DE60334959D1 - Zerstäubungstarget aus Basis von Kupfer mit ultrafeinem Korngefüge - Google Patents

Zerstäubungstarget aus Basis von Kupfer mit ultrafeinem Korngefüge

Info

Publication number
DE60334959D1
DE60334959D1 DE60334959T DE60334959T DE60334959D1 DE 60334959 D1 DE60334959 D1 DE 60334959D1 DE 60334959 T DE60334959 T DE 60334959T DE 60334959 T DE60334959 T DE 60334959T DE 60334959 D1 DE60334959 D1 DE 60334959D1
Authority
DE
Germany
Prior art keywords
copper
target based
grain structure
ultrafine grain
atomization target
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60334959T
Other languages
English (en)
Inventor
Andrew C Perry
Paul S Gilman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Praxair ST Technology Inc
Praxair Technology Inc
Original Assignee
Praxair ST Technology Inc
Praxair Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Praxair ST Technology Inc, Praxair Technology Inc filed Critical Praxair ST Technology Inc
Application granted granted Critical
Publication of DE60334959D1 publication Critical patent/DE60334959D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/08—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
DE60334959T 2002-07-18 2003-07-17 Zerstäubungstarget aus Basis von Kupfer mit ultrafeinem Korngefüge Expired - Lifetime DE60334959D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/198,256 US6896748B2 (en) 2002-07-18 2002-07-18 Ultrafine-grain-copper-base sputter targets

Publications (1)

Publication Number Publication Date
DE60334959D1 true DE60334959D1 (de) 2010-12-30

Family

ID=29780205

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60334959T Expired - Lifetime DE60334959D1 (de) 2002-07-18 2003-07-17 Zerstäubungstarget aus Basis von Kupfer mit ultrafeinem Korngefüge

Country Status (7)

Country Link
US (2) US6896748B2 (de)
EP (1) EP1382710B1 (de)
JP (1) JP4522675B2 (de)
KR (1) KR100688832B1 (de)
DE (1) DE60334959D1 (de)
IL (2) IL157013A (de)
TW (1) TWI290960B (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6348139B1 (en) * 1998-06-17 2002-02-19 Honeywell International Inc. Tantalum-comprising articles
US6878250B1 (en) * 1999-12-16 2005-04-12 Honeywell International Inc. Sputtering targets formed from cast materials
US20040072009A1 (en) * 1999-12-16 2004-04-15 Segal Vladimir M. Copper sputtering targets and methods of forming copper sputtering targets
US6331233B1 (en) * 2000-02-02 2001-12-18 Honeywell International Inc. Tantalum sputtering target with fine grains and uniform texture and method of manufacture
JP4756458B2 (ja) * 2005-08-19 2011-08-24 三菱マテリアル株式会社 パーティクル発生の少ないＭｎ含有銅合金スパッタリングターゲット
US20070251818A1 (en) * 2006-05-01 2007-11-01 Wuwen Yi Copper physical vapor deposition targets and methods of making copper physical vapor deposition targets
JP4955008B2 (ja) 2006-10-03 2012-06-20 Ｊｘ日鉱日石金属株式会社 Ｃｕ−Ｍｎ合金スパッタリングターゲット及び半導体配線
US8702919B2 (en) * 2007-08-13 2014-04-22 Honeywell International Inc. Target designs and related methods for coupled target assemblies, methods of production and uses thereof
JP5092939B2 (ja) * 2008-07-01 2012-12-05 日立電線株式会社 Ｔｆｔ用平板型銅スパッタリングターゲット材及びスパッタリング方法
JP5464352B2 (ja) * 2010-03-05 2014-04-09 三菱マテリアル株式会社 均一かつ微細結晶組織を有する高純度銅加工材の製造方法
KR20140091734A (ko) * 2011-09-14 2014-07-22 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 고순도 구리망간 합금 스퍼터링 타깃
KR101645834B1 (ko) * 2012-01-12 2016-08-04 제이엑스금속주식회사 고순도 구리 스퍼터링 타깃
JP5567042B2 (ja) * 2012-02-10 2014-08-06 株式会社Ｓｈカッパープロダクツ Ｔｆｔ用銅スパッタリングターゲット材
JP2013227632A (ja) * 2012-04-26 2013-11-07 Ulvac Japan Ltd インジウムターゲット及びその製造方法
US9761420B2 (en) 2013-12-13 2017-09-12 Praxair S.T. Technology, Inc. Diffusion bonded high purity copper sputtering target assemblies
US11062889B2 (en) 2017-06-26 2021-07-13 Tosoh Smd, Inc. Method of production of uniform metal plates and sputtering targets made thereby
EP3720984A4 (de) 2017-12-06 2021-09-01 Arizona Thin Film Research LLC Systeme und verfahren zur generativen fertigung für die abscheidung von metall- und keramikmaterialien
CN111451314B (zh) * 2020-04-01 2021-02-26 东莞市欧莱溅射靶材有限公司 一种高纯铜旋转靶的制备方法
CN115415351A (zh) * 2022-08-30 2022-12-02 贵研铂业股份有限公司 一种高纯铜靶材的制备方法及靶材的用途

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US23726A (en) * 1859-04-19 Bridge
DE2617289C3 (de) * 1975-04-21 1981-03-19 Hitachi, Ltd., Tokyo Verfahren zum plastischen Verformen von kubisch flächenzentrierten Metallen
SE7702015L (sv) * 1976-03-31 1977-10-01 Union Carbide Corp Sett att kryogent forma en metallplat av en metall med ytcentrerat kubiskt rumdgitter till ett alster av onskad kontfiguration
JPH079069B2 (ja) * 1986-03-12 1995-02-01 ブラザー工業株式会社 機械的性質の優れた銅被膜の形成方法
US4695348A (en) * 1986-09-15 1987-09-22 Psi Star Copper etching process and product
JPH03115562A (ja) 1989-09-27 1991-05-16 Nippon Mining Co Ltd スパッタリングターゲット材の製造方法
JP2857015B2 (ja) * 1993-04-08 1999-02-10 株式会社ジャパンエナジー 高純度アルミニウムまたはその合金からなるスパッタリングターゲット
US5600989A (en) * 1995-06-14 1997-02-11 Segal; Vladimir Method of and apparatus for processing tungsten heavy alloys for kinetic energy penetrators
JPH09272970A (ja) 1996-04-05 1997-10-21 Japan Energy Corp 高純度コバルトスパッタリングターゲット及びその製造方法
US5766380A (en) * 1996-11-05 1998-06-16 Sony Corporation Method for fabricating randomly oriented aluminum alloy sputtering targets with fine grains and fine precipitates
US5993621A (en) * 1997-07-11 1999-11-30 Johnson Matthey Electronics, Inc. Titanium sputtering target
US6139701A (en) * 1997-11-26 2000-10-31 Applied Materials, Inc. Copper target for sputter deposition
JP2000034562A (ja) * 1998-07-14 2000-02-02 Japan Energy Corp スパッタリングターゲット及び薄膜形成装置部品
EP1115899B1 (de) 1998-09-11 2006-04-12 Tosoh Smd, Inc. Verbindungsverfahren für ein niedrigtemperatursputtertarget und so hergestelltes niedrigtemperatursputtertarget
JP3115562B2 (ja) 1999-04-21 2000-12-11 株式会社オリエンタルランド 金箔を用いた装飾用シ−ル及びその製造方法
US6478902B2 (en) 1999-07-08 2002-11-12 Praxair S.T. Technology, Inc. Fabrication and bonding of copper sputter targets
JP2001049426A (ja) * 1999-07-08 2001-02-20 Praxair St Technol Inc 銅スパッタ・ターゲットの製造方法および銅スパッタ・ターゲットと裏当て板の組立体
US6197129B1 (en) * 2000-05-04 2001-03-06 The United States Of America As Represented By The United States Department Of Energy Method for producing ultrafine-grained materials using repetitive corrugation and straightening
WO2001094660A2 (en) * 2000-06-02 2001-12-13 Honeywell International Inc. Sputtering target
WO2001094659A2 (en) * 2000-06-02 2001-12-13 Honeywell International Inc. Sputtering target
JP2002294437A (ja) * 2001-04-02 2002-10-09 Mitsubishi Materials Corp 銅合金スパッタリングターゲット
IL161701A0 (en) * 2001-11-13 2004-09-27 Praxair Technology Inc High-purity aluminum sputter targets

Also Published As

Publication number Publication date
TW200403349A (en) 2004-03-01
KR20040010246A (ko) 2004-01-31
TWI290960B (en) 2007-12-11
EP1382710A1 (de) 2004-01-21
EP1382710B1 (de) 2010-11-17
IL157013A (en) 2006-12-31
US8025749B2 (en) 2011-09-27
KR100688832B1 (ko) 2007-02-28
US20040011440A1 (en) 2004-01-22
JP2004052111A (ja) 2004-02-19
US6896748B2 (en) 2005-05-24
JP4522675B2 (ja) 2010-08-11
IL176510A (en) 2011-01-31
IL176510A0 (en) 2006-10-05
IL157013A0 (en) 2004-02-08
US20050133125A1 (en) 2005-06-23

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