DE602006005478D1 - Sensorchip mit sich berührenden nichtmetallischen teilchen mit metallischer beschichtung - Google Patents

Sensorchip mit sich berührenden nichtmetallischen teilchen mit metallischer beschichtung

Info

Publication number
DE602006005478D1
DE602006005478D1 DE602006005478T DE602006005478T DE602006005478D1 DE 602006005478 D1 DE602006005478 D1 DE 602006005478D1 DE 602006005478 T DE602006005478 T DE 602006005478T DE 602006005478 T DE602006005478 T DE 602006005478T DE 602006005478 D1 DE602006005478 D1 DE 602006005478D1
Authority
DE
Germany
Prior art keywords
metallic
transition metal
chip
particles
sensor chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006005478T
Other languages
English (en)
Inventor
Reiner Dahint
Petra Buecker
Elka Trileva
Soeren Schilp
Michael Himmelhaus
Hatice Acunman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujirebio Inc
Original Assignee
Fujirebio Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujirebio Inc filed Critical Fujirebio Inc
Publication of DE602006005478D1 publication Critical patent/DE602006005478D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
DE602006005478T 2005-04-22 2006-04-21 Sensorchip mit sich berührenden nichtmetallischen teilchen mit metallischer beschichtung Active DE602006005478D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05008931A EP1715326A1 (de) 2005-04-22 2005-04-22 Sensorchip mit einer Schicht aus miteinander verbundenen nicht-metallischen Partikeln mit einer metallischen Beschichtung
PCT/EP2006/003714 WO2006111414A1 (en) 2005-04-22 2006-04-21 Sensor chip with connected non-metallic particles comprising a metallic coating

Publications (1)

Publication Number Publication Date
DE602006005478D1 true DE602006005478D1 (de) 2009-04-16

Family

ID=35520796

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006005478T Active DE602006005478D1 (de) 2005-04-22 2006-04-21 Sensorchip mit sich berührenden nichtmetallischen teilchen mit metallischer beschichtung

Country Status (7)

Country Link
US (1) US8288166B2 (de)
EP (2) EP1715326A1 (de)
JP (1) JP5278676B2 (de)
AT (1) ATE424555T1 (de)
DE (1) DE602006005478D1 (de)
ES (1) ES2321228T3 (de)
WO (1) WO2006111414A1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8355136B2 (en) 2005-12-16 2013-01-15 Indiana University Research And Technology Corporation Sub-micron surface plasmon resonance sensor systems
CA2634027A1 (en) * 2005-12-16 2007-07-05 James A. Glazier Sub-micron surface plasmon resonance sensor systems
GB2447696A (en) * 2007-03-23 2008-09-24 Univ Exeter Photonic biosensor arrays
US20080255460A1 (en) * 2007-04-13 2008-10-16 Ethicon Endo-Surgery, Inc. Nanoparticle tissue based identification and illumination
US9080942B2 (en) * 2007-04-18 2015-07-14 The Research Foundation for State University of New York Flexible multi-moduled nanoparticle-structured sensor array on polymer substrate and methods for manufacture
JP2009145189A (ja) * 2007-12-13 2009-07-02 Fujifilm Corp バイオセンサー
JP2009265062A (ja) * 2008-04-30 2009-11-12 Yasuro Niitome 分析用チップとその製造方法およびその分析方法
KR101251538B1 (ko) 2009-04-17 2013-04-08 (주)아벨리노 아벨리노 각막이상증 진단용 프라이머
KR101041606B1 (ko) * 2009-08-18 2011-06-15 (주)아벨리노 다중 스팟 금속 증착형 나노구조배열 각막이상증 진단용 핵산칩 및 이의 제조방법
JP5620154B2 (ja) * 2009-10-15 2014-11-05 公益財団法人神奈川科学技術アカデミー 中空微小体およびその作製方法
KR101125212B1 (ko) 2010-10-01 2012-03-21 (주)아벨리노 아벨리노 각막이상증 진단용 시스템
JP5709039B2 (ja) * 2010-10-21 2015-04-30 学校法人 東洋大学 表面増強分光用基板
WO2012077756A1 (ja) * 2010-12-08 2012-06-14 公立大学法人大阪府立大学 金属ナノ粒子集積構造体を利用した被検出物質の検出装置および方法
JP2013002817A (ja) * 2011-06-10 2013-01-07 Kyushu Univ 残留農薬検出方法および表面プラズモン共鳴センサ
JP5967756B2 (ja) * 2012-04-27 2016-08-10 学校法人 東洋大学 分光用基板
US10889850B2 (en) 2013-03-15 2021-01-12 Avellino Lab Usa, Inc. Methods for improved isolation of genomic DNA templates for allele detection
KR20220100079A (ko) 2013-03-15 2022-07-14 아벨리노 랩 유에스에이, 인크. 대립유전자 검출을 위한 게놈 dna 주형의 개선된 단리 방법
AU2014348279B2 (en) 2013-11-15 2021-02-18 Avellino Lab Usa, Inc. Methods for multiplex detection of alleles associated with ophthalmic conditions
US9646854B2 (en) * 2014-03-28 2017-05-09 Intel Corporation Embedded circuit patterning feature selective electroless copper plating
JP6507969B2 (ja) * 2015-09-25 2019-05-08 コニカミノルタ株式会社 ガス検知方法及びガス検知装置
EP3374502B1 (de) 2015-11-13 2021-10-27 Avellino Lab USA, Inc. Verfahren zur behandlung von hornhautdystrophien
EP3258243B1 (de) * 2016-06-13 2019-05-08 WEISS UMWELTTECHNIK GmbH Sensoranordnung und verfahren zur bestimmung einer betauung
CN207832676U (zh) * 2017-11-27 2018-09-07 重庆科技学院 一种具有表面增强拉曼效应的传感器

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05142604A (ja) * 1991-11-18 1993-06-11 Matsushita Electric Ind Co Ltd 非線形光学材料およびその製造方法
JP4209471B2 (ja) * 1997-02-20 2009-01-14 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア プラズモン共鳴粒子、方法、および装置
US6344272B1 (en) * 1997-03-12 2002-02-05 Wm. Marsh Rice University Metal nanoshells
JPH111703A (ja) * 1997-06-06 1999-01-06 Hitachi Ltd 超微粒子の調製方法
JP3380744B2 (ja) 1998-05-19 2003-02-24 株式会社日立製作所 センサおよびこれを利用した測定装置
US6778316B2 (en) * 2001-10-24 2004-08-17 William Marsh Rice University Nanoparticle-based all-optical sensors
JP2003247936A (ja) * 2002-02-22 2003-09-05 Japan Science & Technology Corp 屈折率測定用センサ及びその製造方法
JP2005144569A (ja) 2003-11-12 2005-06-09 Hitachi Ltd 二次元配列構造体基板および該基板から剥離した微粒子
US8471217B2 (en) * 2006-05-01 2013-06-25 Fujirebio Inc. Fluorescent non-metallic particles encapsulated in a metallic coating

Also Published As

Publication number Publication date
US20090073447A1 (en) 2009-03-19
ES2321228T3 (es) 2009-06-03
EP1875208B1 (de) 2009-03-04
JP5278676B2 (ja) 2013-09-04
EP1715326A1 (de) 2006-10-25
JP2008538414A (ja) 2008-10-23
WO2006111414A1 (en) 2006-10-26
EP1875208A1 (de) 2008-01-09
US8288166B2 (en) 2012-10-16
ATE424555T1 (de) 2009-03-15

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