TWI456233B - 近場電磁探棒 - Google Patents

近場電磁探棒 Download PDF

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Publication number
TWI456233B
TWI456233B TW101140709A TW101140709A TWI456233B TW I456233 B TWI456233 B TW I456233B TW 101140709 A TW101140709 A TW 101140709A TW 101140709 A TW101140709 A TW 101140709A TW I456233 B TWI456233 B TW I456233B
Authority
TW
Taiwan
Prior art keywords
near field
conductive line
field electromagnetic
electromagnetic probe
annular structure
Prior art date
Application number
TW101140709A
Other languages
English (en)
Other versions
TW201418742A (zh
Inventor
Herman Li
Will Yauo
Kevin Lee
Original Assignee
Electronics Testing Ct Taiwan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electronics Testing Ct Taiwan filed Critical Electronics Testing Ct Taiwan
Priority to TW101140709A priority Critical patent/TWI456233B/zh
Priority to CN2012104698757A priority patent/CN102981028A/zh
Publication of TW201418742A publication Critical patent/TW201418742A/zh
Application granted granted Critical
Publication of TWI456233B publication Critical patent/TWI456233B/zh

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  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Measuring Leads Or Probes (AREA)

Claims (9)

  1. 一種近場電磁探棒，用以感測一電子產品，該近場電磁探棒至少包括：一電感性元件組，包含有：一環形結構體，於中央位置上形成一中空環孔；以及一線圈，具有一第一端點及一第二端點，該線圈穿越該中空環孔，以纏繞於該環形結構體上；一同軸電纜，具有一第一導電線及一第二導電線，且該第一導電線電性連接該第一端點，該第二導電線電性連接該第二端點，以構成電性迴路；以及一阻抗匹配器，電性連接該第一端點、該第二端點、該第一導電線及該第二導電線，且該第一導電線及該第二導電線可電性連接一檢測儀器。
  2. 如請求項1所述之近場電磁探棒，更包括：一絕緣膜，以包覆該環形結構體。
  3. 如請求項2所述之近場電磁探棒，其中該環形結構體、該線圈及該絕緣膜可由一非金屬保護層包覆。
  4. 如請求項1所述之近場電磁探棒，其中該環形結構體、該線圈及該同軸電纜可由一鉚釘或一螺栓連接。
  5. 如請求項4所述之近場電磁探棒，其中該環形結構體、該線圈、該同軸電纜及該鉚釘或該螺栓可由一非金屬保護層包覆。
  6. 如請求項1所述之近場電磁探棒，其中該環形結構體之形狀係為圓形、正方形或矩形。
  7. 如請求項1所述之近場電磁探棒，其中該環形結構體係為磁性元件或非 磁性元件。
  8. 如請求項1所述之近場電磁探棒，其中該第一導電線可為導電銅線，該第二導電線可為網狀導電線。
  9. 如請求項1所述之近場電磁探棒，其中該第一導電線及該第二導電線可電性連接一檢測儀器。
TW101140709A 2012-11-02 2012-11-02 近場電磁探棒 TWI456233B (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW101140709A TWI456233B (zh) 2012-11-02 2012-11-02 近場電磁探棒
CN2012104698757A CN102981028A (zh) 2012-11-02 2012-11-19 近场电磁探针

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101140709A TWI456233B (zh) 2012-11-02 2012-11-02 近場電磁探棒

Publications (2)

Publication Number Publication Date
TW201418742A TW201418742A (zh) 2014-05-16
TWI456233B true TWI456233B (zh) 2014-10-11

Family

ID=47855237

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101140709A TWI456233B (zh) 2012-11-02 2012-11-02 近場電磁探棒

Country Status (2)

Country Link
CN (1) CN102981028A (zh)
TW (1) TWI456233B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104678132A (zh) * 2013-11-27 2015-06-03 中国航空工业集团公司雷华电子技术研究所 Ka频段基板集成磁耦合近场探针
US11664206B2 (en) * 2017-11-08 2023-05-30 Taiwan Semiconductor Manufacturing Co., Ltd. Arcing protection method and processing tool
CN110850126B (zh) * 2018-08-03 2022-12-27 均豪精密工业股份有限公司 检测系统、探针装置及面板检测方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200706883A (en) * 2005-05-27 2007-02-16 Tektronix Inc Differential measurement probe having a ground clip system for the probing tips
CN102498407A (zh) * 2009-09-14 2012-06-13 大电株式会社 电磁场传感器以及接收器
TWM434996U (en) * 2012-04-17 2012-08-01 Epc Solutions Taiwan Inc Device for detecting RF electronic tag with micro bend escaped wave

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3975918B2 (ja) * 2002-09-27 2007-09-12 ソニー株式会社 アンテナ装置
CN100381829C (zh) * 2005-06-22 2008-04-16 湖南科技大学 车辆内部电磁兼容性诊断测试的电磁探测器
CN2852138Y (zh) * 2005-06-22 2006-12-27 湖南科技大学 用于电磁兼容性诊断测试的磁场探头
JP5017827B2 (ja) * 2005-09-20 2012-09-05 株式会社日立製作所 電磁波発生源探査方法及びそれに用いる電流プローブ
JP5151032B2 (ja) * 2006-01-13 2013-02-27 株式会社日立製作所 磁界プローブ装置及び磁界プローブ素子
JP2009139208A (ja) * 2007-12-06 2009-06-25 Hitachi Ltd 導電性筐体の電磁特性評価方法
CN201156082Y (zh) * 2008-02-22 2008-11-26 成都必控科技股份有限公司 一种环形磁场探头
JP2009296107A (ja) * 2008-06-03 2009-12-17 Sumida Corporation 受信アンテナコイル
CN101944649A (zh) * 2010-08-09 2011-01-12 洪国智 天线模块

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200706883A (en) * 2005-05-27 2007-02-16 Tektronix Inc Differential measurement probe having a ground clip system for the probing tips
CN102498407A (zh) * 2009-09-14 2012-06-13 大电株式会社 电磁场传感器以及接收器
TWM434996U (en) * 2012-04-17 2012-08-01 Epc Solutions Taiwan Inc Device for detecting RF electronic tag with micro bend escaped wave

Also Published As

Publication number Publication date
CN102981028A (zh) 2013-03-20
TW201418742A (zh) 2014-05-16

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