DE60309157D1 - Speichersystem mit Fehlererkennungsvorrichtung - Google Patents
Speichersystem mit FehlererkennungsvorrichtungInfo
- Publication number
- DE60309157D1 DE60309157D1 DE60309157T DE60309157T DE60309157D1 DE 60309157 D1 DE60309157 D1 DE 60309157D1 DE 60309157 T DE60309157 T DE 60309157T DE 60309157 T DE60309157 T DE 60309157T DE 60309157 D1 DE60309157 D1 DE 60309157D1
- Authority
- DE
- Germany
- Prior art keywords
- detection device
- storage system
- error detection
- error
- storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0407—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Debugging And Monitoring (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03425539A EP1505608B1 (de) | 2003-08-06 | 2003-08-06 | Speichersystem mit Fehlererkennungsvorrichtung |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60309157D1 true DE60309157D1 (de) | 2006-11-30 |
DE60309157T2 DE60309157T2 (de) | 2007-08-30 |
Family
ID=33547845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60309157T Expired - Fee Related DE60309157T2 (de) | 2003-08-06 | 2003-08-06 | Speichersystem mit Fehlererkennungsvorrichtung |
Country Status (3)
Country | Link |
---|---|
US (1) | US20050060602A1 (de) |
EP (1) | EP1505608B1 (de) |
DE (1) | DE60309157T2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8396208B2 (en) * | 2004-12-21 | 2013-03-12 | Sandisk Technologies Inc. | Memory system with in stream data encryption/decryption and error correction |
US20060242429A1 (en) * | 2004-12-21 | 2006-10-26 | Michael Holtzman | In stream data encryption / decryption method |
JP4802339B2 (ja) * | 2006-05-24 | 2011-10-26 | 日本電産サンキョー株式会社 | 不揮発性メモリの更新方法 |
US9329919B2 (en) | 2008-07-16 | 2016-05-03 | Freescale Semiconductor, Inc. | Micro controller unit including an error indicator module |
JP6040966B2 (ja) * | 2014-07-18 | 2016-12-07 | 株式会社デンソー | 信号処理装置 |
DE102022111126A1 (de) * | 2022-05-05 | 2023-11-09 | Infineon Technologies Ag | Datenverarbeitungsvorrichtung und verfahren zum prüfen der integrität eines speichers |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3833930A (en) * | 1973-01-12 | 1974-09-03 | Burroughs Corp | Input/output system for a microprogram digital computer |
JPS59112494A (ja) * | 1982-12-17 | 1984-06-28 | Fuji Electric Co Ltd | メモリテスト方式 |
US4542454A (en) * | 1983-03-30 | 1985-09-17 | Advanced Micro Devices, Inc. | Apparatus for controlling access to a memory |
DE3530257A1 (de) * | 1985-08-23 | 1987-03-05 | Siemens Ag | Verfahren zur pruefung eines schreib-lese-speichers waehrend seines betriebs |
JPH04256000A (ja) * | 1991-02-08 | 1992-09-10 | Nec Eng Ltd | メモリ試験方式 |
US5216672A (en) * | 1992-04-24 | 1993-06-01 | Digital Equipment Corporation | Parallel diagnostic mode for testing computer memory |
US5487170A (en) * | 1993-12-16 | 1996-01-23 | International Business Machines Corporation | Data processing system having dynamic priority task scheduling capabilities |
JP3578638B2 (ja) * | 1998-08-25 | 2004-10-20 | 株式会社日立ユニシアオートモティブ | マイコン用メモリの診断装置 |
US6480982B1 (en) * | 1999-06-04 | 2002-11-12 | International Business Machines Corporation | Computer RAM memory system with enhanced scrubbing and sparing |
-
2003
- 2003-08-06 EP EP03425539A patent/EP1505608B1/de not_active Expired - Lifetime
- 2003-08-06 DE DE60309157T patent/DE60309157T2/de not_active Expired - Fee Related
-
2004
- 2004-08-06 US US10/913,129 patent/US20050060602A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1505608A1 (de) | 2005-02-09 |
EP1505608B1 (de) | 2006-10-18 |
DE60309157T2 (de) | 2007-08-30 |
US20050060602A1 (en) | 2005-03-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |