DE602006000249D1 - Gerät und Verfahren zur Bestimung der Positionsgenauigkeit - Google Patents
Gerät und Verfahren zur Bestimung der PositionsgenauigkeitInfo
- Publication number
- DE602006000249D1 DE602006000249D1 DE602006000249T DE602006000249T DE602006000249D1 DE 602006000249 D1 DE602006000249 D1 DE 602006000249D1 DE 602006000249 T DE602006000249 T DE 602006000249T DE 602006000249 T DE602006000249 T DE 602006000249T DE 602006000249 D1 DE602006000249 D1 DE 602006000249D1
- Authority
- DE
- Germany
- Prior art keywords
- determining
- position accuracy
- accuracy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/10—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B1/00—Details of electric heating devices
- H05B1/02—Automatic switching arrangements specially adapted to apparatus ; Control of heating devices
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/68—Heating arrangements specially adapted for cooking plates or analogous hot-plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Surface Heating Bodies (AREA)
- Resistance Heating (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005077929 | 2005-03-17 | ||
JP2005077929A JP4728021B2 (ja) | 2005-03-17 | 2005-03-17 | 均熱性評価方法及び均熱性評価装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602006000249D1 true DE602006000249D1 (de) | 2008-01-03 |
DE602006000249T2 DE602006000249T2 (de) | 2008-10-02 |
Family
ID=36645689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602006000249T Active DE602006000249T2 (de) | 2005-03-17 | 2006-03-17 | Gerät und Verfahren zur Bestimung der Positionsgenauigkeit |
Country Status (6)
Country | Link |
---|---|
US (1) | US7948516B2 (de) |
EP (1) | EP1703777B1 (de) |
JP (1) | JP4728021B2 (de) |
KR (1) | KR100733444B1 (de) |
DE (1) | DE602006000249T2 (de) |
TW (1) | TWI315161B (de) |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6267404A (ja) * | 1985-09-20 | 1987-03-27 | Seiko Epson Corp | 光学式真円度測定装置 |
JPH0510718A (ja) * | 1991-07-05 | 1993-01-19 | Nippon Densan Corp | 同心度計測装置 |
JP2001091244A (ja) * | 1999-09-24 | 2001-04-06 | Tokyo Seimitsu Co Ltd | 真円度測定方法および装置 |
US6967312B2 (en) * | 2000-07-19 | 2005-11-22 | Ibiden Co., Ltd. | Semiconductor manufacturing/testing ceramic heater, production method for the ceramic heater and production system for the ceramic heater |
JP2002054917A (ja) * | 2000-08-08 | 2002-02-20 | M H Center:Kk | 同心度測定装置における同心度測定方法 |
KR100431655B1 (ko) * | 2001-08-28 | 2004-05-17 | 삼성전자주식회사 | 웨이퍼를 가열하기 위한 히터 어셈블리 |
JP3754340B2 (ja) * | 2001-10-15 | 2006-03-08 | 株式会社デンソーウェーブ | 位置検出装置 |
JP3833974B2 (ja) * | 2002-08-21 | 2006-10-18 | 日本碍子株式会社 | 加熱装置の製造方法 |
DE10307246A1 (de) * | 2003-02-17 | 2004-08-26 | E.G.O. Elektrogerätebau GmbH | Heizungseinrichtung mit zwei Bereichen |
JP2004328096A (ja) * | 2003-04-22 | 2004-11-18 | Sony Corp | 画像処理装置および方法、記録媒体、並びにプログラム |
US7025893B2 (en) * | 2003-08-12 | 2006-04-11 | Thermo Stone Usa, Llc | Structure and method to compensate for thermal edge loss in thin film heaters |
-
2005
- 2005-03-17 JP JP2005077929A patent/JP4728021B2/ja active Active
-
2006
- 2006-03-10 KR KR1020060022555A patent/KR100733444B1/ko active IP Right Grant
- 2006-03-15 TW TW095108701A patent/TWI315161B/zh active
- 2006-03-15 US US11/375,812 patent/US7948516B2/en active Active
- 2006-03-17 EP EP06251440A patent/EP1703777B1/de not_active Ceased
- 2006-03-17 DE DE602006000249T patent/DE602006000249T2/de active Active
Also Published As
Publication number | Publication date |
---|---|
KR20060101260A (ko) | 2006-09-22 |
EP1703777B1 (de) | 2007-11-21 |
TW200644707A (en) | 2006-12-16 |
JP4728021B2 (ja) | 2011-07-20 |
DE602006000249T2 (de) | 2008-10-02 |
US20060207987A1 (en) | 2006-09-21 |
US7948516B2 (en) | 2011-05-24 |
JP2006258665A (ja) | 2006-09-28 |
KR100733444B1 (ko) | 2007-06-29 |
EP1703777A1 (de) | 2006-09-20 |
TWI315161B (en) | 2009-09-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8381 | Inventor (new situation) |
Inventor name: KIKU, TAIJI, MIZUHO-KU NAGOYA CITY AICHI-KEN 4, JP Inventor name: UNNO, YUTAKA, MIZUHO-KU NAGOYA CITY AICHI-KEN , JP |
|
8364 | No opposition during term of opposition |