DE60328727D1 - Heiss umschaltbarer spannungsbus für iddq-strommessungen - Google Patents

Heiss umschaltbarer spannungsbus für iddq-strommessungen

Info

Publication number
DE60328727D1
DE60328727D1 DE60328727T DE60328727T DE60328727D1 DE 60328727 D1 DE60328727 D1 DE 60328727D1 DE 60328727 T DE60328727 T DE 60328727T DE 60328727 T DE60328727 T DE 60328727T DE 60328727 D1 DE60328727 D1 DE 60328727D1
Authority
DE
Germany
Prior art keywords
quiescent
voltage
global
power
header
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60328727T
Other languages
English (en)
Inventor
Leah M Pastel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE60328727D1 publication Critical patent/DE60328727D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE60328727T 2003-11-05 2003-11-05 Heiss umschaltbarer spannungsbus für iddq-strommessungen Expired - Lifetime DE60328727D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2003/035116 WO2005047911A1 (en) 2003-11-05 2003-11-05 Hot switchable voltage bus for iddq current measurements

Publications (1)

Publication Number Publication Date
DE60328727D1 true DE60328727D1 (de) 2009-09-17

Family

ID=34589295

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60328727T Expired - Lifetime DE60328727D1 (de) 2003-11-05 2003-11-05 Heiss umschaltbarer spannungsbus für iddq-strommessungen

Country Status (8)

Country Link
US (1) US20080129324A1 (de)
EP (1) EP1685417B1 (de)
JP (1) JP4493597B2 (de)
CN (1) CN100516910C (de)
AT (1) ATE438864T1 (de)
AU (1) AU2003291737A1 (de)
DE (1) DE60328727D1 (de)
WO (1) WO2005047911A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7131074B2 (en) * 2003-07-08 2006-10-31 International Business Machines Corporation Nested voltage island architecture
WO2008044183A2 (en) * 2006-10-09 2008-04-17 Nxp B.V. Integrated circuit with iddq test facilities and ic iddq test method
US8020138B2 (en) * 2008-06-02 2011-09-13 International Business Machines Corporation Voltage island performance/leakage screen monitor for IP characterization
US9547034B2 (en) * 2013-07-03 2017-01-17 Xilinx, Inc. Monolithic integrated circuit die having modular die regions stitched together
US9785161B2 (en) * 2015-08-24 2017-10-10 University Of Rochester Heterogeneous method for energy efficient distribution of on-chip power supplies and power network on-chip system for scalable power delivery
US10139448B2 (en) * 2016-08-31 2018-11-27 Nxp Usa, Inc. Scan circuitry with IDDQ verification
US10467372B2 (en) 2017-07-31 2019-11-05 International Business Machines Corporation Implementing automated identification of optimal sense point and sector locations in various on-chip linear voltage regulator designs
US11113168B2 (en) * 2018-03-09 2021-09-07 Toyota Motor Engineering & Manufacturing North America, Inc. Distributed architecture for fault monitoring

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5371457A (en) * 1991-02-12 1994-12-06 Lipp; Robert J. Method and apparatus to test for current in an integrated circuit
US5294883A (en) * 1992-08-04 1994-03-15 International Business Machines Corporation Test detector/shutoff and method for BiCMOS integrated circuit
US5670890A (en) * 1993-04-22 1997-09-23 Lsi Logic Corporation Switchable pull-ups and pull-downs for IDDQ testing of integrated circuits
JPH07159496A (ja) * 1993-10-12 1995-06-23 At & T Global Inf Solutions Internatl Inc 集積回路の検査のための装置及びその方法
US5773990A (en) * 1995-09-29 1998-06-30 Megatest Corporation Integrated circuit test power supply
JP3641517B2 (ja) * 1995-10-05 2005-04-20 株式会社ルネサステクノロジ 半導体装置
US5917331A (en) * 1995-10-23 1999-06-29 Megatest Corporation Integrated circuit test method and structure
US5721495A (en) * 1995-10-24 1998-02-24 Unisys Corporation Circuit for measuring quiescent current
EP0811850B1 (de) * 1996-06-05 2005-07-27 Interuniversitair Micro-Elektronica Centrum Vzw Hochauflösendes Stromversorgungsprüfsystem
US5889408A (en) * 1996-06-27 1999-03-30 Intel Corporation Delta IDDQ testing
US5742177A (en) * 1996-09-27 1998-04-21 Intel Corporation Method for testing a semiconductor device by measuring quiescent currents (IDDQ) at two different temperatures
US5757203A (en) * 1996-10-16 1998-05-26 Hewlett-Packard Company Multiple on-chip IDDQ monitors
US5929650A (en) * 1997-02-04 1999-07-27 Motorola, Inc. Method and apparatus for performing operative testing on an integrated circuit
US6031386A (en) * 1997-10-31 2000-02-29 Sandia Corporation Apparatus and method for defect testing of integrated circuits
US6043672A (en) * 1998-05-13 2000-03-28 Lsi Logic Corporation Selectable power supply lines for isolating defects in integrated circuits
JP4071379B2 (ja) * 1998-11-30 2008-04-02 株式会社ルネサステクノロジ 半導体回路装置
JP2001021609A (ja) * 1999-07-07 2001-01-26 Mitsubishi Electric Corp 半導体集積回路の検査方法
JP2001060653A (ja) * 1999-08-23 2001-03-06 Matsushita Electric Ind Co Ltd テスト対応型半導体集積回路及びそのテスト方法
US6342790B1 (en) * 2000-04-13 2002-01-29 Pmc-Sierra, Inc. High-speed, adaptive IDDQ measurement
JP2002100731A (ja) * 2000-09-21 2002-04-05 Hitachi Ltd 半導体装置と半導体装置の製造方法
JP3720271B2 (ja) * 2001-03-22 2005-11-24 株式会社ルネサステクノロジ 半導体集積回路装置
US6664801B1 (en) * 2001-05-21 2003-12-16 Lsi Logic Corporation IDDQ test methodology based on the sensitivity of fault current to power supply variations
US6677774B2 (en) * 2001-06-26 2004-01-13 International Business Machines Corporation Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester
US6538314B1 (en) * 2002-03-29 2003-03-25 International Business Machines Corporation Power grid wiring for semiconductor devices having voltage islands

Also Published As

Publication number Publication date
US20080129324A1 (en) 2008-06-05
JP2007528981A (ja) 2007-10-18
CN1860376A (zh) 2006-11-08
AU2003291737A8 (en) 2005-06-06
EP1685417B1 (de) 2009-08-05
AU2003291737A1 (en) 2004-06-06
WO2005047911A1 (en) 2005-05-26
EP1685417A4 (de) 2008-01-16
ATE438864T1 (de) 2009-08-15
CN100516910C (zh) 2009-07-22
EP1685417A1 (de) 2006-08-02
JP4493597B2 (ja) 2010-06-30

Similar Documents

Publication Publication Date Title
ATE426898T1 (de) Mram-architektur fur niedrige stromaufnahme und hohe selektivitat
DE60328727D1 (de) Heiss umschaltbarer spannungsbus für iddq-strommessungen
WO2008014033A3 (en) Memory circuit using a reference for sensing
PT1176317E (pt) Sistema de distribuicao pneumatica
TW200609940A (en) Semiconductor integrated circuit device
DK1561268T3 (da) System og fremgangsmåde til at styre en belastningspunktregulator
WO2002067269A3 (en) Method and system for distributed power generation in multi-chip memory systems
ATE459961T1 (de) Speichersteuerung mit selektiver retention
TW200739582A (en) Semiconductor device with inner voltage generation circuit
MXPA04007532A (es) Metodo y aparato para controlar la transferencia de energia entre una barra colectora de energia y un sistema de bateria a base de una condicion de operacion de bateria.
WO2006122235A3 (en) System and method for power management with scalable channel voltage regulation
DE60035115D1 (de) Architketur, verfahren und schaltungen für speichervorrichtungen mit geringer leistungsaufnahme
TW200603158A (en) System and method for a high-speed access architecture for semiconductor memory
TW200725517A (en) Circuit device
EP1387362A3 (de) Leseschaltung, Referenzschaltung und Halbleiterspeicheranordnung
DE60202208D1 (de) Leistungskontakte zum aufschlag hoher ströme pro anschluss in siliziumtechnologie
MY126854A (en) High speed and high accuracy dut power supply with active boost circuitry
EP1111522A3 (de) Unterstützungssytem zum rechnergestützten Entwurf in dem die Zellen unabhängig angeordnet werden können
IT1256105B (it) Dispositivo di gestione e controllo di consumi particolarmente per impianti elettrici civili
GB2386220B (en) Method for evaluating a power distribution network for an integrated circuit
TW200636738A (en) Internal voltage supply circuit
TW200721193A (en) Memory device input buffer, related memory device, controller and system
HK1106085A1 (en) Method for supplying current and exchanging useful data between a fire alarm center and a current sink
SE0002050D0 (sv) System protection scheme
ATE413731T1 (de) Modifizierte, sich wiederholende zellenvergleichstechnik für integrierte schaltungen

Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)
8364 No opposition during term of opposition