DE60230742D1 - Optische kohärenztomographieeinrichtung - Google Patents

Optische kohärenztomographieeinrichtung

Info

Publication number
DE60230742D1
DE60230742D1 DE60230742T DE60230742T DE60230742D1 DE 60230742 D1 DE60230742 D1 DE 60230742D1 DE 60230742 T DE60230742 T DE 60230742T DE 60230742 T DE60230742 T DE 60230742T DE 60230742 D1 DE60230742 D1 DE 60230742D1
Authority
DE
Germany
Prior art keywords
optical coherence
coherence tomography
tomography device
optical
tomography
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60230742T
Other languages
English (en)
Inventor
Naohiro Tanno
Sumio Matsumura
Michiro Hasegawa
Yukihiro Hino
Tohru Nakagawa
Masahiro Kohno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Science and Technology Agency
MTEX Matsumura Corp
Original Assignee
Japan Science and Technology Agency
MTEX Matsumura Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Science and Technology Agency, MTEX Matsumura Corp filed Critical Japan Science and Technology Agency
Application granted granted Critical
Publication of DE60230742D1 publication Critical patent/DE60230742D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02003—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/35—Mechanical variable delay line

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Eye Examination Apparatus (AREA)
DE60230742T 2001-04-13 2002-04-11 Optische kohärenztomographieeinrichtung Expired - Lifetime DE60230742D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001114898A JP3539726B2 (ja) 2001-04-13 2001-04-13 光コヒーレンストモグラフィーにおける回転反射体による高速光遅延発生方法及びその光コヒーレンストモグラフィー装置
PCT/JP2002/003606 WO2002084259A1 (fr) 2001-04-13 2002-04-11 Procede de generation d'un retard optique a grande vitesse par reflecteur de rotation dans une tomographie par coherence optique et dispositif de tomographie par coherence optique

Publications (1)

Publication Number Publication Date
DE60230742D1 true DE60230742D1 (de) 2009-02-26

Family

ID=18965886

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60230742T Expired - Lifetime DE60230742D1 (de) 2001-04-13 2002-04-11 Optische kohärenztomographieeinrichtung

Country Status (5)

Country Link
US (1) US7227646B2 (de)
EP (1) EP1391718B1 (de)
JP (1) JP3539726B2 (de)
DE (1) DE60230742D1 (de)
WO (1) WO2002084259A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100346739C (zh) * 2005-06-24 2007-11-07 清华大学 实时成像的光学相干内窥系统
JP4819478B2 (ja) * 2005-10-31 2011-11-24 株式会社ニデック 眼科撮影装置
JP2007248132A (ja) * 2006-03-14 2007-09-27 J Morita Tokyo Mfg Corp Ｏｃｔによる光診断方法及び装置
US20080100848A1 (en) * 2006-10-25 2008-05-01 Koji Kobayashi Optical tomograph
JP5207959B2 (ja) * 2008-02-20 2013-06-12 国立大学法人大阪大学 寸法測定装置
DE102008050847A1 (de) * 2008-10-08 2010-04-22 Precitec Optronik Gmbh Optischer Weglängenmodulator
US8974059B2 (en) * 2008-12-03 2015-03-10 University Of Miami Retinal imaging system for the mouse or rat or other small animals
DE102009022958A1 (de) 2009-05-28 2010-12-02 Carl Zeiss Meditec Ag Vorrichtung und Verfahren zur optischen Messung von Relativabständen
US8792105B2 (en) * 2010-01-19 2014-07-29 Si-Ware Systems Interferometer with variable optical path length reference mirror using overlapping depth scan signals
JP4949504B2 (ja) * 2010-06-18 2012-06-13 株式会社ニデック 眼科撮影装置
JP2014145703A (ja) * 2013-01-30 2014-08-14 Pioneer Electronic Corp 再帰反射装置及びテラヘルツ波計測装置
KR101458997B1 (ko) * 2014-06-09 2014-11-07 김호환 리닉 간섭계의 기준미러 변환장치
US10645017B2 (en) * 2018-05-09 2020-05-05 Biosig Technologies, Inc. Systems, apparatus, and methods for conveying biomedical signals between a patient and monitoring and treatment devices
JP6853446B2 (ja) 2019-02-28 2021-03-31 地方独立行政法人神奈川県立産業技術総合研究所 流動体試料の内部構造観察装置及び内部構造解析システム、流動体試料の内部構造観察方法及び内部構造解析方法、並びにセラミックスの製造方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3005520C2 (de) * 1980-02-14 1983-05-05 Kayser-Threde GmbH, 8000 München Zweistrahl-Interferometer zur Fourierspektroskopie
WO1992019930A1 (en) * 1991-04-29 1992-11-12 Massachusetts Institute Of Technology Method and apparatus for optical imaging and measurement
US6501551B1 (en) * 1991-04-29 2002-12-31 Massachusetts Institute Of Technology Fiber optic imaging endoscope interferometer with at least one faraday rotator
JPH0749306A (ja) * 1993-08-04 1995-02-21 Naohiro Tanno 光波エコートモグラフィー装置
JP2826265B2 (ja) * 1994-03-28 1998-11-18 株式会社生体光情報研究所 断層像撮影装置
DE19814070B4 (de) * 1998-03-30 2009-07-16 Carl Zeiss Meditec Ag Verfahren und Anordnung zur Kohärenz-Tomographie mit erhöhter Transversalauflösung
DE19814068A1 (de) * 1998-03-30 1999-10-07 Zeiss Carl Jena Gmbh Optischer Weglängenmodulator
US6137585A (en) * 1998-05-15 2000-10-24 Laser Diagnostic Technologies, Inc. Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures
US6124929A (en) * 1998-08-18 2000-09-26 Weibel; Stephen C. Michelson interferometer with orbiting retroreflector
JP3631056B2 (ja) * 1999-08-26 2005-03-23 独立行政法人科学技術振興機構 光波反射断層像観測装置
JP3553451B2 (ja) * 2000-02-18 2004-08-11 独立行政法人 科学技術振興機構 光干渉断層像観測装置
US6741359B2 (en) * 2002-05-22 2004-05-25 Carl Zeiss Meditec, Inc. Optical coherence tomography optical scanner

Also Published As

Publication number Publication date
JP3539726B2 (ja) 2004-07-07
EP1391718A1 (de) 2004-02-25
EP1391718B1 (de) 2009-01-07
WO2002084259A1 (fr) 2002-10-24
US20040114151A1 (en) 2004-06-17
US7227646B2 (en) 2007-06-05
EP1391718A4 (de) 2006-10-11
JP2002310899A (ja) 2002-10-23

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Legal Events

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