DE69026224D1 - Gerät zur Messung der Teilchengrössenverteilung mit Verwendung der Beugung und Streuung eines Laserbündels - Google Patents

Gerät zur Messung der Teilchengrössenverteilung mit Verwendung der Beugung und Streuung eines Laserbündels

Info

Publication number
DE69026224D1
DE69026224D1 DE69026224T DE69026224T DE69026224D1 DE 69026224 D1 DE69026224 D1 DE 69026224D1 DE 69026224 T DE69026224 T DE 69026224T DE 69026224 T DE69026224 T DE 69026224T DE 69026224 D1 DE69026224 D1 DE 69026224D1
Authority
DE
Germany
Prior art keywords
diffraction
scattering
measuring
particle size
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69026224T
Other languages
English (en)
Other versions
DE69026224T2 (de
Inventor
Takeshi Niwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Application granted granted Critical
Publication of DE69026224D1 publication Critical patent/DE69026224D1/de
Publication of DE69026224T2 publication Critical patent/DE69026224T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4726—Detecting scatter at 90°

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69026224T 1989-12-18 1990-12-18 Gerät zur Messung der Teilchengrössenverteilung mit Verwendung der Beugung und Streuung eines Laserbündels Expired - Fee Related DE69026224T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1328736A JP2715604B2 (ja) 1989-12-18 1989-12-18 レーザ回折・散乱式粒度分布測定装置

Publications (2)

Publication Number Publication Date
DE69026224D1 true DE69026224D1 (de) 1996-05-02
DE69026224T2 DE69026224T2 (de) 1996-08-29

Family

ID=18213603

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69026224T Expired - Fee Related DE69026224T2 (de) 1989-12-18 1990-12-18 Gerät zur Messung der Teilchengrössenverteilung mit Verwendung der Beugung und Streuung eines Laserbündels

Country Status (4)

Country Link
US (1) US5105093A (de)
EP (1) EP0434352B1 (de)
JP (1) JP2715604B2 (de)
DE (1) DE69026224T2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5327210A (en) * 1989-07-11 1994-07-05 Minolta Camera Kabushiki Kaisha Light measurement device
DE69129260T2 (de) * 1990-11-03 1998-11-19 Horiba Ltd Gerät zur Messung der Teilchengrössenverteilung
JPH081482Y2 (ja) * 1990-11-17 1996-01-17 株式会社堀場製作所 粒度分布測定装置
JP2863874B2 (ja) * 1990-12-30 1999-03-03 株式会社堀場製作所 粒度分布測定装置
WO1992021955A1 (de) * 1991-06-07 1992-12-10 Reiner Weichert Vorrichtung und verfahren zur bestimmung von partikelgrössenverteilungen mittels streulichtmessungen
DE4130586A1 (de) * 1991-09-15 1993-03-18 Hund Helmut Gmbh Verfahren zur bestimmung der teilchengroesse-fraktionen in schwebestaeuben
GB2264556A (en) * 1992-02-21 1993-09-01 Hatfield Polytechnic Higher Ed Diffraction analysis of particle size, shape and orientation
JPH0816646B2 (ja) * 1992-09-28 1996-02-21 株式会社島津製作所 粒度分布測定装置
US5540494A (en) * 1994-06-03 1996-07-30 Purvis, Jr.; Norman B. Method and apparatus for determining absolute particle size, surface area and volume normalized fluorescence using forward angle light scatter intensity in flow cytometry
JP3397221B2 (ja) * 1994-06-23 2003-04-14 株式会社ニコン 測光装置
JP3375203B2 (ja) * 1994-08-08 2003-02-10 シスメックス株式会社 細胞分析装置
GB9717469D0 (en) * 1996-09-14 1997-10-22 Univ Hertfordshire Detection of hazardous airborne fibres
US6417920B1 (en) * 1999-05-11 2002-07-09 Shimadzu Corporation Particle size analyzer based on laser diffraction method
JP4266075B2 (ja) * 2001-02-19 2009-05-20 株式会社堀場製作所 粒径分布測定装置
US7847936B2 (en) * 2007-05-15 2010-12-07 Waters Technologies Corporation Evaporative light scattering device and methods of use thereof
DE102014007784A1 (de) 2014-05-22 2015-11-26 Friedrich-Schiller-Universität Jena Verfahren zur Bestimmung der Größe und der Verteilung der Anzahldichte von Partikeln einer Teilchenansammlung
KR102462995B1 (ko) * 2016-01-06 2022-11-03 엘지이노텍 주식회사 수광 모듈 및 그를 포함하는 먼지 센서
CN105973891B (zh) * 2016-07-25 2019-01-18 武汉大学 气体中凝聚态结构演变实时监测的图像识别装置及方法
CN106290371B (zh) * 2016-07-25 2019-01-04 武汉大学 一种气体凝聚态结构演变实时监测的图像识别装置及方法
CN106290369B (zh) * 2016-07-25 2019-01-04 武汉大学 流体中凝聚态结构演变实时监测的图像识别装置及方法
CN106290360B (zh) * 2016-07-25 2019-01-04 武汉大学 一种水体凝聚态结构演变实时监测的图像识别装置及方法
CN109596491A (zh) * 2018-11-30 2019-04-09 荆门博谦信息科技有限公司 气溶胶检测方法及装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4380392A (en) * 1981-03-18 1983-04-19 Karabegov Mikhail A Method and apparatus for calibration of instruments serving to count and to determine the size of particles suspended in dispersion medium
US4541719A (en) * 1982-07-20 1985-09-17 Wyatt Philip J Method and apparatus for characterizing microparticles and measuring their response to their environment
US4710642A (en) * 1985-08-20 1987-12-01 Mcneil John R Optical scatterometer having improved sensitivity and bandwidth
JPS6244650A (ja) * 1985-08-22 1987-02-26 Canon Inc 粒子解析装置
US4796995A (en) * 1985-12-23 1989-01-10 The United States Department Of Energy Optically active biological particle distinguishing apparatus
US4781460A (en) * 1986-01-08 1988-11-01 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid
US4893929A (en) * 1987-03-13 1990-01-16 Canon Kabushiki Kaisha Particle analyzing apparatus
US4933543A (en) * 1987-09-25 1990-06-12 Chesley F. Carlson Dark signal compensation for diode arrays
US4842406A (en) * 1988-01-15 1989-06-27 Pacific Scientific Company Optical instruments for measuring particle sizes
JPH01134245U (de) * 1988-03-09 1989-09-13

Also Published As

Publication number Publication date
JPH03188353A (ja) 1991-08-16
EP0434352A2 (de) 1991-06-26
DE69026224T2 (de) 1996-08-29
JP2715604B2 (ja) 1998-02-18
EP0434352A3 (en) 1992-05-27
EP0434352B1 (de) 1996-03-27
US5105093A (en) 1992-04-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee