DE69027821D1 - Zusammengesetzte Halbleiter-Anordnung für Überstrom-Detektion - Google Patents

Zusammengesetzte Halbleiter-Anordnung für Überstrom-Detektion

Info

Publication number
DE69027821D1
DE69027821D1 DE69027821T DE69027821T DE69027821D1 DE 69027821 D1 DE69027821 D1 DE 69027821D1 DE 69027821 T DE69027821 T DE 69027821T DE 69027821 T DE69027821 T DE 69027821T DE 69027821 D1 DE69027821 D1 DE 69027821D1
Authority
DE
Germany
Prior art keywords
semiconductor device
compound semiconductor
overcurrent detection
overcurrent
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69027821T
Other languages
English (en)
Other versions
DE69027821T2 (de
Inventor
Tetsujiro Tsunoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE69027821D1 publication Critical patent/DE69027821D1/de
Application granted granted Critical
Publication of DE69027821T2 publication Critical patent/DE69027821T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2644—Adaptations of individual semiconductor devices to facilitate the testing thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N59/00—Integrated devices, or assemblies of multiple devices, comprising at least one galvanomagnetic or Hall-effect element covered by groups H10N50/00 - H10N52/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1301—Thyristor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1305—Bipolar Junction Transistor [BJT]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1305—Bipolar Junction Transistor [BJT]
    • H01L2924/13055—Insulated gate bipolar transistor [IGBT]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1306—Field-effect transistor [FET]
    • H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Ceramic Engineering (AREA)
  • Inverter Devices (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
  • Power Conversion In General (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE69027821T 1989-09-01 1990-08-31 Zusammengesetzte Halbleiter-Anordnung für Überstrom-Detektion Expired - Fee Related DE69027821T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1227245A JPH0390872A (ja) 1989-09-01 1989-09-01 半導体装置

Publications (2)

Publication Number Publication Date
DE69027821D1 true DE69027821D1 (de) 1996-08-22
DE69027821T2 DE69027821T2 (de) 1996-12-19

Family

ID=16857794

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69027821T Expired - Fee Related DE69027821T2 (de) 1989-09-01 1990-08-31 Zusammengesetzte Halbleiter-Anordnung für Überstrom-Detektion

Country Status (5)

Country Link
US (1) US5023684A (de)
EP (1) EP0415439B1 (de)
JP (1) JPH0390872A (de)
KR (1) KR930011798B1 (de)
DE (1) DE69027821T2 (de)

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US5332973A (en) * 1992-05-01 1994-07-26 The University Of Manitoba Built-in fault testing of integrated circuits
DE4237828C2 (de) * 1992-11-04 1996-08-01 Eac Automation Consult Gmbh Einrichtung zur Störungserfassung
JPH07191114A (ja) * 1993-12-27 1995-07-28 Chodendo Sensor Kenkyusho:Kk Ｓｑｕｉｄ用キャリヤ
DE4410180A1 (de) * 1994-03-24 1995-09-28 Bosch Gmbh Robert Stromstärkemeßgerät
JPH09322559A (ja) * 1996-05-31 1997-12-12 Aisin Aw Co Ltd モータ駆動装置
US5990533A (en) * 1997-03-31 1999-11-23 Nec Corporation Semiconductor device including a magnetoresistance effect element functioning as a current detector
DE19739923C2 (de) * 1997-09-11 2002-02-28 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur gepulsten Hochstrombelastung integrierter Schaltungen und Strukturen
US6102210A (en) * 1997-10-27 2000-08-15 Sumitomo Bakelite Company Limited Carrier tape for electronic components
US5933306A (en) * 1998-01-14 1999-08-03 General Electric Company Circuit breaker with ground fault detection module
US6094330A (en) * 1998-01-14 2000-07-25 General Electric Company Circuit interrupter having improved current sensing apparatus
US6141197A (en) * 1998-03-10 2000-10-31 General Electric Company Smart residential circuit breaker
DE19821492A1 (de) * 1998-05-14 1999-11-25 Daimler Chrysler Ag Verfahren zur berührungslosen Messung eines einen Leiter durchfließenden Stromes mittels eines Hallsensors sowie Hallsensoranordnung
DE19959003A1 (de) * 1999-12-08 2001-06-13 Abb Research Ltd Elektronischer Schalter mit Überstrom-Schutzvorrichtung
JP4164615B2 (ja) * 1999-12-20 2008-10-15 サンケン電気株式会社 ホ−ル素子を備えた電流検出装置
US6225684B1 (en) * 2000-02-29 2001-05-01 Texas Instruments Tucson Corporation Low temperature coefficient leadframe
KR100390013B1 (ko) * 2000-10-05 2003-07-04 한국원자력연구소 핵연료봉 지지체 부착을 위한 레이저용접 장치
EP1381875A1 (de) 2001-04-09 2004-01-21 Koninklijke Philips Electronics N.V. Integrierte schaltung mit prüfschnittstelle für die stromversorgung
JP2003009508A (ja) * 2001-06-19 2003-01-10 Mitsubishi Electric Corp 電力用半導体装置
JP3988725B2 (ja) * 2002-04-04 2007-10-10 株式会社日立製作所 電力変換装置及びそれを備えた電力システム並びに移動体
US7199435B2 (en) * 2002-10-09 2007-04-03 Fairchild Semiconductor Corporation Semiconductor devices containing on-chip current sensor and methods for making such devices
JP4387119B2 (ja) * 2003-03-27 2009-12-16 三菱電機株式会社 半導体装置
DE10333089B4 (de) * 2003-07-21 2016-12-29 Infineon Technologies Ag Stromauswertevorrichtung und Verfahren zum Herstellen derselben
EP1772737A3 (de) 2005-10-08 2008-02-20 Melexis Technologies SA Baugruppe zur Strommessung
JP2007121239A (ja) * 2005-10-31 2007-05-17 Denso Corp 電流センサ及びその製造方法
DE202006013311U1 (de) * 2006-08-30 2008-01-03 Merten Gmbh & Co. Kg Anschlusseinheit eines Bussystems
US8324721B2 (en) * 2008-07-01 2012-12-04 Texas Instruments Incorporated Integrated shunt resistor with external contact in a semiconductor package
US7847391B2 (en) * 2008-07-01 2010-12-07 Texas Instruments Incorporated Manufacturing method for integrating a shunt resistor into a semiconductor package
KR101116172B1 (ko) * 2008-12-09 2012-03-06 주식회사 흙살림 친환경 새싹채소 재배용 키트 및 그를 이용한 새싹채소 재배방법
JP2011188123A (ja) * 2010-03-05 2011-09-22 Panasonic Corp ポーラ変調方式を用いた送信回路及び通信機器
JP5794777B2 (ja) 2010-12-22 2015-10-14 三菱電機株式会社 半導体装置
US8969985B2 (en) 2011-08-30 2015-03-03 Infineon Technologies Ag Semiconductor chip package and method
DE102012210261B4 (de) * 2012-06-19 2019-03-28 Semikron Elektronik Gmbh & Co. Kg Leistungshalbleitermodul und Verfahren zum Betrieb eines Leistungshalbleitermoduls
CN103022976B (zh) * 2012-12-13 2015-10-28 广州三晶电气有限公司 一种变频器输出短路保护电路及保护方法
US9482700B2 (en) * 2013-01-20 2016-11-01 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Current detector to sense current without being in series with conductor
EP3032268B1 (de) * 2014-12-09 2018-03-28 Rohm Co., Ltd. Integrierte Schaltung mit einem On-Chip-Hall-Sensor
US9564423B2 (en) 2015-06-23 2017-02-07 Infineon Technologies Ag Power package with integrated magnetic field sensor
IT201900016193A1 (it) 2019-09-12 2021-03-12 St Microelectronics Srl Dispositivo di potenza, sistema includente il dispositivo di potenza, metodo di fabbricazione del dispositivo di potenza e metodo di controllo del dispositivo di potenza

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JPS58151814A (ja) * 1982-03-04 1983-09-09 株式会社東芝 過電流保護回路付きｈスイツチ回路
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Also Published As

Publication number Publication date
US5023684A (en) 1991-06-11
EP0415439B1 (de) 1996-07-17
DE69027821T2 (de) 1996-12-19
EP0415439A3 (en) 1992-03-04
EP0415439A2 (de) 1991-03-06
KR910007155A (ko) 1991-04-30
KR930011798B1 (ko) 1993-12-21
JPH0390872A (ja) 1991-04-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee