DE69030785T2 - Vorrichtung zur spektrochemischen Emissionsanalyse - Google Patents

Vorrichtung zur spektrochemischen Emissionsanalyse

Info

Publication number
DE69030785T2
DE69030785T2 DE69030785T DE69030785T DE69030785T2 DE 69030785 T2 DE69030785 T2 DE 69030785T2 DE 69030785 T DE69030785 T DE 69030785T DE 69030785 T DE69030785 T DE 69030785T DE 69030785 T2 DE69030785 T2 DE 69030785T2
Authority
DE
Germany
Prior art keywords
emission analysis
spectrochemical
spectrochemical emission
analysis
emission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69030785T
Other languages
English (en)
Other versions
DE69030785D1 (de
Inventor
Isao Fukui
Shuzo Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Application granted granted Critical
Publication of DE69030785D1 publication Critical patent/DE69030785D1/de
Publication of DE69030785T2 publication Critical patent/DE69030785T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1789—Time resolved
    • G01N2021/1791—Time resolved stroboscopic; pulse gated; time range gated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
DE69030785T 1989-06-08 1990-02-26 Vorrichtung zur spektrochemischen Emissionsanalyse Expired - Fee Related DE69030785T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1145712A JPH0676967B2 (ja) 1989-06-08 1989-06-08 発光分析装置

Publications (2)

Publication Number Publication Date
DE69030785D1 DE69030785D1 (de) 1997-07-03
DE69030785T2 true DE69030785T2 (de) 1997-12-04

Family

ID=15391381

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69030785T Expired - Fee Related DE69030785T2 (de) 1989-06-08 1990-02-26 Vorrichtung zur spektrochemischen Emissionsanalyse

Country Status (5)

Country Link
US (1) US5216482A (de)
EP (1) EP0401470B1 (de)
JP (1) JPH0676967B2 (de)
CN (1) CN1027520C (de)
DE (1) DE69030785T2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2522216B2 (ja) * 1991-02-28 1996-08-07 株式会社島津製作所 発光分光分析方法
JPH04326043A (ja) * 1991-04-25 1992-11-16 Shimadzu Corp 発光分光分析装置
DE19651677A1 (de) * 1996-12-12 1998-06-18 Spectro Analytical Instr Optisches Emmissionsspektrometer mit steuerbarer Blende
DE19753348A1 (de) * 1997-12-03 1999-06-10 Spectro Analytical Instr Gmbh Vorrichtung zur Erfassung und Quantifizierung von Element-Konzentrationsverteilungen in Feststoffen
AUPP573098A0 (en) 1998-09-04 1998-10-01 Generation Technology Research Pty Ltd Apparatus and method for analyzing material
US20030189456A1 (en) * 2002-01-08 2003-10-09 Foster Thomas H. TTl controller system for one or more devices and a method thereof
EP1351049A3 (de) * 2002-04-01 2004-02-25 Central Iron & Steel Research Institute Analysator für Metall
WO2007011729A2 (en) * 2005-07-20 2007-01-25 Thermo Niton Analyzers Llc Arc/spark optical emission spectroscopy correlated with spark location
US9072169B1 (en) 2010-07-13 2015-06-30 Cascodium Inc. Pulse generator and systems and methods for using same
CN102384784B (zh) * 2010-09-01 2015-05-20 北京普源精电科技有限公司 动态调节系统能量的分光光度计及其动态调节方法
DE102011114874A1 (de) * 2011-09-30 2013-04-04 Carl Zeiss Microscopy Gmbh Auswerteschaltung für einen optoelektronischen Detektor und Verfahren zum Aufzeichnen von Fluoreszenzereignissen
JP5974696B2 (ja) * 2012-07-13 2016-08-23 Ｊｆｅスチール株式会社 発光分光分析による偏析評価方法および偏析評価装置
CN103969245B (zh) * 2014-05-20 2016-03-23 江苏鑫知源仪器有限公司 一种真空光电直读光谱仪
DE102014010185A1 (de) * 2014-07-09 2016-01-14 Carl Zeiss Microscopy Gmbh Verfahren zum Betrieb eines Laser-Scanning-Mikroskops
CN104267004B (zh) * 2014-10-24 2018-04-24 合肥市再德高分子材料有限公司 一种光电直读光谱分析仪的样品激发系统
CN106442433A (zh) * 2016-09-29 2017-02-22 哈尔滨理工大学 一种基于iccd成像的聚合物击穿发光光谱测量系统
DE102019100290B4 (de) * 2019-01-08 2020-12-03 Spectro Analytical Instruments Gmbh Spektrometer mit mechanischer Blende

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1066431A (en) * 1962-09-27 1967-04-26 Hilger & Watts Ltd Improvements in or relating to methods of and means for spectrochemical analysis
US3531202A (en) * 1966-11-14 1970-09-29 Baird Atomic Inc Spectrometer readout system
DE3015352A1 (de) * 1980-04-22 1981-11-05 Kernforschungsanlage Jülich GmbH, 5170 Jülich Verfahren und vorrichtung zum spektoskopischen naschweis von an der oberflaeche eines festkoerpers befindlichen elementen
US4393327A (en) * 1981-07-29 1983-07-12 Wisconsin Alumni Research Foundation Electric spark type light source for producing light for spectroscopic analysis
JPS59182344A (ja) * 1983-03-31 1984-10-17 Shimadzu Corp 発光分光分析装置
JP2603998B2 (ja) * 1987-11-30 1997-04-23 株式会社島津製作所 発光分光分析装置

Also Published As

Publication number Publication date
CN1027520C (zh) 1995-01-25
EP0401470B1 (de) 1997-05-28
US5216482A (en) 1993-06-01
CN1047923A (zh) 1990-12-19
DE69030785D1 (de) 1997-07-03
EP0401470A3 (de) 1991-03-20
JPH0676967B2 (ja) 1994-09-28
JPH0310148A (ja) 1991-01-17
EP0401470A2 (de) 1990-12-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee