DE69025127D1 - Nicht-flüchtige Speicheranordnungen - Google Patents

Nicht-flüchtige Speicheranordnungen

Info

Publication number
DE69025127D1
DE69025127D1 DE69025127T DE69025127T DE69025127D1 DE 69025127 D1 DE69025127 D1 DE 69025127D1 DE 69025127 T DE69025127 T DE 69025127T DE 69025127 T DE69025127 T DE 69025127T DE 69025127 D1 DE69025127 D1 DE 69025127D1
Authority
DE
Germany
Prior art keywords
memory cells
bit lines
volatile memory
supply line
word lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69025127T
Other languages
English (en)
Other versions
DE69025127T2 (de
Inventor
Nobuaki Takashina
Takao Akaogi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE69025127D1 publication Critical patent/DE69025127D1/de
Publication of DE69025127T2 publication Critical patent/DE69025127T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/34—Accessing multiple bits simultaneously
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
DE69025127T 1989-11-08 1990-11-08 Nicht-flüchtige Speicheranordnungen Expired - Fee Related DE69025127T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29070489A JP3384409B2 (ja) 1989-11-08 1989-11-08 書換え可能な不揮発性半導体記憶装置及びその制御方法

Publications (2)

Publication Number Publication Date
DE69025127D1 true DE69025127D1 (de) 1996-03-14
DE69025127T2 DE69025127T2 (de) 1996-06-05

Family

ID=17759434

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69025127T Expired - Fee Related DE69025127T2 (de) 1989-11-08 1990-11-08 Nicht-flüchtige Speicheranordnungen

Country Status (4)

Country Link
EP (1) EP0427260B1 (de)
JP (1) JP3384409B2 (de)
KR (1) KR950000342B1 (de)
DE (1) DE69025127T2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR960001307B1 (ko) * 1990-10-02 1996-01-25 가부시기가이샤 도오시바 메모리의 테스트방법
DE4133490C2 (de) * 1991-10-09 1999-06-10 Texas Instruments Deutschland Verfahren zum Betreiben einer mit einer Versorgungsspannung gespeisten integrierten Halbleiterspeichervorrichtung mit zeilen- und spaltenweise angeordneten Speicherzellen
KR950003014B1 (ko) * 1992-07-31 1995-03-29 삼성전자 주식회사 반도체 메모리 장치의 번-인 테스트회로 및 번-인 테스트방법
KR20210121456A (ko) * 2020-03-30 2021-10-08 에스케이하이닉스 주식회사 반도체 메모리 장치 및 이의 동작 방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60103587A (ja) * 1983-11-09 1985-06-07 Toshiba Corp 半導体記憶装置のメモリセルキヤパシタ電圧印加回路
NL8400326A (nl) * 1984-02-03 1985-09-02 Philips Nv Geintegreerde schakeling met veldeffecttransistoren en een programmeerbaar leesgeheugen.
JPS62177799A (ja) * 1986-01-30 1987-08-04 Toshiba Corp 半導体記憶装置
JPS62275399A (ja) * 1986-05-23 1987-11-30 Hitachi Ltd 半導体集積回路装置
US4967394A (en) * 1987-09-09 1990-10-30 Kabushiki Kaisha Toshiba Semiconductor memory device having a test cell array
JPH01113999A (ja) * 1987-10-28 1989-05-02 Toshiba Corp 不揮発性メモリのストレステスト回路

Also Published As

Publication number Publication date
EP0427260A2 (de) 1991-05-15
DE69025127T2 (de) 1996-06-05
EP0427260A3 (en) 1992-04-22
JP3384409B2 (ja) 2003-03-10
KR910010532A (ko) 1991-06-29
KR950000342B1 (ko) 1995-01-13
EP0427260B1 (de) 1996-01-31
JPH03152800A (ja) 1991-06-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee