Application granted granted Critical
Publication of DE69106713T2 publication Critical patent/DE69106713T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69106713T 1991-11-11 1991-11-11 Detektorschaltung. Expired - Fee Related DE69106713T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP91119165A EP0541837B1 (de) 1991-11-11 1991-11-11 Detektorschaltung

Publications (2)

Publication Number Publication Date
DE69106713D1 true DE69106713D1 (de) 1995-02-23
DE69106713T2 DE69106713T2 (de) 1995-05-11

Family

ID=8207322

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69106713T Expired - Fee Related DE69106713T2 (de) 1991-11-11 1991-11-11 Detektorschaltung.

Country Status (4)

Country Link
US (1) US5336944A (de)
EP (1) EP0541837B1 (de)
JP (1) JP3308996B2 (de)
DE (1) DE69106713T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2707012B1 (de) * 1993-06-22 1995-09-29 Asulab Sa
DE69326004T2 (de) * 1993-09-20 1999-11-25 Hewlett-Packard Gmbh Testapparat mit grosser Kapazität
DE69326003T2 (de) * 1993-09-20 1999-11-25 Hewlett-Packard Gmbh Testapparat zum Testen und Handhaben einer Vielzahl von Vorrichtungen
US5544175A (en) * 1994-03-15 1996-08-06 Hewlett-Packard Company Method and apparatus for the capturing and characterization of high-speed digital information
US5982827A (en) * 1997-05-14 1999-11-09 Hewlett-Packard Co. Means for virtual deskewing of high/intermediate/low DUT data
US5998985A (en) * 1998-02-20 1999-12-07 Fluke Corporation Voltage indicator using serial comparison voltage measurement
US6060919A (en) * 1998-12-04 2000-05-09 Ramtron International Corporation CMOS preferred state power-up latch
US6262602B1 (en) * 1999-03-18 2001-07-17 Agilent Technologies, Inc. Incident-edge detecting probe
US9541603B2 (en) * 2013-07-10 2017-01-10 Apple Inc. Method and apparatus for power glitch detection in integrated circuits

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4524291A (en) * 1983-01-06 1985-06-18 Motorola, Inc. Transition detector circuit
US4680542A (en) * 1985-05-22 1987-07-14 Krupp Gerald L Logic circuit tester
US4779042A (en) * 1986-12-23 1988-10-18 Grumman Aerospace Corporation Computer-aided probe with tri-state circuitry test capability
DE3860705D1 (de) * 1988-01-28 1990-10-31 Hewlett Packard Gmbh Erkennungsschaltung fuer binaersignalzustandswechsel.
US5210527A (en) * 1989-06-28 1993-05-11 Ceridian Corporation Programmable spike detector
US4968902A (en) * 1989-08-02 1990-11-06 Tektronix, Inc. Unstable data recognition circuit for dual threshold synchronous data

Also Published As

Publication number Publication date
JPH05223900A (ja) 1993-09-03
US5336944A (en) 1994-08-09
JP3308996B2 (ja) 2002-07-29
DE69106713T2 (de) 1995-05-11
EP0541837A1 (de) 1993-05-19
EP0541837B1 (de) 1995-01-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES DEUTSCHLAND GMBH, 71034 BOEBL

8327 Change in the person/name/address of the patent owner

Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG

8339 Ceased/non-payment of the annual fee