DE69118596D1 - Wellenform-Beobachtungssystem, insbesondere für optische Zeitbereichreflektometer - Google Patents

Wellenform-Beobachtungssystem, insbesondere für optische Zeitbereichreflektometer

Info

Publication number
DE69118596D1
DE69118596D1 DE69118596T DE69118596T DE69118596D1 DE 69118596 D1 DE69118596 D1 DE 69118596D1 DE 69118596 T DE69118596 T DE 69118596T DE 69118596 T DE69118596 T DE 69118596T DE 69118596 D1 DE69118596 D1 DE 69118596D1
Authority
DE
Germany
Prior art keywords
time domain
observation system
optical time
waveform observation
domain reflectometers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69118596T
Other languages
English (en)
Other versions
DE69118596T2 (de
Inventor
Takashi Sakamoto
Satoshi Makita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Application granted granted Critical
Publication of DE69118596D1 publication Critical patent/DE69118596D1/de
Publication of DE69118596T2 publication Critical patent/DE69118596T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
DE69118596T 1990-07-10 1991-07-08 Wellenform-Beobachtungssystem, insbesondere für optische Zeitbereichreflektometer Expired - Lifetime DE69118596T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2181735A JP2909159B2 (ja) 1990-07-10 1990-07-10 平滑化処理方法および平滑化処理による雑音除去装置およびそれを用いる光パルス試験装置

Publications (2)

Publication Number Publication Date
DE69118596D1 true DE69118596D1 (de) 1996-05-15
DE69118596T2 DE69118596T2 (de) 1996-11-28

Family

ID=16105974

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69118596T Expired - Lifetime DE69118596T2 (de) 1990-07-10 1991-07-08 Wellenform-Beobachtungssystem, insbesondere für optische Zeitbereichreflektometer

Country Status (4)

Country Link
US (1) US5129721A (de)
EP (1) EP0466087B1 (de)
JP (1) JP2909159B2 (de)
DE (1) DE69118596T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5479251A (en) * 1993-12-30 1995-12-26 Corning Incorporated Methods for determining optical properties of optical waveguide fibers using an optical time domain reflectometer
US5528356A (en) * 1995-03-20 1996-06-18 Tektronix, Inc. Apparatus and method for displaying multiple sample spacing waveform segments
JP2914217B2 (ja) * 1995-04-28 1999-06-28 安藤電気株式会社 光線路試験装置およびその方法
JP2914225B2 (ja) * 1995-06-30 1999-06-28 安藤電気株式会社 光ファイバの試験方法
JP3383236B2 (ja) * 1998-12-01 2003-03-04 株式会社日立製作所 エッチング終点判定方法及びエッチング終点判定装置
JP2003050181A (ja) * 2001-08-03 2003-02-21 Ando Electric Co Ltd 光ファイバ測定装置
US20040070750A1 (en) * 2002-10-09 2004-04-15 Iannelli John M. Optical time domain reflectometry system and method
EP2690420B1 (de) * 2012-06-14 2014-08-13 Alcatel Lucent Verfahren zur Schätzung eines Reflexionsprofils eines optischen Kanals
CN107852236A (zh) * 2015-06-16 2018-03-27 昇宰股份公司 光线路监控系统
JP6680139B2 (ja) * 2016-08-10 2020-04-15 株式会社島津製作所 データ平滑化方法及びその方法を実行するプログラム
US10101240B1 (en) * 2017-04-27 2018-10-16 Viavi Solutions France SAS Optical time-domain reflectometer device including combined trace display
WO2021038648A1 (ja) * 2019-08-23 2021-03-04 日本電信電話株式会社 光ファイバ試験方法、光ファイバ試験装置、およびプログラム
CN114142920A (zh) * 2020-09-03 2022-03-04 华为技术有限公司 一种光信号检测装置、方法及相关设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63285669A (ja) * 1987-05-19 1988-11-22 Fujitsu Ltd 信号平滑化回路
JPH01141331A (ja) * 1987-11-27 1989-06-02 Anritsu Corp 光パルス試験器
US4984253A (en) * 1988-06-03 1991-01-08 Hughes Aircraft Company Apparatus and method for processing simultaneous radio frequency signals
JPH02227657A (ja) * 1989-02-28 1990-09-10 Showa Electric Wire & Cable Co Ltd 部分放電検出装置

Also Published As

Publication number Publication date
JP2909159B2 (ja) 1999-06-23
DE69118596T2 (de) 1996-11-28
EP0466087A2 (de) 1992-01-15
US5129721A (en) 1992-07-14
JPH0469541A (ja) 1992-03-04
EP0466087A3 (en) 1992-11-25
EP0466087B1 (de) 1996-04-10

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Legal Events

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8364 No opposition during term of opposition