DE69024274D1 - Confokales Mikroskop mit erhöhter Auflösung und Herstellungsverfahren mittels eines solchen Mikroskops - Google Patents
Confokales Mikroskop mit erhöhter Auflösung und Herstellungsverfahren mittels eines solchen MikroskopsInfo
- Publication number
- DE69024274D1 DE69024274D1 DE69024274T DE69024274T DE69024274D1 DE 69024274 D1 DE69024274 D1 DE 69024274D1 DE 69024274 T DE69024274 T DE 69024274T DE 69024274 T DE69024274 T DE 69024274T DE 69024274 D1 DE69024274 D1 DE 69024274D1
- Authority
- DE
- Germany
- Prior art keywords
- microscope
- manufacturing
- increased resolution
- confocal
- confocal microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70641—Focus
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S359/00—Optical: systems and elements
- Y10S359/90—Methods
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/387,248 US5004321A (en) | 1989-07-28 | 1989-07-28 | Resolution confocal microscope, and device fabrication method using same |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69024274D1 true DE69024274D1 (de) | 1996-02-01 |
DE69024274T2 DE69024274T2 (de) | 1996-05-15 |
Family
ID=23529098
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69024274T Expired - Fee Related DE69024274T2 (de) | 1989-07-28 | 1990-07-18 | Confokales Mikroskop mit erhöhter Auflösung und Herstellungsverfahren mittels eines solchen Mikroskops |
Country Status (4)
Country | Link |
---|---|
US (1) | US5004321A (de) |
EP (1) | EP0410634B1 (de) |
JP (1) | JPH081369B2 (de) |
DE (1) | DE69024274T2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1325537C (en) * | 1988-08-01 | 1993-12-28 | Timothy Peter Dabbs | Confocal microscope |
US5184021A (en) * | 1991-06-24 | 1993-02-02 | Siscan Systems, Inc. | Method and apparatus for measuring the dimensions of patterned features on a lithographic photomask |
EP0527242B1 (de) * | 1991-08-02 | 1995-04-26 | International Business Machines Corporation | Apparat und Methode zur Inspektion eines Substrates |
US5254854A (en) * | 1991-11-04 | 1993-10-19 | At&T Bell Laboratories | Scanning microscope comprising force-sensing means and position-sensitive photodetector |
US5248876A (en) * | 1992-04-21 | 1993-09-28 | International Business Machines Corporation | Tandem linear scanning confocal imaging system with focal volumes at different heights |
EP0568478A1 (de) * | 1992-04-29 | 1993-11-03 | International Business Machines Corporation | Dunkelfeld-Ausrichtsystem unter Verwendung von einem konfokalen räumlichen Filter |
JP3362912B2 (ja) * | 1992-10-01 | 2003-01-07 | オリンパス光学工業株式会社 | ビーム整形及びビーム分離装置 |
US5612818A (en) * | 1993-09-08 | 1997-03-18 | Nikon Corporation | Confocal microscope |
DE19511937C2 (de) * | 1995-03-31 | 1997-04-30 | Zeiss Carl Jena Gmbh | Konfokales Auflichtmikroskop |
KR0171947B1 (ko) * | 1995-12-08 | 1999-03-20 | 김주용 | 반도체소자 제조를 위한 노광 방법 및 그를 이용한 노광장치 |
US6548796B1 (en) * | 1999-06-23 | 2003-04-15 | Regents Of The University Of Minnesota | Confocal macroscope |
JP5770322B1 (ja) | 2014-02-24 | 2015-08-26 | ファナック株式会社 | 台座を備えた回転角度検出器及びそれを備える回転機械 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL276676A (de) * | 1961-04-13 | |||
US3258337A (en) * | 1961-11-06 | 1966-06-28 | Cousins William Walter | Method for producing multi-colored art work to be used for proofing |
US4500204A (en) * | 1981-04-21 | 1985-02-19 | Agency Of Industrial Science & Technology | Scanning-type lithographic and image-pickup device using optical fiber |
JPS58156983A (ja) * | 1982-03-13 | 1983-09-19 | 富士通機電株式会社 | 組合せベルト表示器 |
US4697866A (en) * | 1984-10-15 | 1987-10-06 | Honeywell Inc. | Apparatus and method for fabricating a sandwich lens |
US4769551A (en) * | 1986-06-27 | 1988-09-06 | Nippon Kogaku K.K. | Pattern detecting apparatus utilizing energy beam |
CA1308937C (en) * | 1988-01-11 | 1992-10-20 | Francois Bilodeau | Fabrication technique for low-loss fused taper directional couplers and pressure sensor produced thereby |
US4844617A (en) * | 1988-01-20 | 1989-07-04 | Tencor Instruments | Confocal measuring microscope with automatic focusing |
-
1989
- 1989-07-28 US US07/387,248 patent/US5004321A/en not_active Expired - Lifetime
-
1990
- 1990-07-18 JP JP2188176A patent/JPH081369B2/ja not_active Expired - Fee Related
- 1990-07-18 DE DE69024274T patent/DE69024274T2/de not_active Expired - Fee Related
- 1990-07-18 EP EP90307847A patent/EP0410634B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0410634A3 (en) | 1992-03-04 |
DE69024274T2 (de) | 1996-05-15 |
EP0410634B1 (de) | 1995-12-20 |
US5004321A (en) | 1991-04-02 |
EP0410634A2 (de) | 1991-01-30 |
JPH081369B2 (ja) | 1996-01-10 |
JPH0365913A (ja) | 1991-03-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |