DE69029271T2 - Schutzvorrichtung gegen elektrostatische Entladung für einen IC-Anschluss und deren integrierte Struktur - Google Patents

Schutzvorrichtung gegen elektrostatische Entladung für einen IC-Anschluss und deren integrierte Struktur

Info

Publication number
DE69029271T2
DE69029271T2 DE69029271T DE69029271T DE69029271T2 DE 69029271 T2 DE69029271 T2 DE 69029271T2 DE 69029271 T DE69029271 T DE 69029271T DE 69029271 T DE69029271 T DE 69029271T DE 69029271 T2 DE69029271 T2 DE 69029271T2
Authority
DE
Germany
Prior art keywords
connection
protective device
electrostatic discharge
integrated structure
device against
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69029271T
Other languages
English (en)
Other versions
DE69029271D1 (de
Inventor
Athos Canclini
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
SGS Thomson Microelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SRL filed Critical SGS Thomson Microelectronics SRL
Publication of DE69029271D1 publication Critical patent/DE69029271D1/de
Application granted granted Critical
Publication of DE69029271T2 publication Critical patent/DE69029271T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Bipolar Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE69029271T 1990-12-21 1990-12-21 Schutzvorrichtung gegen elektrostatische Entladung für einen IC-Anschluss und deren integrierte Struktur Expired - Fee Related DE69029271T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP90830611A EP0492032B1 (de) 1990-12-21 1990-12-21 Schutzvorrichtung gegen elektrostatische Entladung für einen IC-Anschluss und deren integrierte Struktur

Publications (2)

Publication Number Publication Date
DE69029271D1 DE69029271D1 (de) 1997-01-09
DE69029271T2 true DE69029271T2 (de) 1997-04-17

Family

ID=8206044

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69029271T Expired - Fee Related DE69029271T2 (de) 1990-12-21 1990-12-21 Schutzvorrichtung gegen elektrostatische Entladung für einen IC-Anschluss und deren integrierte Struktur

Country Status (4)

Country Link
US (1) US5223737A (de)
EP (1) EP0492032B1 (de)
JP (1) JPH0548007A (de)
DE (1) DE69029271T2 (de)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5235489A (en) * 1991-06-28 1993-08-10 Sgs-Thomson Microelectronics, Inc. Integrated solution to high voltage load dump conditions
JPH0522099A (ja) * 1991-07-11 1993-01-29 Nissan Motor Co Ltd 半導体入力保護回路
US5384482A (en) * 1992-05-18 1995-01-24 Nec Corporation Semiconductor integrated circuit device having input protective circuit
US5477414A (en) * 1993-05-03 1995-12-19 Xilinx, Inc. ESD protection circuit
US5538907A (en) * 1994-05-11 1996-07-23 Lsi Logic Corporation Method for forming a CMOS integrated circuit with electrostatic discharge protection
US5493133A (en) * 1994-06-30 1996-02-20 Texas Instruments Incorporated PNP punchthrough-assisted protection device for special applications in CMOS technologies
US5500546A (en) * 1994-09-16 1996-03-19 Texas Instruments Incorporated ESD protection circuits using Zener diodes
EP0785576A3 (de) * 1995-09-29 1998-10-07 Texas Instruments Incorporated Schaltung mit einem Schutzmittel
US5850095A (en) * 1996-09-24 1998-12-15 Texas Instruments Incorporated ESD protection circuit using zener diode and interdigitated NPN transistor
JP3436462B2 (ja) * 1996-11-01 2003-08-11 三菱電機株式会社 半導体装置
US5990520A (en) * 1997-02-07 1999-11-23 Digital Equipment Corporation Method for fabricating a high performance vertical bipolar NPN or PNP transistor having low base resistance in a standard CMOS process
JPH10270640A (ja) * 1997-03-26 1998-10-09 Mitsubishi Electric Corp 半導体集積回路装置
SE512494C2 (sv) * 1997-09-02 2000-03-27 Ericsson Telefon Ab L M Skyddskrets
DE19743230C1 (de) 1997-09-30 1999-04-15 Siemens Ag Integrierte Halbleiterschaltung mit Schutzstruktur zum Schutz vor elektrostatischer Entladung
KR100374898B1 (ko) * 1997-09-30 2003-03-06 인피니언 테크놀로지스 아게 정전기 방전에 대비한 보호 구조물을 가지는 반도체 집적회로
SE9704149D0 (sv) * 1997-11-13 1997-11-13 Abb Research Ltd A semiconductor device of SiC and a transistor of SiC having an insulated gate
JP3244057B2 (ja) 1998-07-16 2002-01-07 日本電気株式会社 基準電圧源回路
JP3955396B2 (ja) * 1998-09-17 2007-08-08 株式会社ルネサステクノロジ 半導体サージ吸収素子
US6274909B1 (en) * 1999-11-12 2001-08-14 Etron Technology, Inc. Guard ring structure with deep N well on ESD devices
DE10028008A1 (de) * 2000-06-06 2001-12-13 Bosch Gmbh Robert Schutzvorrichtung gegen elektrostatische Entladungen
US6455919B1 (en) 2001-03-19 2002-09-24 International Business Machines Corporation Internally ballasted silicon germanium transistor
TW200305272A (en) * 2002-03-29 2003-10-16 Sanyo Electric Co Semiconductor integrated circuit device
US7196889B2 (en) * 2002-11-15 2007-03-27 Medtronic, Inc. Zener triggered overvoltage protection device
JP2004235199A (ja) * 2003-01-28 2004-08-19 Renesas Technology Corp 半導体装置
JP4223375B2 (ja) * 2003-11-14 2009-02-12 三菱電機株式会社 半導体装置
US7119401B2 (en) * 2004-01-07 2006-10-10 International Business Machines Corporation Tunable semiconductor diodes
JP2006080160A (ja) * 2004-09-07 2006-03-23 Toshiba Corp 静電保護回路
US7042028B1 (en) * 2005-03-14 2006-05-09 System General Corp. Electrostatic discharge device
US20060250732A1 (en) * 2005-05-06 2006-11-09 Peachey Nathaniel M Transient pulse, substrate-triggered biCMOS rail clamp for ESD abatement
US7564665B2 (en) * 2007-01-10 2009-07-21 Standard Microsystems Corporation Pad ESD spreading technique
JP2013073993A (ja) * 2011-09-27 2013-04-22 Semiconductor Components Industries Llc 半導体装置
JP2013073992A (ja) * 2011-09-27 2013-04-22 Semiconductor Components Industries Llc 半導体装置
FR3059165B1 (fr) * 2016-11-23 2019-01-25 Continental Automotive France Procede et dispositif de lecture de l'etat de variables de contact d'un vehicule automobile

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57136356A (en) * 1981-02-17 1982-08-23 Fujitsu Ltd Semiconductor device
GB2127214B (en) * 1982-09-10 1986-02-05 Standard Telephones Cables Ltd Semiconductor protection device for integrated circuits
JPS6281048A (ja) * 1985-10-04 1987-04-14 Toshiba Corp 入力保護回路
GB2185621B (en) * 1985-10-29 1988-12-14 Plessey Co Plc Protection structures
US5077591A (en) * 1986-09-30 1991-12-31 Texas Instruments Incorporated Electrostatic discharge protection for semiconductor input devices
JPS6455017A (en) * 1987-08-25 1989-03-02 Mitsubishi Electric Corp Protective circuit device for integrated circuit
FR2624655B1 (fr) * 1987-12-14 1990-05-11 Sgs Thomson Microelectronics Structure de protection d'un acces a un circuit integre

Also Published As

Publication number Publication date
EP0492032A1 (de) 1992-07-01
DE69029271D1 (de) 1997-01-09
JPH0548007A (ja) 1993-02-26
US5223737A (en) 1993-06-29
EP0492032B1 (de) 1996-11-27

Similar Documents

Publication Publication Date Title
DE69029271T2 (de) Schutzvorrichtung gegen elektrostatische Entladung für einen IC-Anschluss und deren integrierte Struktur
DE69220159T2 (de) Schutzstruktur gegen elektrostatische Entladungen
DE69226337D1 (de) Schutzstruktur gegen elektrostatische Entladungen
DE69530222D1 (de) Embolieelemente und gerät für ihre verabreichung
DE69531571D1 (de) Verbesserungen in Bezug auf Halbleitervorrichtungen
DE69421248D1 (de) Polierteil und Wafer-Poliervorrichtung
DE69504451T2 (de) Schutz gegen elektrostatische Entladungen für integrierte Schaltungen
DE69210753T2 (de) Auswahlvorrichtung für Zellen und dergleichen
DE69313718D1 (de) Elektrostatisches Voltmeter mit integrierten Hochspannungs-Schaltungen
DE69622251D1 (de) Elektrostatische Entladungsstruktur für eine Halbleiteranordnung
IT8619449A1 (it) Struttura integrata di protezione da scariche elettrostatiche e dispositivo a semiconduttore incorporante la stessa
DE69214040D1 (de) Gleichfeld-Gasentladungsanzeigeeinrichtung und diese verwendende Gasentladungsanzeigevorrichtung
DE69936677D1 (de) Schutzstruktur für eine integrierte Schaltungshalbleiteranordnung gegen elektrostatische Entladungen
DE69527453D1 (de) Schutzeinrichtung gegen Überspannungen in integrierten Schaltungen
DE69623509D1 (de) Integriertes Halbleiterbauelement mit Schutzvorrichtung gegen elektrostatische Entladungen
ITMI951600A0 (it) Circuito integrato con un gate di ossido e con un dispositivo di protezione al suo ingresso per la limitazione della tensione d'ingresso in particolare di sovratensioni elettrostatiche
DE69311753D1 (de) Antriebsapparat und damit ausgestatteter XY-Antriebsapparat
DE69531121D1 (de) Integrierte Halbleiteranordnung
DE69523964T2 (de) Anlegevorrichtung für einen externen Harnkatheter und Harnkatheter der eine solche Anlegevorrichtung enthält
KR960012414A (ko) 웨이퍼 검사장치
DE9400927U1 (de) Fixierset für einen Infusionsadapter sowie Deckpflaster für das Fixierset
DE9400903U1 (de) Spannungsprüfungseinrichtung
DE69408552D1 (de) Elektrostatische Entladungsschutzvorrichtung für integrierte MOS-Schaltungen
DE9408944U1 (de) Sandaufwirbelungsvorrichtung für Sandstrahlgeräte
DE69425791D1 (de) Fixiervorrichtung und damit versehenes Bilderzeugungsgerät

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee