DE60323744D1 - Flexible redundanz für speicher - Google Patents
Flexible redundanz für speicherInfo
- Publication number
- DE60323744D1 DE60323744D1 DE60323744T DE60323744T DE60323744D1 DE 60323744 D1 DE60323744 D1 DE 60323744D1 DE 60323744 T DE60323744 T DE 60323744T DE 60323744 T DE60323744 T DE 60323744T DE 60323744 D1 DE60323744 D1 DE 60323744D1
- Authority
- DE
- Germany
- Prior art keywords
- storage
- flexible redundancy
- redundancy
- flexible
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
- G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/133,919 US6687171B2 (en) | 2002-04-26 | 2002-04-26 | Flexible redundancy for memories |
PCT/EP2003/004078 WO2003092012A2 (en) | 2002-04-26 | 2003-04-17 | Flexible redundancy for memories |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60323744D1 true DE60323744D1 (de) | 2008-11-06 |
Family
ID=29249100
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60323744T Expired - Fee Related DE60323744D1 (de) | 2002-04-26 | 2003-04-17 | Flexible redundanz für speicher |
Country Status (8)
Country | Link |
---|---|
US (1) | US6687171B2 (de) |
EP (1) | EP1500111B1 (de) |
JP (1) | JP2005524190A (de) |
KR (1) | KR100633426B1 (de) |
CN (1) | CN1650371A (de) |
DE (1) | DE60323744D1 (de) |
TW (1) | TWI226062B (de) |
WO (1) | WO2003092012A2 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10157537C2 (de) * | 2001-11-23 | 2003-09-18 | Infineon Technologies Ag | Integrierter Speicher und Verfahren zur Reparatur eines integrierten Speichers |
KR100484254B1 (ko) * | 2002-10-31 | 2005-04-22 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 리던던시 회로 및 그를 이용한 페일구제방법 |
JP2005182900A (ja) * | 2003-12-18 | 2005-07-07 | Sony Corp | 半導体記憶装置 |
JP5019579B2 (ja) * | 2007-01-18 | 2012-09-05 | 株式会社東芝 | 半導体記憶装置 |
JP2010146665A (ja) * | 2008-12-19 | 2010-07-01 | Toshiba Corp | 抵抗変化型不揮発性半導体メモリ |
KR102384864B1 (ko) | 2017-11-03 | 2022-04-08 | 삼성전자주식회사 | 불량 스트링을 리페어하는 방법 및 불휘발성 메모리 장치 |
CN112837736A (zh) * | 2021-03-16 | 2021-05-25 | 江苏时代全芯存储科技股份有限公司 | 记忆体装置以及其修补方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5446698A (en) * | 1994-06-30 | 1995-08-29 | Sgs-Thomson Microelectronics, Inc. | Block decoded redundant master wordline |
JP3710002B2 (ja) * | 1995-08-23 | 2005-10-26 | 株式会社日立製作所 | 半導体記憶装置 |
JP3845889B2 (ja) * | 1996-02-21 | 2006-11-15 | ソニー株式会社 | 半導体記憶装置 |
US5808945A (en) * | 1996-02-21 | 1998-09-15 | Sony Corporation | Semiconductor memory having redundant memory array |
US5774471A (en) * | 1996-12-17 | 1998-06-30 | Integrated Silicon Solution Inc. | Multiple location repair word line redundancy circuit |
US6163489A (en) * | 1999-07-16 | 2000-12-19 | Micron Technology Inc. | Semiconductor memory having multiple redundant columns with offset segmentation boundaries |
US6249465B1 (en) * | 2000-02-18 | 2001-06-19 | Hewlett-Packard Company | Redundancy programming using addressable scan paths to reduce the number of required fuses |
US6314030B1 (en) * | 2000-06-14 | 2001-11-06 | Micron Technology, Inc. | Semiconductor memory having segmented row repair |
-
2002
- 2002-04-26 US US10/133,919 patent/US6687171B2/en not_active Expired - Fee Related
-
2003
- 2003-04-17 JP JP2004500297A patent/JP2005524190A/ja active Pending
- 2003-04-17 TW TW092108975A patent/TWI226062B/zh not_active IP Right Cessation
- 2003-04-17 EP EP03718775A patent/EP1500111B1/de not_active Expired - Fee Related
- 2003-04-17 WO PCT/EP2003/004078 patent/WO2003092012A2/en active IP Right Grant
- 2003-04-17 KR KR1020047016995A patent/KR100633426B1/ko not_active IP Right Cessation
- 2003-04-17 CN CNA038094495A patent/CN1650371A/zh active Pending
- 2003-04-17 DE DE60323744T patent/DE60323744D1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1500111B1 (de) | 2008-09-24 |
WO2003092012A2 (en) | 2003-11-06 |
US20030202387A1 (en) | 2003-10-30 |
EP1500111A2 (de) | 2005-01-26 |
TWI226062B (en) | 2005-01-01 |
KR20040102154A (ko) | 2004-12-03 |
TW200307288A (en) | 2003-12-01 |
CN1650371A (zh) | 2005-08-03 |
US6687171B2 (en) | 2004-02-03 |
WO2003092012A3 (en) | 2004-02-05 |
JP2005524190A (ja) | 2005-08-11 |
KR100633426B1 (ko) | 2006-10-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |