DE68916969D1 - Prüfung von elektrischen kreisen. - Google Patents

Prüfung von elektrischen kreisen.

Info

Publication number
DE68916969D1
DE68916969D1 DE68916969T DE68916969T DE68916969D1 DE 68916969 D1 DE68916969 D1 DE 68916969D1 DE 68916969 T DE68916969 T DE 68916969T DE 68916969 T DE68916969 T DE 68916969T DE 68916969 D1 DE68916969 D1 DE 68916969D1
Authority
DE
Germany
Prior art keywords
circles
testing electrical
testing
electrical
electrical circles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68916969T
Other languages
English (en)
Other versions
DE68916969T2 (de
Inventor
Vivian Watts
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Technologies Inc
Original Assignee
BATH SCIENTIFIC Ltd MELKSHAM WILTSHIRE GB
Bath Scientific Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BATH SCIENTIFIC Ltd MELKSHAM WILTSHIRE GB, Bath Scientific Ltd filed Critical BATH SCIENTIFIC Ltd MELKSHAM WILTSHIRE GB
Application granted granted Critical
Publication of DE68916969D1 publication Critical patent/DE68916969D1/de
Publication of DE68916969T2 publication Critical patent/DE68916969T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
DE68916969T 1988-10-17 1989-10-13 Prüfung von elektrischen kreisen. Expired - Lifetime DE68916969T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB888824272A GB8824272D0 (en) 1988-10-17 1988-10-17 Testing electrical circuits
PCT/GB1989/001216 WO1990004792A1 (en) 1988-10-17 1989-10-13 Testing electrical circuits

Publications (2)

Publication Number Publication Date
DE68916969D1 true DE68916969D1 (de) 1994-08-25
DE68916969T2 DE68916969T2 (de) 1995-01-12

Family

ID=10645308

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68916969T Expired - Lifetime DE68916969T2 (de) 1988-10-17 1989-10-13 Prüfung von elektrischen kreisen.

Country Status (5)

Country Link
EP (1) EP0438491B1 (de)
JP (1) JP2630846B2 (de)
DE (1) DE68916969T2 (de)
GB (1) GB8824272D0 (de)
WO (1) WO1990004792A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5266901A (en) * 1992-05-29 1993-11-30 International Business Machines Corp. Apparatus and method for resistive detection and waveform analysis of interconenction networks
FR2706042B1 (fr) * 1993-06-03 1995-08-11 Matra Cap Systems Sa Procédé de contrôle des pistes d'un circuit d'interconnexion et circuit permettant de mette en Óoeuvre un tel procédé.
JP3558434B2 (ja) * 1995-11-30 2004-08-25 富士通オートメーション株式会社 電気的配線検査方法及び装置
DE19541307C2 (de) 1995-11-06 2001-09-27 Atg Test Systems Gmbh Verfahren zum Prüfen von elektrischen Leiteranordnungen und Vorrichtung zum Ausführen des Verfahrens
JP2994259B2 (ja) 1996-03-28 1999-12-27 オー・エイチ・ティー株式会社 基板検査方法および基板検査装置
JP4582869B2 (ja) * 2000-06-29 2010-11-17 日置電機株式会社 回路基板検査装置
JP4678989B2 (ja) * 2001-06-05 2011-04-27 日置電機株式会社 短絡検査対象設定方法、回路基板検査方法および回路基板検査装置
JP4663918B2 (ja) * 2001-06-28 2011-04-06 日置電機株式会社 静電容量測定方法、回路基板検査方法および回路基板検査装置
JP2010133836A (ja) * 2008-12-05 2010-06-17 Hioki Ee Corp 絶縁検査方法および絶縁検査装置
JP5307085B2 (ja) * 2010-07-20 2013-10-02 日置電機株式会社 回路基板検査装置
JP6272682B2 (ja) * 2013-12-02 2018-01-31 日本シイエムケイ株式会社 プリント配線板の導通検査方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4229693A (en) * 1978-11-24 1980-10-21 Honeywell Information Systems Inc. Method and apparatus for capacitance testing printed circuit boards
DE3013215A1 (de) * 1980-04-03 1981-10-15 Luther & Maelzer Gmbh, 3050 Wunstorf Adapter fuer ein selbstprogrammierbares leiterplattenpruefgeraet
US4565966A (en) * 1983-03-07 1986-01-21 Kollmorgen Technologies Corporation Method and apparatus for testing of electrical interconnection networks
US4583042A (en) * 1983-04-18 1986-04-15 The Boeing Company Capacitive circuit board testing system and method using a conductive pliant elastomeric reference plane

Also Published As

Publication number Publication date
JPH04503105A (ja) 1992-06-04
DE68916969T2 (de) 1995-01-12
JP2630846B2 (ja) 1997-07-16
EP0438491B1 (de) 1994-07-20
GB8824272D0 (en) 1988-11-23
WO1990004792A1 (en) 1990-05-03
EP0438491A1 (de) 1991-07-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: EVERETT CHARLES TECHNOLOGIES (N.D.GES.D.STAATES DE