DE60224703D1 - Leseverstärker für nichtflüchtige integrierte mehrebenen-speicherbausteine - Google Patents
Leseverstärker für nichtflüchtige integrierte mehrebenen-speicherbausteineInfo
- Publication number
- DE60224703D1 DE60224703D1 DE60224703T DE60224703T DE60224703D1 DE 60224703 D1 DE60224703 D1 DE 60224703D1 DE 60224703 T DE60224703 T DE 60224703T DE 60224703 T DE60224703 T DE 60224703T DE 60224703 D1 DE60224703 D1 DE 60224703D1
- Authority
- DE
- Germany
- Prior art keywords
- cell
- sense amplifier
- charge
- buffer
- reader
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5642—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Amplifiers (AREA)
- Non-Volatile Memory (AREA)
- Warehouses Or Storage Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US989996 | 2001-11-20 | ||
US09/989,996 US6747892B2 (en) | 2000-11-21 | 2001-11-20 | Sense amplifier for multilevel non-volatile integrated memory devices |
PCT/US2002/036356 WO2003044803A2 (en) | 2001-11-20 | 2002-11-12 | Sense amplifier for multilevel non-volatile integrated memory devices |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60224703D1 true DE60224703D1 (de) | 2008-03-06 |
DE60224703T2 DE60224703T2 (de) | 2009-01-08 |
Family
ID=25535640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60224703T Expired - Lifetime DE60224703T2 (de) | 2001-11-20 | 2002-11-12 | Leseverstärker für nichtflüchtige integrierte mehrebenen-speicherbausteine |
Country Status (9)
Country | Link |
---|---|
US (1) | US6747892B2 (de) |
EP (1) | EP1446807B1 (de) |
JP (1) | JP4274943B2 (de) |
KR (1) | KR100915883B1 (de) |
CN (1) | CN100456389C (de) |
AT (1) | ATE384330T1 (de) |
AU (1) | AU2002364118A1 (de) |
DE (1) | DE60224703T2 (de) |
WO (1) | WO2003044803A2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110111824A (zh) * | 2018-02-01 | 2019-08-09 | 爱思开海力士有限公司 | 多电平感测电路及包括其的半导体存储器件 |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3709846B2 (ja) * | 2002-01-18 | 2005-10-26 | ソニー株式会社 | 並列型ad変換器 |
KR100942870B1 (ko) * | 2005-07-04 | 2010-02-17 | 마이크론 테크놀로지, 인크. | 저전력 다중 비트 감지 증폭기 |
US7656710B1 (en) | 2005-07-14 | 2010-02-02 | Sau Ching Wong | Adaptive operations for nonvolatile memories |
US7385848B2 (en) * | 2005-09-09 | 2008-06-10 | Sharp Kabushiki Kaisha | Semiconductor storage device and electronic equipment |
US7489546B2 (en) | 2005-12-20 | 2009-02-10 | Micron Technology, Inc. | NAND architecture memory devices and operation |
JP4855773B2 (ja) * | 2005-12-26 | 2012-01-18 | 株式会社東芝 | 半導体記憶装置及びそのデータ読み出し方法 |
US7457178B2 (en) * | 2006-01-12 | 2008-11-25 | Sandisk Corporation | Trimming of analog voltages in flash memory devices |
US7254071B2 (en) * | 2006-01-12 | 2007-08-07 | Sandisk Corporation | Flash memory devices with trimmed analog voltages |
US7366028B2 (en) | 2006-04-24 | 2008-04-29 | Sandisk Corporation | Method of high-performance flash memory data transfer |
US7525855B2 (en) * | 2006-04-24 | 2009-04-28 | Sandisk Corporation | Method of high-performance flash memory data transfer |
US7345926B2 (en) * | 2006-04-24 | 2008-03-18 | Sandisk Corporation | High-performance flash memory data transfer |
US7499339B2 (en) * | 2006-07-19 | 2009-03-03 | Sandisk Corporation | High-performance flash memory data transfer |
US7499369B2 (en) * | 2006-07-19 | 2009-03-03 | Sandisk Corporation | Method of high-performance flash memory data transfer |
US7366029B2 (en) * | 2006-04-24 | 2008-04-29 | Sandisk Corporation | High-performance flash memory data transfer |
JPWO2007125590A1 (ja) | 2006-04-28 | 2009-09-10 | スパンション エルエルシー | 半導体装置およびその制御方法 |
US7809994B2 (en) * | 2006-05-17 | 2010-10-05 | Sandisk Corporation | Error correction coding for multiple-sector pages in flash memory devices |
US20070300130A1 (en) * | 2006-05-17 | 2007-12-27 | Sandisk Corporation | Method of Error Correction Coding for Multiple-Sector Pages in Flash Memory Devices |
US7304893B1 (en) | 2006-06-30 | 2007-12-04 | Sandisk Corporation | Method of partial page fail bit detection in flash memory devices |
US7355892B2 (en) * | 2006-06-30 | 2008-04-08 | Sandisk Corporation | Partial page fail bit detection in flash memory devices |
US7522463B2 (en) | 2007-01-12 | 2009-04-21 | Atmel Corporation | Sense amplifier with stages to reduce capacitance mismatch in current mirror load |
US7599224B2 (en) * | 2007-07-03 | 2009-10-06 | Sandisk Corporation | Systems for coarse/fine program verification in non-volatile memory using different reference levels for improved sensing |
US7508715B2 (en) * | 2007-07-03 | 2009-03-24 | Sandisk Corporation | Coarse/fine program verification in non-volatile memory using different reference levels for improved sensing |
US7746713B2 (en) * | 2007-09-12 | 2010-06-29 | Massachusetts Institute Of Technology | High density 45 nm SRAM using small-signal non-strobed regenerative sensing |
KR101026658B1 (ko) * | 2008-03-17 | 2011-04-04 | 엘피다 메모리 가부시키가이샤 | 단일-종단 감지 증폭기를 갖는 반도체 디바이스 |
US7710782B2 (en) * | 2008-05-05 | 2010-05-04 | Macronix International Co., Ltd. | Sense amplifier and data sensing method thereof |
CN101609710B (zh) * | 2008-06-17 | 2011-07-27 | 旺宏电子股份有限公司 | 感测放大器电路及其数据感测方法 |
US8469971B2 (en) * | 2008-08-12 | 2013-06-25 | Boston Scientific Neuromodulation Corporation | Stylet for guiding leads of implantable electric stimulation systems and methods of making and using |
US8509013B1 (en) * | 2010-04-30 | 2013-08-13 | Micron Technology, Inc. | Partitioned bitline for memory |
US9047930B2 (en) * | 2013-07-26 | 2015-06-02 | International Business Machines Corporation | Single-ended low-swing power-savings mechanism with process compensation |
CN105469818B (zh) * | 2014-09-12 | 2018-01-26 | 上海华虹宏力半导体制造有限公司 | 读出放大器 |
US9997250B2 (en) | 2016-03-17 | 2018-06-12 | SK Hynix Inc. | Non-volatile memory device with a plurality of cache latches and switches and method for operating non-volatile memory device |
US11372056B2 (en) * | 2020-05-26 | 2022-06-28 | Sandisk Technologies Llc | Circuit for detecting pin-to-pin leaks of an integrated circuit package |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5268319A (en) | 1988-06-08 | 1993-12-07 | Eliyahou Harari | Highly compact EPROM and flash EEPROM devices |
US5095344A (en) * | 1988-06-08 | 1992-03-10 | Eliyahou Harari | Highly compact eprom and flash eeprom devices |
US5172338B1 (en) | 1989-04-13 | 1997-07-08 | Sandisk Corp | Multi-state eeprom read and write circuits and techniques |
US5220531A (en) | 1991-01-02 | 1993-06-15 | Information Storage Devices, Inc. | Source follower storage cell and improved method and apparatus for iterative write for integrated circuit analog signal recording and playback |
US6222762B1 (en) * | 1992-01-14 | 2001-04-24 | Sandisk Corporation | Multi-state memory |
FR2694119B1 (fr) * | 1992-07-24 | 1994-08-26 | Sgs Thomson Microelectronics | Circuit de lecture pour mémoire, avec recharge et équilibrage avant lecture. |
US5591384A (en) | 1994-03-31 | 1997-01-07 | Modern Technologies Corp. | Method for molding parts |
EP0735542A1 (de) | 1995-03-31 | 1996-10-02 | STMicroelectronics S.r.l. | Leseschaltung für nichtflüchtige Mehrpegel-Speicherzellenanordnungen |
US5684736A (en) | 1996-06-17 | 1997-11-04 | Nuram Technology, Inc. | Multilevel memory cell sense amplifier system |
US6490200B2 (en) | 2000-03-27 | 2002-12-03 | Sandisk Corporation | Non-volatile memory with improved sensing and method therefor |
IT1314042B1 (it) * | 1999-10-11 | 2002-12-03 | St Microelectronics Srl | Circuito amplificatore di lettura per memorie, ad elevata capacita'di discriminazione di livelli di corrente. |
KR100436127B1 (ko) * | 2000-06-28 | 2004-06-14 | 주식회사 하이닉스반도체 | 센스앰프를 포함하는 반도체 메모리 장치 및 센스앰프구동 방법 |
US6538922B1 (en) | 2000-09-27 | 2003-03-25 | Sandisk Corporation | Writable tracking cells |
-
2001
- 2001-11-20 US US09/989,996 patent/US6747892B2/en not_active Expired - Lifetime
-
2002
- 2002-11-12 WO PCT/US2002/036356 patent/WO2003044803A2/en active IP Right Grant
- 2002-11-12 AT AT02799188T patent/ATE384330T1/de not_active IP Right Cessation
- 2002-11-12 EP EP02799188A patent/EP1446807B1/de not_active Expired - Lifetime
- 2002-11-12 KR KR1020047007706A patent/KR100915883B1/ko not_active IP Right Cessation
- 2002-11-12 AU AU2002364118A patent/AU2002364118A1/en not_active Abandoned
- 2002-11-12 DE DE60224703T patent/DE60224703T2/de not_active Expired - Lifetime
- 2002-11-12 CN CNB028230825A patent/CN100456389C/zh not_active Expired - Fee Related
- 2002-11-12 JP JP2003546354A patent/JP4274943B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110111824A (zh) * | 2018-02-01 | 2019-08-09 | 爱思开海力士有限公司 | 多电平感测电路及包括其的半导体存储器件 |
Also Published As
Publication number | Publication date |
---|---|
ATE384330T1 (de) | 2008-02-15 |
JP4274943B2 (ja) | 2009-06-10 |
KR100915883B1 (ko) | 2009-09-07 |
JP2005510006A (ja) | 2005-04-14 |
CN100456389C (zh) | 2009-01-28 |
DE60224703T2 (de) | 2009-01-08 |
WO2003044803A2 (en) | 2003-05-30 |
US6747892B2 (en) | 2004-06-08 |
EP1446807A4 (de) | 2005-11-30 |
AU2002364118A1 (en) | 2003-06-10 |
KR20040070174A (ko) | 2004-08-06 |
US20030095431A1 (en) | 2003-05-22 |
EP1446807A2 (de) | 2004-08-18 |
WO2003044803A3 (en) | 2003-08-28 |
CN1672215A (zh) | 2005-09-21 |
EP1446807B1 (de) | 2008-01-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
R082 | Change of representative |
Ref document number: 1446807 Country of ref document: EP Representative=s name: PATENTANWAELTE MAXTON LANGMAACK & PARTNER, DE |