DE602005019297D1 - Echtzeitfähiges hochleistungs-röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis - Google Patents

Echtzeitfähiges hochleistungs-röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis

Info

Publication number
DE602005019297D1
DE602005019297D1 DE602005019297T DE602005019297T DE602005019297D1 DE 602005019297 D1 DE602005019297 D1 DE 602005019297D1 DE 602005019297 T DE602005019297 T DE 602005019297T DE 602005019297 T DE602005019297 T DE 602005019297T DE 602005019297 D1 DE602005019297 D1 DE 602005019297D1
Authority
DE
Germany
Prior art keywords
ray imaging
cameras
real
performance
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005019297T
Other languages
English (en)
Inventor
Konstantinos Spartiotis
Tuomas Pantsar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Direct Conversion Ltd Oy
Original Assignee
Ajat Ltd Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34978705&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE602005019297(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Ajat Ltd Oy filed Critical Ajat Ltd Oy
Publication of DE602005019297D1 publication Critical patent/DE602005019297D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14634—Assemblies, i.e. Hybrid structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264—Inorganic materials
    • H01L31/0296—Inorganic materials including, apart from doping material or other impurities, only AIIBVI compounds, e.g. CdS, ZnS, HgCdTe
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays
    • H04N5/321—Transforming X-rays with video transmission of fluoroscopic images
    • H04N5/325—Image enhancement, e.g. by subtraction techniques using polyenergetic X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE602005019297T 2004-07-06 2005-07-01 Echtzeitfähiges hochleistungs-röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis Active DE602005019297D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US58574204P 2004-07-06 2004-07-06
US11/017,629 US20060011853A1 (en) 2004-07-06 2004-12-20 High energy, real time capable, direct radiation conversion X-ray imaging system for Cd-Te and Cd-Zn-Te based cameras
PCT/IB2005/001896 WO2006003487A1 (en) 2004-07-06 2005-07-01 High energy, real time capable, direct radiation conversion x-ray imaging system for cd-te and cd-zn-te based cameras

Publications (1)

Publication Number Publication Date
DE602005019297D1 true DE602005019297D1 (de) 2010-03-25

Family

ID=34978705

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005019297T Active DE602005019297D1 (de) 2004-07-06 2005-07-01 Echtzeitfähiges hochleistungs-röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis

Country Status (6)

Country Link
US (3) US20060011853A1 (de)
EP (2) EP1763685B1 (de)
KR (3) KR100987404B1 (de)
AT (1) ATE457467T1 (de)
DE (1) DE602005019297D1 (de)
WO (1) WO2006003487A1 (de)

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Also Published As

Publication number Publication date
KR20090006228A (ko) 2009-01-14
US20060011853A1 (en) 2006-01-19
EP2192422B1 (de) 2013-03-06
EP2192422A1 (de) 2010-06-02
KR100987404B1 (ko) 2010-10-12
EP1763685A1 (de) 2007-03-21
KR20090006227A (ko) 2009-01-14
WO2006003487B1 (en) 2006-04-06
US20060071174A1 (en) 2006-04-06
KR100989666B1 (ko) 2010-10-28
WO2006003487A1 (en) 2006-01-12
US8530850B2 (en) 2013-09-10
EP1763685B1 (de) 2010-02-10
KR100962002B1 (ko) 2010-06-08
US20130334433A1 (en) 2013-12-19
ATE457467T1 (de) 2010-02-15
KR20070036780A (ko) 2007-04-03

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