DE602006002171D1 - Differenzialmesssonde mit einem Masseklemmsystem für die Sondenspitzen - Google Patents

Differenzialmesssonde mit einem Masseklemmsystem für die Sondenspitzen

Info

Publication number
DE602006002171D1
DE602006002171D1 DE602006002171T DE602006002171T DE602006002171D1 DE 602006002171 D1 DE602006002171 D1 DE 602006002171D1 DE 602006002171 T DE602006002171 T DE 602006002171T DE 602006002171 T DE602006002171 T DE 602006002171T DE 602006002171 D1 DE602006002171 D1 DE 602006002171D1
Authority
DE
Germany
Prior art keywords
probe
clamping system
differential measuring
ground clamping
tips
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006002171T
Other languages
English (en)
Inventor
Kei-Wean C Yang
Mark W Nightingale
Paul G Chastain
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of DE602006002171D1 publication Critical patent/DE602006002171D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
DE602006002171T 2005-05-27 2006-05-23 Differenzialmesssonde mit einem Masseklemmsystem für die Sondenspitzen Active DE602006002171D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/139,315 US20060267605A1 (en) 2005-05-27 2005-05-27 Differential measurement probe having a ground clip system for the probing tips

Publications (1)

Publication Number Publication Date
DE602006002171D1 true DE602006002171D1 (de) 2008-09-25

Family

ID=36939238

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006002171T Active DE602006002171D1 (de) 2005-05-27 2006-05-23 Differenzialmesssonde mit einem Masseklemmsystem für die Sondenspitzen

Country Status (6)

Country Link
US (4) US20060267605A1 (de)
EP (1) EP1726965B1 (de)
JP (1) JP4884842B2 (de)
CN (1) CN1869712B (de)
DE (1) DE602006002171D1 (de)
TW (1) TWI418795B (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070063714A1 (en) * 2005-09-21 2007-03-22 Mctigue Michael T High bandwidth probe
US9140724B1 (en) * 2006-01-06 2015-09-22 Lecroy Corporation Compensating resistance probing tip optimized adapters for use with specific electrical test probes
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
US20080186036A1 (en) * 2007-02-06 2008-08-07 Brian Shumaker High Speed Electrical Probe
US7728609B2 (en) * 2007-05-25 2010-06-01 Celadon Systems, Inc. Replaceable probe apparatus for probing semiconductor wafer
NZ561300A (en) * 2007-09-07 2010-01-29 Lincoln Ventures Ltd Time domain reflectomertry system and method of use
KR101188288B1 (ko) * 2007-09-18 2012-10-05 삼성전자주식회사 반도체 소자 검사 장치
CN101907644B (zh) * 2009-06-04 2013-11-06 鸿富锦精密工业（深圳）有限公司 电子探棒控制系统
TWI468696B (zh) * 2009-08-12 2015-01-11 Hon Hai Prec Ind Co Ltd 微調裝置
CN102667499B (zh) 2009-12-02 2015-11-25 惠普发展公司，有限责任合伙企业 信号感测装置和电路板
TWI413790B (zh) * 2010-02-24 2013-11-01 Tatung Co 量測校正系統及其方法
US20120182034A1 (en) * 2011-01-17 2012-07-19 3M Innovative Properties Company Contact assembly
US8645096B2 (en) * 2011-02-09 2014-02-04 General Electric Company Deflection measuring system and method
US8860449B2 (en) * 2011-06-10 2014-10-14 Tektronix, Inc. Dual probing tip system
DE102012205352B4 (de) * 2012-02-24 2022-12-08 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Adapter für einen Tastkopf zur Messung eines differenziellen Signals
TWI456233B (zh) * 2012-11-02 2014-10-11 Electronics Testing Ct Taiwan 近場電磁探棒
JP6214919B2 (ja) * 2013-05-17 2017-10-18 日本メクトロン株式会社 同軸プローブ保持機構および電気特性検査装置
JP5912156B2 (ja) * 2014-07-28 2016-04-27 株式会社エヌ・ピー・シー 発電出力測定用治具
TWI569017B (zh) * 2014-11-14 2017-02-01 Nippon Mektron Kk Coaxial probe holding mechanism and electrical characteristics check device
US10502762B2 (en) * 2015-02-02 2019-12-10 Keysight Technologies, Inc. Differential contact probe including ground mechanism and associated methods
US10101363B2 (en) * 2015-04-12 2018-10-16 Keysight Technologies, Inc. Coaxial connector locking bracket
US10012686B2 (en) * 2016-08-15 2018-07-03 Tektronix, Inc. High frequency time domain reflectometry probing system
CN106771409A (zh) * 2017-02-16 2017-05-31 苏州微缜电子科技有限公司 一种高频测试插座
TWI787647B (zh) * 2019-10-04 2022-12-21 旺矽科技股份有限公司 用於電路板阻抗測試之可調式探針裝置
CN112611916A (zh) 2019-10-04 2021-04-06 旺矽科技股份有限公司 用于电路板阻抗测试的可调式探针装置
US20210263073A1 (en) * 2020-02-26 2021-08-26 Raytheon Company Test Probe Adapter
EP4187260A1 (de) * 2021-11-26 2023-05-31 Sensepeek AB Erdungsabstimmschalter

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4739259A (en) * 1986-08-01 1988-04-19 Tektronix, Inc. Telescoping pin probe
US4822956A (en) * 1986-08-11 1989-04-18 American Telephone And Telegraph Company Coaxial cable
US4923407A (en) * 1989-10-02 1990-05-08 Tektronix, Inc. Adjustable low inductance probe
US5196789A (en) * 1991-01-28 1993-03-23 Golden Joseph R Coaxial spring contact probe
JPH06258346A (ja) * 1993-03-05 1994-09-16 Sumitomo Electric Ind Ltd 同軸プローブ及びプローブを用いた高周波測定方法
WO1998011445A1 (en) * 1996-09-13 1998-03-19 International Business Machines Corporation Probe structure having a plurality of discrete insulated probe tips
US6278596B1 (en) * 1999-06-17 2001-08-21 Tektronix, Inc. Active ground fault disconnect
US6498506B1 (en) * 2000-07-26 2002-12-24 Gore Enterprise Holdings, Inc. Spring probe assemblies
US6665627B2 (en) * 2001-03-30 2003-12-16 Intel Corporation Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment
TW521148B (en) * 2001-09-06 2003-02-21 Mitac Int Corp Testing point setup method of high-frequency differential signal
CN100340034C (zh) * 2001-10-17 2007-09-26 莫莱克斯公司 带有改进的接地装置的连接器
US6828768B2 (en) * 2002-04-16 2004-12-07 Agilent Technologies, Inc. Systems and methods for wideband differential probing of variably spaced probe points
KR101035184B1 (ko) * 2002-06-10 2011-05-17 가부시키가이샤 어드밴티스트 반도체 시험 장치
US6734689B1 (en) * 2002-12-05 2004-05-11 Tektronix, Inc. Measurement probe providing signal control for an EOS/ESD protection module
US7262614B1 (en) * 2005-02-10 2007-08-28 Lecroy Corporation Planar on edge probing tip with flex
US7102370B2 (en) * 2004-04-22 2006-09-05 Agilent Technologies, Inc. Compliant micro-browser for a hand held probe
US6949919B1 (en) * 2004-04-28 2005-09-27 Agilent Technologies, Inc. Unbreakable micro-browser

Also Published As

Publication number Publication date
US7586318B2 (en) 2009-09-08
CN1869712B (zh) 2012-03-21
US20060267605A1 (en) 2006-11-30
US7560944B2 (en) 2009-07-14
US7436191B2 (en) 2008-10-14
EP1726965A1 (de) 2006-11-29
TW200706883A (en) 2007-02-16
US20080309356A1 (en) 2008-12-18
JP4884842B2 (ja) 2012-02-29
US20070159195A1 (en) 2007-07-12
US20080309357A1 (en) 2008-12-18
EP1726965B1 (de) 2008-08-13
TWI418795B (zh) 2013-12-11
JP2006329993A (ja) 2006-12-07
CN1869712A (zh) 2006-11-29

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Legal Events

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