DE69118065T2 - Oberflächenemittierender Halbleiterlaser und Verfahren zu seiner Herstellung - Google Patents
Oberflächenemittierender Halbleiterlaser und Verfahren zu seiner HerstellungInfo
- Publication number
- DE69118065T2 DE69118065T2 DE69118065T DE69118065T DE69118065T2 DE 69118065 T2 DE69118065 T2 DE 69118065T2 DE 69118065 T DE69118065 T DE 69118065T DE 69118065 T DE69118065 T DE 69118065T DE 69118065 T2 DE69118065 T2 DE 69118065T2
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor
- layer
- semiconductor laser
- columnar
- group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title claims description 145
- 238000000034 method Methods 0.000 title claims description 37
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 239000000758 substrate Substances 0.000 claims description 33
- 238000000926 separation method Methods 0.000 claims description 27
- 238000005253 cladding Methods 0.000 claims description 23
- 150000001875 compounds Chemical class 0.000 claims description 20
- 230000003287 optical effect Effects 0.000 claims description 19
- 238000005530 etching Methods 0.000 claims description 18
- 229920002120 photoresistant polymer Polymers 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 8
- 238000001020 plasma etching Methods 0.000 claims description 8
- 238000002310 reflectometry Methods 0.000 claims description 7
- 238000010884 ion-beam technique Methods 0.000 claims description 6
- 229910052793 cadmium Inorganic materials 0.000 claims description 3
- 229910021476 group 6 element Inorganic materials 0.000 claims description 3
- 229910052753 mercury Inorganic materials 0.000 claims description 3
- 229910052760 oxygen Inorganic materials 0.000 claims description 3
- 229910052711 selenium Inorganic materials 0.000 claims description 3
- 229910052717 sulfur Inorganic materials 0.000 claims description 3
- 229910052714 tellurium Inorganic materials 0.000 claims description 3
- 229910052725 zinc Inorganic materials 0.000 claims description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 32
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 17
- 229910052681 coesite Inorganic materials 0.000 description 16
- 229910052906 cristobalite Inorganic materials 0.000 description 16
- 239000000377 silicon dioxide Substances 0.000 description 16
- 235000012239 silicon dioxide Nutrition 0.000 description 16
- 229910052682 stishovite Inorganic materials 0.000 description 16
- 229910052905 tridymite Inorganic materials 0.000 description 16
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 7
- 239000012071 phase Substances 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- HQWPLXHWEZZGKY-UHFFFAOYSA-N diethylzinc Chemical compound CC[Zn]CC HQWPLXHWEZZGKY-UHFFFAOYSA-N 0.000 description 6
- 239000002019 doping agent Substances 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 6
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 6
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 6
- 239000000203 mixture Substances 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 239000012808 vapor phase Substances 0.000 description 4
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 3
- 229910000070 arsenic hydride Inorganic materials 0.000 description 3
- 239000000460 chlorine Substances 0.000 description 3
- 229910052801 chlorine Inorganic materials 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000000313 electron-beam-induced deposition Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- SPVXKVOXSXTJOY-UHFFFAOYSA-N selane Chemical compound [SeH2] SPVXKVOXSXTJOY-UHFFFAOYSA-N 0.000 description 3
- 229910000058 selane Inorganic materials 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18308—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement
- H01S5/18338—Non-circular shape of the structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/42—Arrays of surface emitting lasers
- H01S5/423—Arrays of surface emitting lasers having a vertical cavity
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/16—Semiconductor lasers with special structural design to influence the modes, e.g. specific multimode
- H01S2301/166—Single transverse or lateral mode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18308—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18361—Structure of the reflectors, e.g. hybrid mirrors
- H01S5/18369—Structure of the reflectors, e.g. hybrid mirrors based on dielectric materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18386—Details of the emission surface for influencing the near- or far-field, e.g. a grating on the surface
- H01S5/18394—Apertures, e.g. defined by the shape of the upper electrode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2211—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on II-VI materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2222—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special electric properties
- H01S5/2224—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special electric properties semi-insulating semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4031—Edge-emitting structures
- H01S5/4068—Edge-emitting structures with lateral coupling by axially offset or by merging waveguides, e.g. Y-couplers
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24200090 | 1990-09-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69118065D1 DE69118065D1 (de) | 1996-04-25 |
| DE69118065T2 true DE69118065T2 (de) | 1996-09-19 |
Family
ID=17082765
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69118066T Expired - Lifetime DE69118066T2 (de) | 1990-09-12 | 1991-09-10 | Oberflächenemittierender Halbleiterlaser |
| DE69118065T Expired - Lifetime DE69118065T2 (de) | 1990-09-12 | 1991-09-10 | Oberflächenemittierender Halbleiterlaser und Verfahren zu seiner Herstellung |
| DE69116038T Expired - Lifetime DE69116038T2 (de) | 1990-09-12 | 1991-09-10 | Oberflächenemittierender Halbleiterlaser |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69118066T Expired - Lifetime DE69118066T2 (de) | 1990-09-12 | 1991-09-10 | Oberflächenemittierender Halbleiterlaser |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69116038T Expired - Lifetime DE69116038T2 (de) | 1990-09-12 | 1991-09-10 | Oberflächenemittierender Halbleiterlaser |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US5181221A (enExample) |
| EP (3) | EP0475371B1 (enExample) |
| KR (3) | KR100210288B1 (enExample) |
| DE (3) | DE69118066T2 (enExample) |
| TW (1) | TW229338B (enExample) |
Families Citing this family (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5404369A (en) * | 1990-09-12 | 1995-04-04 | Seiko Epson Corporation | Surface emission type semiconductor laser |
| US5356832A (en) * | 1990-09-12 | 1994-10-18 | Seiko Epson Corporation | Method of making surface emission type semiconductor laser |
| US5317584A (en) * | 1990-09-12 | 1994-05-31 | Seiko Epson Corporation | Surface emission type semiconductor laser |
| US5537666A (en) * | 1990-09-12 | 1996-07-16 | Seiko Epson Coropration | Surface emission type semiconductor laser |
| US5295148A (en) * | 1990-09-12 | 1994-03-15 | Seiko Epson Corporation | Surface emission type semiconductor laser |
| US5436922A (en) * | 1990-09-12 | 1995-07-25 | Seiko Epson Corporation | Surface emission type semiconductor laser |
| WO1992017925A1 (fr) * | 1991-03-28 | 1992-10-15 | Seiko Epson Corporation | Laser a semi-conducteurs du type emettant en surface et procede pour sa fabrication |
| WO1992021069A1 (fr) * | 1991-05-14 | 1992-11-26 | Seiko Epson Corporation | Dispositif de formation d'image |
| KR950007490B1 (ko) * | 1991-12-28 | 1995-07-11 | 엘지전자주식회사 | 반도체 레이저 |
| US5341001A (en) * | 1992-02-13 | 1994-08-23 | Matsushita Electric Industrial Co., Ltd. | Sulfide-selenide manganese-zinc mixed crystal photo semiconductor and laser diode |
| US5245622A (en) * | 1992-05-07 | 1993-09-14 | Bandgap Technology Corporation | Vertical-cavity surface-emitting lasers with intra-cavity structures |
| US5351255A (en) * | 1992-05-12 | 1994-09-27 | North Carolina State University Of Raleigh | Inverted integrated heterostructure of group II-VI semiconductor materials including epitaxial ohmic contact and method of fabricating same |
| JPH065975A (ja) * | 1992-06-22 | 1994-01-14 | Matsushita Electric Ind Co Ltd | 半導体レーザ |
| JP3095545B2 (ja) * | 1992-09-29 | 2000-10-03 | 株式会社東芝 | 面発光型半導体発光装置およびその製造方法 |
| JPH0722646A (ja) * | 1993-06-30 | 1995-01-24 | Mitsubishi Chem Corp | 電流ブロック層を有するled |
| SE501721C2 (sv) * | 1993-09-10 | 1995-05-02 | Ellemtel Utvecklings Ab | Laseranordning med i en optisk kavitet seriekopplade laserstrukturer |
| SE501722C2 (sv) * | 1993-09-10 | 1995-05-02 | Ellemtel Utvecklings Ab | Ytemitterande laseranordning med vertikal kavitet |
| US5621750A (en) * | 1994-01-20 | 1997-04-15 | Seiko Epson Corporation | Surface emission type semiconductor laser, method and apparatus for producing the same |
| JP3452982B2 (ja) * | 1994-08-24 | 2003-10-06 | ローム株式会社 | Ledプリントヘッド、およびledアレイチップ、ならびにそのledアレイチップの製造方法 |
| US5778018A (en) * | 1994-10-13 | 1998-07-07 | Nec Corporation | VCSELs (vertical-cavity surface emitting lasers) and VCSEL-based devices |
| US5838705A (en) * | 1996-11-04 | 1998-11-17 | Motorola, Inc. | Light emitting device having a defect inhibition layer |
| KR100322060B1 (ko) * | 1998-07-01 | 2002-03-08 | 김순택 | Crt용반도체레이저스크린및그제조방법 |
| KR100322061B1 (ko) * | 1998-07-01 | 2002-03-08 | 김순택 | Crt용반도체레이저스크린 |
| US6291839B1 (en) * | 1998-09-11 | 2001-09-18 | Lulileds Lighting, U.S. Llc | Light emitting device having a finely-patterned reflective contact |
| DE19911433B4 (de) | 1999-03-04 | 2006-06-08 | Infineon Technologies Ag | Optische Sendeanordnung |
| WO2001078012A2 (en) | 2000-04-10 | 2001-10-18 | Lenslet Ltd. | Shear inducing beamsplitter for interferometric image processing |
| US7170919B2 (en) * | 2003-06-23 | 2007-01-30 | Northrop Grumman Corporation | Diode-pumped solid-state laser gain module |
| KR100714639B1 (ko) * | 2003-10-21 | 2007-05-07 | 삼성전기주식회사 | 발광 소자 |
| JP2006128475A (ja) * | 2004-10-29 | 2006-05-18 | Mitsubishi Electric Corp | 半導体レーザ |
| KR100638732B1 (ko) * | 2005-04-15 | 2006-10-30 | 삼성전기주식회사 | 수직구조 질화물 반도체 발광소자의 제조방법 |
| US8373153B2 (en) | 2009-05-26 | 2013-02-12 | University Of Seoul Industry Cooperation Foundation | Photodetectors |
| US8367925B2 (en) * | 2009-06-29 | 2013-02-05 | University Of Seoul Industry Cooperation Foundation | Light-electricity conversion device |
| US8748862B2 (en) * | 2009-07-06 | 2014-06-10 | University Of Seoul Industry Cooperation Foundation | Compound semiconductors |
| US8395141B2 (en) * | 2009-07-06 | 2013-03-12 | University Of Seoul Industry Cooperation Foundation | Compound semiconductors |
| US8809834B2 (en) | 2009-07-06 | 2014-08-19 | University Of Seoul Industry Cooperation Foundation | Photodetector capable of detecting long wavelength radiation |
| US8227793B2 (en) | 2009-07-06 | 2012-07-24 | University Of Seoul Industry Cooperation Foundation | Photodetector capable of detecting the visible light spectrum |
| US8368990B2 (en) * | 2009-08-21 | 2013-02-05 | University Of Seoul Industry Cooperation Foundation | Polariton mode optical switch with composite structure |
| US8368047B2 (en) * | 2009-10-27 | 2013-02-05 | University Of Seoul Industry Cooperation Foundation | Semiconductor device |
| US8058641B2 (en) | 2009-11-18 | 2011-11-15 | University of Seoul Industry Corporation Foundation | Copper blend I-VII compound semiconductor light-emitting devices |
| US10186676B2 (en) * | 2017-03-13 | 2019-01-22 | Intel Corporation | Emissive devices for displays |
| US10651527B2 (en) | 2017-08-22 | 2020-05-12 | Qorvo Us, Inc. | Spatial power-combining devices with segmented waveguides and antennas |
| WO2020026573A1 (ja) * | 2018-07-31 | 2020-02-06 | ソニー株式会社 | 面発光半導体レーザ |
| KR102515120B1 (ko) * | 2019-01-21 | 2023-03-29 | 한온시스템 주식회사 | 스크롤 압축기 |
| US20230044675A1 (en) * | 2020-01-08 | 2023-02-09 | Sony Group Corporation | Light emitting element, method for manufacturing same, and light emitting element array |
| KR20230012705A (ko) | 2021-07-16 | 2023-01-26 | 주식회사 노브메타파마 | 고시페틴의 제조방법 |
| CN113675726A (zh) * | 2021-10-21 | 2021-11-19 | 福建慧芯激光科技有限公司 | 一种高速垂直腔面发射激光器的外延结构 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6179280A (ja) * | 1984-09-27 | 1986-04-22 | Agency Of Ind Science & Technol | 面発光型半導体レ−ザ装置及びその製造方法 |
| FR2606223B1 (fr) * | 1986-10-29 | 1996-03-01 | Seiko Epson Corp | Laser a semiconducteur et son procede de fabrication |
| JPH01125990A (ja) * | 1987-11-11 | 1989-05-18 | Mitsubishi Electric Corp | 半導体発光装置 |
| JPH01264285A (ja) * | 1988-04-15 | 1989-10-20 | Omron Tateisi Electron Co | 面発光型半導体レーザ |
| JPH01266779A (ja) * | 1988-04-19 | 1989-10-24 | Canon Inc | 面発光レーザ |
| US5031187A (en) * | 1990-02-14 | 1991-07-09 | Bell Communications Research, Inc. | Planar array of vertical-cavity, surface-emitting lasers |
| US5045897A (en) * | 1990-03-14 | 1991-09-03 | Santa Barbara Research Center | Quaternary II-VI materials for photonics |
| US5052016A (en) * | 1990-05-18 | 1991-09-24 | University Of New Mexico | Resonant-periodic-gain distributed-feedback surface-emitting semiconductor laser |
| US5068868A (en) * | 1990-05-21 | 1991-11-26 | At&T Bell Laboratories | Vertical cavity surface emitting lasers with electrically conducting mirrors |
| US5086430A (en) * | 1990-12-14 | 1992-02-04 | Bell Communications Research, Inc. | Phase-locked array of reflectivity-modulated surface-emitting lasers |
-
1991
- 1991-09-09 US US07/756,980 patent/US5181221A/en not_active Expired - Lifetime
- 1991-09-09 US US07/756,981 patent/US5182757A/en not_active Expired - Lifetime
- 1991-09-09 US US07/756,979 patent/US5181219A/en not_active Expired - Lifetime
- 1991-09-10 DE DE69118066T patent/DE69118066T2/de not_active Expired - Lifetime
- 1991-09-10 EP EP91115316A patent/EP0475371B1/en not_active Expired - Lifetime
- 1991-09-10 DE DE69118065T patent/DE69118065T2/de not_active Expired - Lifetime
- 1991-09-10 EP EP91115317A patent/EP0475372B1/en not_active Expired - Lifetime
- 1991-09-10 DE DE69116038T patent/DE69116038T2/de not_active Expired - Lifetime
- 1991-09-10 EP EP91115318A patent/EP0475373B1/en not_active Expired - Lifetime
- 1991-09-12 KR KR1019910016035A patent/KR100210288B1/ko not_active Expired - Lifetime
- 1991-09-12 KR KR1019910016034A patent/KR100210289B1/ko not_active Expired - Lifetime
- 1991-09-12 KR KR1019910016033A patent/KR100210290B1/ko not_active Expired - Lifetime
- 1991-09-14 TW TW080107294A patent/TW229338B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP0475372A2 (en) | 1992-03-18 |
| EP0475373B1 (en) | 1996-03-20 |
| US5181221A (en) | 1993-01-19 |
| KR920007283A (ko) | 1992-04-28 |
| US5182757A (en) | 1993-01-26 |
| DE69116038T2 (de) | 1996-06-20 |
| DE69118065D1 (de) | 1996-04-25 |
| EP0475372A3 (en) | 1992-08-05 |
| KR100210289B1 (ko) | 1999-07-15 |
| TW229338B (enExample) | 1994-09-01 |
| DE69118066T2 (de) | 1996-09-19 |
| DE69118066D1 (de) | 1996-04-25 |
| EP0475372B1 (en) | 1996-01-03 |
| EP0475371A3 (en) | 1992-08-05 |
| EP0475373A3 (en) | 1992-08-12 |
| US5181219A (en) | 1993-01-19 |
| KR100210290B1 (ko) | 1999-07-15 |
| EP0475373A2 (en) | 1992-03-18 |
| KR920007281A (ko) | 1992-04-28 |
| DE69116038D1 (de) | 1996-02-15 |
| EP0475371B1 (en) | 1996-03-20 |
| KR920007282A (ko) | 1992-04-28 |
| KR100210288B1 (ko) | 1999-07-15 |
| EP0475371A2 (en) | 1992-03-18 |
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