DE69012517D1 - Verfahren zur Bildung von Durchgangslöchern in einer Polyimid-Unterlage. - Google Patents
Verfahren zur Bildung von Durchgangslöchern in einer Polyimid-Unterlage.Info
- Publication number
- DE69012517D1 DE69012517D1 DE69012517T DE69012517T DE69012517D1 DE 69012517 D1 DE69012517 D1 DE 69012517D1 DE 69012517 T DE69012517 T DE 69012517T DE 69012517 T DE69012517 T DE 69012517T DE 69012517 D1 DE69012517 D1 DE 69012517D1
- Authority
- DE
- Germany
- Prior art keywords
- holes
- forming
- polyimide base
- polyimide
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004642 Polyimide Substances 0.000 title 1
- 229920001721 polyimide Polymers 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
- B23K26/382—Removing material by boring or cutting by boring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31127—Etching organic layers
- H01L21/31133—Etching organic layers by chemical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/42—Printed circuits
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/08—Non-ferrous metals or alloys
- B23K2103/12—Copper or alloys thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/16—Composite materials, e.g. fibre reinforced
- B23K2103/166—Multilayered materials
- B23K2103/172—Multilayered materials wherein at least one of the layers is non-metallic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/30—Organic material
- B23K2103/42—Plastics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0313—Organic insulating material
- H05K1/032—Organic insulating material consisting of one material
- H05K1/0346—Organic insulating material consisting of one material containing N
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0137—Materials
- H05K2201/0154—Polyimide
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0548—Masks
- H05K2203/0554—Metal used as mask for etching vias, e.g. by laser ablation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/08—Treatments involving gases
- H05K2203/081—Blowing of gas, e.g. for cooling or for providing heat during solder reflowing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/002—Etching of the substrate by chemical or physical means by liquid chemical etching
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0055—After-treatment, e.g. cleaning or desmearing of holes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/425—Plated through-holes or plated via connections characterised by the sequence of steps for plating the through-holes or via connections in relation to the conductive pattern
- H05K3/427—Plated through-holes or plated via connections characterised by the sequence of steps for plating the through-holes or via connections in relation to the conductive pattern initial plating of through-holes in metal-clad substrates
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Laser Beam Processing (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/443,301 US4959119A (en) | 1989-11-29 | 1989-11-29 | Method for forming through holes in a polyimide substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69012517D1 true DE69012517D1 (de) | 1994-10-20 |
DE69012517T2 DE69012517T2 (de) | 1995-03-09 |
Family
ID=23760259
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69012517T Expired - Fee Related DE69012517T2 (de) | 1989-11-29 | 1990-11-26 | Verfahren zur Bildung von Durchgangslöchern in einer Polyimid-Unterlage. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4959119A (de) |
EP (1) | EP0430116B1 (de) |
JP (1) | JPH03210984A (de) |
KR (1) | KR930004135B1 (de) |
CA (1) | CA2030763A1 (de) |
DE (1) | DE69012517T2 (de) |
Families Citing this family (61)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5744776A (en) * | 1989-07-14 | 1998-04-28 | Tip Engineering Group, Inc. | Apparatus and for laser preweakening an automotive trim cover for an air bag deployment opening |
US5293025A (en) * | 1991-08-01 | 1994-03-08 | E. I. Du Pont De Nemours And Company | Method for forming vias in multilayer circuits |
US5608602A (en) * | 1992-04-07 | 1997-03-04 | Rohm Co., Ltd. | Circuit incorporating a solid electrolytic capacitor |
US5584956A (en) * | 1992-12-09 | 1996-12-17 | University Of Iowa Research Foundation | Method for producing conductive or insulating feedthroughs in a substrate |
US5871868A (en) * | 1993-02-26 | 1999-02-16 | General Dynamics Information Systems, Inc. | Apparatus and method for machining conductive structures on substrates |
GB2276354B (en) * | 1993-03-22 | 1996-01-03 | Klippan Autoliv Snc | Improvements in or relating to a cover for an air-bag |
US5485935A (en) * | 1994-04-01 | 1996-01-23 | Xerox Corporation | Capture system employing diverter fluid nozzle |
US5536579A (en) * | 1994-06-02 | 1996-07-16 | International Business Machines Corporation | Design of high density structures with laser etch stop |
US5840402A (en) * | 1994-06-24 | 1998-11-24 | Sheldahl, Inc. | Metallized laminate material having ordered distribution of conductive through holes |
US5567329A (en) * | 1995-01-27 | 1996-10-22 | Martin Marietta Corporation | Method and system for fabricating a multilayer laminate for a printed wiring board, and a printed wiring board formed thereby |
US5811019A (en) * | 1995-03-31 | 1998-09-22 | Sony Corporation | Method for forming a hole and method for forming nozzle in orifice plate of printing head |
JP3112059B2 (ja) | 1995-07-05 | 2000-11-27 | 株式会社日立製作所 | 薄膜多層配線基板及びその製法 |
US6373026B1 (en) * | 1996-07-31 | 2002-04-16 | Mitsubishi Denki Kabushiki Kaisha | Laser beam machining method for wiring board, laser beam machining apparatus for wiring board, and carbonic acid gas laser oscillator for machining wiring board |
MY138743A (en) * | 1996-05-13 | 2009-07-31 | Mitsui Mining & Smelting Co | High tensile strength electrodeposited copper foil and the production process of the same |
AU5084998A (en) * | 1996-11-08 | 1998-05-29 | W.L. Gore & Associates, Inc. | Method for using photoabsorptive coatings to enhance both blind and through micro-via entrance quality |
US5965043A (en) * | 1996-11-08 | 1999-10-12 | W. L. Gore & Associates, Inc. | Method for using ultrasonic treatment in combination with UV-lasers to enable plating of high aspect ratio micro-vias |
WO1998020557A1 (en) * | 1996-11-08 | 1998-05-14 | W.L. Gore & Associates, Inc. | Method for reducing via inductance in an electronic assembly and device |
US5863446A (en) * | 1996-11-08 | 1999-01-26 | W. L. Gore & Associates, Inc. | Electrical means for extracting layer to layer registration |
US5879787A (en) * | 1996-11-08 | 1999-03-09 | W. L. Gore & Associates, Inc. | Method and apparatus for improving wireability in chip modules |
AU4902897A (en) | 1996-11-08 | 1998-05-29 | W.L. Gore & Associates, Inc. | Method for improving reliability of thin circuit substrates by increasing the T of the substrate |
US6023041A (en) * | 1996-11-08 | 2000-02-08 | W.L. Gore & Associates, Inc. | Method for using photoabsorptive coatings and consumable copper to control exit via redeposit as well as diameter variance |
US6103992A (en) | 1996-11-08 | 2000-08-15 | W. L. Gore & Associates, Inc. | Multiple frequency processing to minimize manufacturing variability of high aspect ratio micro through-vias |
US5868950A (en) * | 1996-11-08 | 1999-02-09 | W. L. Gore & Associates, Inc. | Method to correct astigmatism of fourth yag to enable formation of sub 25 micron micro-vias using masking techniques |
US5841102A (en) * | 1996-11-08 | 1998-11-24 | W. L. Gore & Associates, Inc. | Multiple pulse space processing to enhance via entrance formation at 355 nm |
US5910255A (en) * | 1996-11-08 | 1999-06-08 | W. L. Gore & Associates, Inc. | Method of sequential laser processing to efficiently manufacture modules requiring large volumetric density material removal for micro-via formation |
WO1998020534A1 (en) * | 1996-11-08 | 1998-05-14 | W.L. Gore & Associates, Inc. | Method for using fiducial schemes to increase nominal registration |
US5973290A (en) * | 1997-02-26 | 1999-10-26 | W. L. Gore & Associates, Inc. | Laser apparatus having improved via processing rate |
US6203652B1 (en) | 1999-06-30 | 2001-03-20 | International Business Machines Corporation | Method of forming a via in a substrate |
JP4348785B2 (ja) * | 1999-07-29 | 2009-10-21 | 三菱瓦斯化学株式会社 | 高弾性率ガラス布基材熱硬化性樹脂銅張積層板 |
CA2382442C (en) * | 1999-09-15 | 2009-07-07 | Aradigm Corporation | Pore structures for reduced pressure aerosolization |
US6256121B1 (en) | 1999-10-08 | 2001-07-03 | Nanovia, Lp | Apparatus for ablating high-density array of vias or indentation in surface of object |
US6310701B1 (en) | 1999-10-08 | 2001-10-30 | Nanovia Lp | Method and apparatus for ablating high-density array of vias or indentation in surface of object |
US6653593B2 (en) | 1999-10-08 | 2003-11-25 | Nanovia, Lp | Control system for ablating high-density array of vias or indentation in surface of object |
US7111423B2 (en) * | 1999-10-08 | 2006-09-26 | Identification Dynamics, Llc | Method and apparatus for reading firearm microstamping |
US6833911B2 (en) | 1999-10-08 | 2004-12-21 | Identification Dynamics, Inc. | Method and apparatus for reading firearm microstamping |
US6886284B2 (en) * | 1999-10-08 | 2005-05-03 | Identification Dynamics, Llc | Firearm microstamping and micromarking insert for stamping a firearm identification code and serial number into cartridge shell casings and projectiles |
US6420675B1 (en) | 1999-10-08 | 2002-07-16 | Nanovia, Lp | Control system for ablating high-density array of vias or indentation in surface of object |
JP3399434B2 (ja) * | 2001-03-02 | 2003-04-21 | オムロン株式会社 | 高分子成形材のメッキ形成方法と回路形成部品とこの回路形成部品の製造方法 |
SE521028C2 (sv) * | 2001-05-14 | 2003-09-23 | Metfoils Ab | Förfarande för laserborrning i material använda vid framställning av tryckta kretsar |
US6680459B2 (en) * | 2001-06-22 | 2004-01-20 | Nippei Toyama Corporation | Laser beam machining apparatus and laser beam machining method |
DE10145184B4 (de) * | 2001-09-13 | 2005-03-10 | Siemens Ag | Verfahren zum Laserbohren, insbesondere unter Verwendung einer Lochmaske |
DE10207288B4 (de) * | 2002-02-21 | 2005-05-04 | Newson Engineering Nv | Verfahren zum Bohren von Löchern mittels eines Laserstrahls in einem Substrat, insbesondere in einem elektrischen Schaltungsubstrat |
JP2003249743A (ja) * | 2002-02-26 | 2003-09-05 | Seiko Epson Corp | 配線基板及びその製造方法、半導体装置並びに電子機器 |
EP1382793B1 (de) * | 2002-07-19 | 2006-09-06 | Services Pétroliers Schlumberger | Rohr mit Gewindeorientierungsmarkierungen |
US7204419B2 (en) * | 2003-05-01 | 2007-04-17 | Identifcation Dynamics, Llc | Method and apparatus for reading firearm microstamping |
EP1462206A1 (de) * | 2003-03-26 | 2004-09-29 | Lasag Ag | Laservorrichtung zum Bohren von Löchern in Bauteilen einer Flüssigkeitsinjektionsvorrichtung |
US20050241203A1 (en) * | 2003-05-01 | 2005-11-03 | Lizotte Todd E | Method and apparatus for cartridge identification imprinting in difficult contexts by recess protected indicia |
US7014727B2 (en) * | 2003-07-07 | 2006-03-21 | Potomac Photonics, Inc. | Method of forming high resolution electronic circuits on a substrate |
US20050219327A1 (en) * | 2004-03-31 | 2005-10-06 | Clarke Leo C | Features in substrates and methods of forming |
US7658470B1 (en) | 2005-04-28 | 2010-02-09 | Hewlett-Packard Development Company, L.P. | Method of using a flexible circuit |
CN100471362C (zh) * | 2005-09-21 | 2009-03-18 | 富葵精密组件(深圳)有限公司 | 柔性电路板的制作方法 |
KR100797692B1 (ko) * | 2006-06-20 | 2008-01-23 | 삼성전기주식회사 | 인쇄회로기판 및 그 제조방법 |
DE102008058535A1 (de) | 2008-11-21 | 2010-05-27 | Tesa Se | Verfahren zur Materialbearbeitung mit energiereicher Strahlung |
US9434025B2 (en) * | 2011-07-19 | 2016-09-06 | Pratt & Whitney Canada Corp. | Laser drilling methods of shallow-angled holes |
US9318682B2 (en) | 2012-01-25 | 2016-04-19 | Alphabet Energy, Inc | Modular thermoelectric units for heat recovery systems and methods thereof |
US9257627B2 (en) | 2012-07-23 | 2016-02-09 | Alphabet Energy, Inc. | Method and structure for thermoelectric unicouple assembly |
US9065017B2 (en) | 2013-09-01 | 2015-06-23 | Alphabet Energy, Inc. | Thermoelectric devices having reduced thermal stress and contact resistance, and methods of forming and using the same |
US20150287901A1 (en) * | 2013-10-14 | 2015-10-08 | Alphabet Energy, Inc. | Flexible lead frame for multi-leg package assembly |
DE102014110262A1 (de) | 2014-07-22 | 2016-01-28 | Helmholtz-Zentrum Berlin Für Materialien Und Energie Gmbh | Verfahren zur Herstellung eines Rückseitenkontaktsystems für eine Silizium-Dünnschicht-Solarzelle |
US11482884B2 (en) * | 2020-12-28 | 2022-10-25 | Nucurrent, Inc. | Systems and methods for utilizing laser cutting and chemical etching in manufacturing wireless power antennas |
US11538629B2 (en) | 2020-12-28 | 2022-12-27 | Nucurrent, Inc. | Systems and methods for utilizing laser cutting and chemical etching in manufacturing wireless power antennas |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4258468A (en) * | 1978-12-14 | 1981-03-31 | Western Electric Company, Inc. | Forming vias through multilayer circuit boards |
US4426253A (en) * | 1981-12-03 | 1984-01-17 | E. I. Du Pont De Nemours & Co. | High speed etching of polyimide film |
US4472238A (en) * | 1983-12-05 | 1984-09-18 | E. I. Du Pont De Nemours And Company | Process using plasma for forming conductive through-holes through a dielectric layer |
JPS60133992A (ja) * | 1983-12-21 | 1985-07-17 | Canon Inc | プリント基板の穴明け加工装置 |
US4635358A (en) * | 1985-01-03 | 1987-01-13 | E. I. Du Pont De Nemours And Company | Method for forming electrically conductive paths through a dielectric layer |
JPS61176186A (ja) * | 1985-01-31 | 1986-08-07 | 日立化成工業株式会社 | 配線板の製造法 |
JPS61176193A (ja) * | 1985-01-31 | 1986-08-07 | 日立化成工業株式会社 | 配線板の製造法 |
US4642160A (en) * | 1985-08-12 | 1987-02-10 | Interconnect Technology Inc. | Multilayer circuit board manufacturing |
US4714516A (en) * | 1986-09-26 | 1987-12-22 | General Electric Company | Method to produce via holes in polymer dielectrics for multiple electronic circuit chip packaging |
US4894115A (en) * | 1989-02-14 | 1990-01-16 | General Electric Company | Laser beam scanning method for forming via holes in polymer materials |
-
1989
- 1989-11-29 US US07/443,301 patent/US4959119A/en not_active Expired - Fee Related
-
1990
- 1990-11-23 CA CA002030763A patent/CA2030763A1/en not_active Abandoned
- 1990-11-26 DE DE69012517T patent/DE69012517T2/de not_active Expired - Fee Related
- 1990-11-26 EP EP90122470A patent/EP0430116B1/de not_active Expired - Lifetime
- 1990-11-28 KR KR1019900019368A patent/KR930004135B1/ko active IP Right Grant
- 1990-11-29 JP JP2326198A patent/JPH03210984A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPH03210984A (ja) | 1991-09-13 |
US4959119A (en) | 1990-09-25 |
KR910011098A (ko) | 1991-06-29 |
EP0430116A2 (de) | 1991-06-05 |
EP0430116A3 (en) | 1992-01-29 |
CA2030763A1 (en) | 1991-05-30 |
DE69012517T2 (de) | 1995-03-09 |
EP0430116B1 (de) | 1994-09-14 |
KR930004135B1 (ko) | 1993-05-20 |
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