DE69019497T2 - Strahlungsdetektor mit Szintillationsmatrix. - Google Patents

Strahlungsdetektor mit Szintillationsmatrix.

Info

Publication number
DE69019497T2
DE69019497T2 DE69019497T DE69019497T DE69019497T2 DE 69019497 T2 DE69019497 T2 DE 69019497T2 DE 69019497 T DE69019497 T DE 69019497T DE 69019497 T DE69019497 T DE 69019497T DE 69019497 T2 DE69019497 T2 DE 69019497T2
Authority
DE
Germany
Prior art keywords
radiation detector
scintillation
matrix
scintillation matrix
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69019497T
Other languages
English (en)
Other versions
DE69019497D1 (de
Inventor
Hiroshi Uchida
Tomohide Omura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE69019497D1 publication Critical patent/DE69019497D1/de
Application granted granted Critical
Publication of DE69019497T2 publication Critical patent/DE69019497T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
DE69019497T 1989-12-15 1990-12-12 Strahlungsdetektor mit Szintillationsmatrix. Expired - Fee Related DE69019497T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1325293A JPH0627847B2 (ja) 1989-12-15 1989-12-15 放射線検出器

Publications (2)

Publication Number Publication Date
DE69019497D1 DE69019497D1 (de) 1995-06-22
DE69019497T2 true DE69019497T2 (de) 1995-09-21

Family

ID=18175197

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69019497T Expired - Fee Related DE69019497T2 (de) 1989-12-15 1990-12-12 Strahlungsdetektor mit Szintillationsmatrix.

Country Status (4)

Country Link
US (1) US5091650A (de)
EP (1) EP0437051B1 (de)
JP (1) JPH0627847B2 (de)
DE (1) DE69019497T2 (de)

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US5187369A (en) * 1990-10-01 1993-02-16 General Electric Company High sensitivity, high resolution, solid state x-ray imaging device with barrier layer
JP2934919B2 (ja) * 1991-03-19 1999-08-16 信越化学工業株式会社 放射線検出器用シンチレータブロック接合体
JP2918003B2 (ja) * 1991-03-20 1999-07-12 信越化学工業株式会社 放射線検出器用シンチレータブロック
JP2547908B2 (ja) * 1991-10-02 1996-10-30 浜松ホトニクス株式会社 放射線検出装置
US5210420A (en) * 1991-12-19 1993-05-11 Positron Corporation Positron emission tomography scanner
JP2565278B2 (ja) * 1992-03-31 1996-12-18 株式会社島津製作所 放射線検出器
US5319204A (en) * 1992-05-13 1994-06-07 Board Of Regents, The University Of Texas System Positron emission tomography camera with quadrant-sharing photomultipliers and cross-coupled scintillating crystals
US5453623A (en) * 1992-05-13 1995-09-26 Board Of Regents, The University Of Texas System Positron emission tomography camera with quadrant-sharing photomultipliers and cross-coupled scintillating crystals
US5300782A (en) * 1992-06-26 1994-04-05 General Electric Company Gamma ray detector for pet scanner
US5325855A (en) * 1992-08-07 1994-07-05 Memorial Hospital For Cancer And Allied Diseases Flexible intraoperative radiation imaging camera
JPH06289142A (ja) * 1993-04-05 1994-10-18 Shin Etsu Chem Co Ltd 放射線検出器およびその製造方法
US5418377A (en) * 1993-07-09 1995-05-23 Minnesota Mining And Manufacturing Company Pixelized phosphor
US5349191A (en) * 1993-11-03 1994-09-20 Triumf Gamma ray detector for three-dimensional position encoding
US5616924A (en) * 1995-10-16 1997-04-01 Picker International, Inc. Optical enhancements to scintillating systems using dynamically controlled materials
US6114703A (en) * 1997-10-21 2000-09-05 The Regents Of The University Of California High resolution scintillation detector with semiconductor readout
US6534771B1 (en) * 1999-06-08 2003-03-18 Saint Gobain Industrial Ceramics, Inc. Gamma camera plate assembly for PET and SPECT imaging
US6462341B1 (en) * 2000-01-21 2002-10-08 Adac Laboratories, Inc. Pixelated scintillation detector
US6473486B2 (en) * 2000-12-05 2002-10-29 Ge Medical Systems Global Technology Co., Llc System and method of computed tomography imaging using a focused scintillator and method of manufacturing
US7102135B2 (en) 2001-06-26 2006-09-05 European Organization For Nuclear Research PET scanner
US7157014B1 (en) * 2001-10-05 2007-01-02 Cit Pet Systems, Inc. Method for producing a high resolution detector array
CA2474761A1 (en) 2002-02-01 2003-10-02 Board Of Regents, The University Of Texas System A production method for making position-sensitive radiation detector arrays
CA2474450A1 (en) * 2002-02-01 2003-08-07 Board Of Regents, The University Of Texas System Asymmetrically placed cross-coupled scintillation crystals
US7049600B2 (en) * 2002-09-18 2006-05-23 The Board Of Trustees Of The Leland Stanford Junior University Scintillation crystal detection arrays for radiation imaging devices
US7408164B2 (en) * 2003-05-20 2008-08-05 Siemens Medical Solutions Usa, Inc. Detector array utilizing air gaps as a reflector between array elements
US7019297B2 (en) * 2003-05-20 2006-03-28 Cti Pet Systems, Inc. Detector array using internalized light sharing and air coupling
US7088901B2 (en) * 2003-08-07 2006-08-08 Kim Chang L Light guide apparatus and method for a detector array
US7164136B2 (en) * 2003-10-07 2007-01-16 Siemens Medical Solutions Usa, Inc. Detector array using a continuous light guide
US7016030B2 (en) * 2003-10-20 2006-03-21 Euv Llc Extended surface parallel coating inspection method
JP4305241B2 (ja) * 2004-03-26 2009-07-29 株式会社島津製作所 放射線検出器
US7166844B1 (en) 2004-06-01 2007-01-23 Science Applications International Corporation Target density imaging using discrete photon counting to produce high-resolution radiographic images
US8063380B2 (en) * 2004-09-30 2011-11-22 The Board Of Trustees Of The Leland Stanford Junior University Semiconductor crystal high resolution imager
EP2430475A1 (de) 2009-05-14 2012-03-21 Devicor Medical Products, Inc. Stacked crystal array for detection of photon emissions
US8314394B1 (en) 2009-11-04 2012-11-20 Science Applications International Corporation System and method for three-dimensional imaging using scattering from annihilation coincidence photons
FR2954760B1 (fr) * 2009-12-28 2013-12-27 Saint Gobain Cristaux Et Detecteurs Scintillateur en halogenure de terre rare cristallin a face sensible polie
JP5801891B2 (ja) 2010-07-30 2015-10-28 パルセータ, エルエルシーPulsetor, Llc 電子イメージングを用いて試料の画像を作成する荷電粒子線装置及び方法
US8357903B2 (en) * 2010-10-19 2013-01-22 Kabushiki Kaisha Toshiba Segmented detector array
CN103492907A (zh) * 2011-03-03 2014-01-01 圣戈本陶瓷及塑料股份有限公司 利用非均匀隔片的成像阵列的系统、方法和装置
RU2013155081A (ru) 2011-05-12 2015-06-20 Конинклейке Филипс Н.В. Оптимизированные сцинтиллирующие кристаллы для рет-томографии
EP2739958B1 (de) * 2011-08-05 2016-01-20 Pulsetor, LLC Elektronendetektor mit einer oder mehreren eng gekoppelten szintillator-photovervielfacher-kombinationen sowie damit ausgestattetes elektronenmikroskop
WO2013033389A1 (en) * 2011-08-30 2013-03-07 Saint-Gobain Ceramics & Plastics, Inc. System, method and apparatus for deep slot, thin kerf pixelation
US9164181B2 (en) * 2011-12-30 2015-10-20 Saint-Gobain Ceramics & Plastics, Inc. Scintillation crystals having features on a side, radiation detection apparatuses including such scintillation crystals, and processes of forming the same
CN104246536B (zh) * 2012-01-31 2016-10-05 Ut-巴特勒有限责任公司 使用行和列求和的中子照相机
WO2014099086A2 (en) 2012-09-27 2014-06-26 Saint-Gobain Ceramics & Plastics, Inc. Scintillator array, a scintillator, a radiation detection apparatus including the scintillator array or scintillator, and processes of forming the same
WO2014057355A2 (en) * 2012-10-10 2014-04-17 Zecotek Imaging Systems Singapore Pte Ltd. Crystal block array and method of manufacture
US9618631B2 (en) 2012-10-10 2017-04-11 Zecotek Imaging Systems Singapore Pte Ltd. Crystal block array and method of manufacture
KR101972413B1 (ko) * 2012-11-16 2019-04-25 도레이 카부시키가이샤 신틸레이터 패널
CN103064102B (zh) * 2012-12-30 2014-11-05 明峰医疗系统股份有限公司 一种晶体排列方法及其探测器
US9040926B2 (en) * 2013-03-15 2015-05-26 Cbg Corporation Rugged scintillation crystal assembly
US9599724B2 (en) 2013-05-08 2017-03-21 Koninklijke Philips N.V. Gamma radiation detection device
EP2994777A1 (de) 2013-05-10 2016-03-16 Koninklijke Philips N.V. Grossflächiges szintillatorelement sowie strahlungsdetektoren und systeme zur lokalisierung von strahlenabsorptionsereignissen damit
CN105556341B (zh) * 2013-09-18 2019-12-03 皇家飞利浦有限公司 用于增加的性能的经激光蚀刻的闪烁晶体
US9279892B2 (en) * 2014-02-05 2016-03-08 General Electric Company Systems and methods for scintillators having polished and roughened surfaces
WO2015170135A1 (en) * 2014-05-07 2015-11-12 Zecotek Imaging Systems Singapore Pte Ltd. Crystal block array and method of manufacture
US9709684B2 (en) 2014-12-15 2017-07-18 General Electric Company Systems and methods for scintillators having micro-crack surfaces
US9658344B1 (en) 2015-11-04 2017-05-23 Crystal Photonics, Incorporated Apparatus including scintillation crystal array with different reflector layers and associated methods
CN108113696A (zh) * 2017-12-01 2018-06-05 深圳先进技术研究院 探测器、深度测量探测器单元及其作用深度计算方法
US10690785B2 (en) * 2018-02-14 2020-06-23 General Electric Company Systems and methods for nuclear medicine imaging using sodium based crystals
JP2022516255A (ja) 2019-01-08 2022-02-25 ザ リサーチ ファウンデイション フォー ザ ステイト ユニヴァーシティ オブ ニューヨーク プリズマトイド光導体
CN113366342A (zh) * 2019-01-30 2021-09-07 香港大学 能量分辨x射线成像设备和方法
CN110007332B (zh) * 2019-04-28 2023-11-28 沈阳智核医疗科技有限公司 晶体阵列、探测器、医疗检测设备及晶体阵列的制造方法
CN110368014B (zh) * 2019-07-19 2023-10-31 沈阳智核医疗科技有限公司 用于pet探测器的晶体阵列、探测器环和pet探测器
US11275182B2 (en) 2020-04-22 2022-03-15 GE Precision Healthcare LLC Systems and methods for scintillators having reflective inserts

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US3102955A (en) * 1960-07-06 1963-09-03 Harshaw Chem Corp Scintillation detector with compensating reflector for the crystal
JPS5648560A (en) * 1979-09-29 1981-05-01 Kagaku Gijutsucho Hoshasen Igaku Sogo Kenkyusho Position detector for radiant ray
JPS58216974A (ja) * 1982-06-11 1983-12-16 Toshiba Corp 放射線検出器ブロツクの製造方法
US4749863A (en) * 1984-12-04 1988-06-07 Computer Technology And Imaging, Inc. Two-dimensional photon counting position encoder system and process
US4743764A (en) * 1984-12-04 1988-05-10 Computer Technology And Imaging, Inc. Two dimensional photon counting position encoder system and process
US4929835A (en) * 1985-04-12 1990-05-29 Takaji Yamashita Position-sensitive radiation detector
JPS62135787A (ja) * 1985-05-20 1987-06-18 Hitachi Medical Corp ポジトロンｃｔ装置の検出器
JPS62129776A (ja) * 1985-12-02 1987-06-12 Hitachi Medical Corp ポジトロンｃｔ装置用検出器
JPH065290B2 (ja) * 1986-09-18 1994-01-19 浜松ホトニクス株式会社 ポジトロンｃｔ装置
JPS63148189A (ja) * 1986-12-11 1988-06-21 Hamamatsu Photonics Kk 放射線検出器
JPH0627844B2 (ja) * 1987-05-14 1994-04-13 浜松ホトニクス株式会社 放射線位置検出器
JPH01229995A (ja) * 1988-03-10 1989-09-13 Hamamatsu Photonics Kk 放射線位置検出器

Also Published As

Publication number Publication date
DE69019497D1 (de) 1995-06-22
JPH03185385A (ja) 1991-08-13
EP0437051A3 (en) 1991-09-25
EP0437051B1 (de) 1995-05-17
EP0437051A2 (de) 1991-07-17
US5091650A (en) 1992-02-25
JPH0627847B2 (ja) 1994-04-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee