DE602006017413D1 - Siliciumcarbid-halbleiteranordnung - Google Patents

Siliciumcarbid-halbleiteranordnung

Info

Publication number
DE602006017413D1
DE602006017413D1 DE602006017413T DE602006017413T DE602006017413D1 DE 602006017413 D1 DE602006017413 D1 DE 602006017413D1 DE 602006017413 T DE602006017413 T DE 602006017413T DE 602006017413 T DE602006017413 T DE 602006017413T DE 602006017413 D1 DE602006017413 D1 DE 602006017413D1
Authority
DE
Germany
Prior art keywords
semiconductor device
silicon carbide
carbide semiconductor
silicon
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006017413T
Other languages
English (en)
Inventor
Hiroshi Sugimoto
Yoshinori Matsuno
Kenichi Ohtsuka
Noboru Mikami
Kenichi Kuroda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE602006017413D1 publication Critical patent/DE602006017413D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
    • H01L29/161—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table including two or more of the elements provided for in group H01L29/16, e.g. alloys
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861—Diodes
    • H01L29/8611—Planar PN junction diodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/0445—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising crystalline silicon carbide
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
    • H01L29/045—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes by their particular orientation of crystalline planes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
    • H01L29/1608—Silicon carbide
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66053—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide
    • H01L29/6606—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861—Diodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Thyristors (AREA)
  • Recrystallisation Techniques (AREA)
DE602006017413T 2005-09-14 2006-04-24 Siliciumcarbid-halbleiteranordnung Active DE602006017413D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005267264A JP5068009B2 (ja) 2005-09-14 2005-09-14 炭化ケイ素半導体装置
PCT/JP2006/308531 WO2007032118A1 (ja) 2005-09-14 2006-04-24 炭化ケイ素半導体装置

Publications (1)

Publication Number Publication Date
DE602006017413D1 true DE602006017413D1 (de) 2010-11-18

Family

ID=37864721

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006017413T Active DE602006017413D1 (de) 2005-09-14 2006-04-24 Siliciumcarbid-halbleiteranordnung

Country Status (7)

Country Link
US (1) US7847296B2 (de)
EP (1) EP1936695B1 (de)
JP (1) JP5068009B2 (de)
KR (1) KR101004230B1 (de)
CN (1) CN101268555B (de)
DE (1) DE602006017413D1 (de)
WO (1) WO2007032118A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4921880B2 (ja) * 2006-07-28 2012-04-25 株式会社東芝 高耐圧半導体装置
US8221546B2 (en) 2008-03-26 2012-07-17 Ss Sc Ip, Llc Epitaxial growth on low degree off-axis SiC substrates and semiconductor devices made thereby
DE102008025243B3 (de) * 2008-05-27 2009-12-10 Siced Electronics Development Gmbh & Co. Kg Halbleiterbauelement mit asymmetrischem Randabschluss
JP2012146921A (ja) * 2011-01-14 2012-08-02 Denso Corp 炭化珪素半導体装置
JP2012146932A (ja) * 2011-01-14 2012-08-02 Kansai Electric Power Co Inc:The バイポーラ半導体素子
JP2013239488A (ja) 2012-05-11 2013-11-28 Rohm Co Ltd 半導体装置
DE112014003637B4 (de) * 2013-08-08 2023-07-27 Fuji Electric Co., Ltd. Hochspannungs-Halbleitervorrichtung und Herstellungsverfahren derselben
WO2022210255A1 (ja) * 2021-03-31 2022-10-06 住友電気工業株式会社 半導体装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4264857A (en) 1978-06-30 1981-04-28 International Business Machines Corporation Constant voltage threshold device
JPH09172187A (ja) 1995-12-19 1997-06-30 Hitachi Ltd 接合型電界効果半導体装置およびその製造方法
US6133587A (en) * 1996-01-23 2000-10-17 Denso Corporation Silicon carbide semiconductor device and process for manufacturing same
JP3471509B2 (ja) * 1996-01-23 2003-12-02 株式会社デンソー 炭化珪素半導体装置
JPH10107263A (ja) * 1996-09-27 1998-04-24 Fuji Electric Co Ltd 絶縁ゲート型炭化ケイ素半導体装置
SE9700156D0 (sv) 1997-01-21 1997-01-21 Abb Research Ltd Junction termination for Si C Schottky diode
EP1065726B1 (de) * 1998-03-19 2010-01-13 Hitachi, Ltd. Sperrschicht-feldeffekttransistor aus silicumcarbid
JP3635956B2 (ja) 1998-12-24 2005-04-06 富士電機ホールディングス株式会社 炭化けい素ショットキーバリアダイオードの製造方法
JP4450123B2 (ja) * 1999-11-17 2010-04-14 株式会社デンソー 炭化珪素半導体装置
JP4110875B2 (ja) * 2002-08-09 2008-07-02 株式会社デンソー 炭化珪素半導体装置
CN1802752A (zh) * 2003-11-25 2006-07-12 松下电器产业株式会社 半导体元件

Also Published As

Publication number Publication date
KR20080038220A (ko) 2008-05-02
US7847296B2 (en) 2010-12-07
EP1936695A1 (de) 2008-06-25
WO2007032118A1 (ja) 2007-03-22
CN101268555B (zh) 2011-09-14
JP5068009B2 (ja) 2012-11-07
KR101004230B1 (ko) 2010-12-24
EP1936695B1 (de) 2010-10-06
US20090134404A1 (en) 2009-05-28
CN101268555A (zh) 2008-09-17
JP2007081144A (ja) 2007-03-29
EP1936695A4 (de) 2008-10-22

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