DE60234367D1 - Dielektrizitätskonstantenmessvorrichtung und dielektrizitätskonstantenmessverfahren - Google Patents

Dielektrizitätskonstantenmessvorrichtung und dielektrizitätskonstantenmessverfahren

Info

Publication number
DE60234367D1
DE60234367D1 DE60234367T DE60234367T DE60234367D1 DE 60234367 D1 DE60234367 D1 DE 60234367D1 DE 60234367 T DE60234367 T DE 60234367T DE 60234367 T DE60234367 T DE 60234367T DE 60234367 D1 DE60234367 D1 DE 60234367D1
Authority
DE
Germany
Prior art keywords
constant measurement
dielectricity constant
dielectricity
measurement device
measurement method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60234367T
Other languages
English (en)
Inventor
Yasuo Cho
Atsushi Onoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Corp filed Critical Pioneer Corp
Application granted granted Critical
Publication of DE60234367D1 publication Critical patent/DE60234367D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G01R27/2676—Probes
DE60234367T 2001-09-10 2002-09-10 Dielektrizitätskonstantenmessvorrichtung und dielektrizitätskonstantenmessverfahren Expired - Lifetime DE60234367D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001274347 2001-09-10
PCT/JP2002/009223 WO2003023423A2 (en) 2001-09-10 2002-09-10 Dielectric constant measuring apparatus and dielectric constant measuring method

Publications (1)

Publication Number Publication Date
DE60234367D1 true DE60234367D1 (de) 2009-12-24

Family

ID=19099400

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60234367T Expired - Lifetime DE60234367D1 (de) 2001-09-10 2002-09-10 Dielektrizitätskonstantenmessvorrichtung und dielektrizitätskonstantenmessverfahren

Country Status (6)

Country Link
US (1) US7218600B2 (de)
EP (1) EP1435003B1 (de)
JP (1) JP2005502886A (de)
AU (1) AU2002330751A1 (de)
DE (1) DE60234367D1 (de)
WO (1) WO2003023423A2 (de)

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AU2002330751A1 (en) 2001-09-10 2003-03-24 Yasuo Cho Dielectric constant measuring apparatus and dielectric constant measuring method
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JP3701268B2 (ja) * 2002-09-11 2005-09-28 康雄 長 誘電体記録装置、誘電体再生装置及び誘電体記録再生装置
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JP4975546B2 (ja) * 2007-07-25 2012-07-11 日本電信電話株式会社 誘電率測定装置
JP2009036534A (ja) * 2007-07-31 2009-02-19 National Institute Of Advanced Industrial & Technology 走査型プローブ顕微鏡及びそれを用いた膜厚分布測定方法
JP5318383B2 (ja) * 2007-08-07 2013-10-16 デクセリアルズ株式会社 光学部品封止材及び発光装置
WO2009050814A1 (ja) * 2007-10-18 2009-04-23 Pioneer Corporation 強誘電体材料の分極方向検出装置および分極方向検出方法
US20090201015A1 (en) * 2008-02-12 2009-08-13 Nanochip, Inc. Method and device for detecting ferroelectric polarization
US20090213492A1 (en) * 2008-02-22 2009-08-27 Nanochip, Inc. Method of improving stability of domain polarization in ferroelectric thin films
US20100002563A1 (en) * 2008-07-01 2010-01-07 Nanochip, Inc. Media with tetragonally-strained recording layer having improved surface roughness
US20100085863A1 (en) * 2008-10-07 2010-04-08 Nanochip, Inc. Retuning of ferroelectric media built-in-bias
JP5625723B2 (ja) 2010-10-15 2014-11-19 ソニー株式会社 電子機器、給電方法および給電システム
US9297795B2 (en) * 2010-12-03 2016-03-29 Todd Nicholas Bishop Monitored filament insertion for resitivity testing
CZ304582B6 (cs) * 2013-05-16 2014-07-16 Česká zemědělská univerzita v Praze Kapacitní snímač průchodnosti partikulárních materiálů s teplotní kompenzací
US10498446B2 (en) 2017-04-20 2019-12-03 Harris Corporation Electronic system including waveguide with passive optical elements and related methods
CN110672882B (zh) * 2019-11-07 2022-06-03 南京邮电大学 一种利用扫描探针探测材料介电常数的方法

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Also Published As

Publication number Publication date
EP1435003B1 (de) 2009-11-11
EP1435003A2 (de) 2004-07-07
US20040263185A1 (en) 2004-12-30
WO2003023423A2 (en) 2003-03-20
WO2003023423A3 (en) 2004-04-15
JP2005502886A (ja) 2005-01-27
AU2002330751A1 (en) 2003-03-24
US7218600B2 (en) 2007-05-15

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