ATE457467T1 - Echtzeitfähiges hochleistungs- röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis - Google Patents

Echtzeitfähiges hochleistungs- röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis

Info

Publication number
ATE457467T1
ATE457467T1 AT05780149T AT05780149T ATE457467T1 AT E457467 T1 ATE457467 T1 AT E457467T1 AT 05780149 T AT05780149 T AT 05780149T AT 05780149 T AT05780149 T AT 05780149T AT E457467 T1 ATE457467 T1 AT E457467T1
Authority
AT
Austria
Prior art keywords
ray imaging
real
performance
imaging system
time high
Prior art date
Application number
AT05780149T
Other languages
English (en)
Inventor
Konstantinos Spartiotis
Tuomas Pantsar
Original Assignee
Oy Ajat Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34978705&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE457467(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Oy Ajat Ltd filed Critical Oy Ajat Ltd
Application granted granted Critical
Publication of ATE457467T1 publication Critical patent/ATE457467T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14634—Assemblies, i.e. Hybrid structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264—Inorganic materials
    • H01L31/0296—Inorganic materials including, apart from doping material or other impurities, only AIIBVI compounds, e.g. CdS, ZnS, HgCdTe
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays
    • H04N5/321—Transforming X-rays with video transmission of fluoroscopic images
    • H04N5/325—Image enhancement, e.g. by subtraction techniques using polyenergetic X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT05780149T 2004-07-06 2005-07-01 Echtzeitfähiges hochleistungs- röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis ATE457467T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US58574204P 2004-07-06 2004-07-06
US11/017,629 US20060011853A1 (en) 2004-07-06 2004-12-20 High energy, real time capable, direct radiation conversion X-ray imaging system for Cd-Te and Cd-Zn-Te based cameras
PCT/IB2005/001896 WO2006003487A1 (en) 2004-07-06 2005-07-01 High energy, real time capable, direct radiation conversion x-ray imaging system for cd-te and cd-zn-te based cameras

Publications (1)

Publication Number Publication Date
ATE457467T1 true ATE457467T1 (de) 2010-02-15

Family

ID=34978705

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05780149T ATE457467T1 (de) 2004-07-06 2005-07-01 Echtzeitfähiges hochleistungs- röntgenbildgebungssystem mit direkter strahlungsumwandlung für kameras auf cd-te- und cd-zn-te-basis

Country Status (6)

Country Link
US (3) US20060011853A1 (de)
EP (2) EP1763685B1 (de)
KR (3) KR100987404B1 (de)
AT (1) ATE457467T1 (de)
DE (1) DE602005019297D1 (de)
WO (1) WO2006003487A1 (de)

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4533010B2 (ja) * 2003-11-20 2010-08-25 キヤノン株式会社 放射線撮像装置、放射線撮像方法及び放射線撮像システム
JP4264381B2 (ja) * 2004-04-30 2009-05-13 株式会社モリタ製作所 固体撮像素子の２次元画像処理方法及び医療用デジタルｘ線撮影装置
ES2253997B1 (es) * 2004-07-29 2007-07-16 Udiat Centre Diagnostic, S.A. Sistema digital para realizar biopsia estereotaxica.
US7138636B2 (en) * 2005-03-17 2006-11-21 General Electric Co. Systems, methods and apparatus to calibrate a solid state X-ray detector
DE102005031903A1 (de) * 2005-07-07 2007-01-11 Siemens Ag Verfahren zur nichtlinearen Bildbearbeitung und Flachdetektor mit einer Korrektureinheit
US7456409B2 (en) * 2005-07-28 2008-11-25 Carestream Health, Inc. Low noise image data capture for digital radiography
WO2008008663A2 (en) * 2006-07-10 2008-01-17 Koninklijke Philips Electronics, N.V. Energy spectrum reconstruction
US7615754B2 (en) * 2007-03-08 2009-11-10 Fairchild Imaging, Inc. Compact CMOS-based x-ray detector adapted for dental applications
EP2149284B1 (de) * 2007-05-31 2014-08-13 General Electric Company Verfahren und systeme zur ermöglichung der korrektur von verstärkungsschwankungen in einem bild
US7760123B2 (en) 2007-10-08 2010-07-20 General Electric Company Data acquisition system for photon counting and energy discriminating detectors
US8159286B2 (en) * 2007-10-08 2012-04-17 General Electric Company System and method for time-to-voltage conversion with lock-out logic
US8044681B2 (en) * 2007-10-08 2011-10-25 General Electric Company Apparatus and method for channel-specific configuration in a readout ASIC
US8406860B2 (en) 2008-01-25 2013-03-26 Novadaq Technologies Inc. Method for evaluating blush in myocardial tissue
WO2009101772A1 (ja) * 2008-02-12 2009-08-20 Ishida Co., Ltd. Ｘ線検査装置
US7590220B1 (en) * 2008-03-10 2009-09-15 General Electric Company X-ray inspection and detection system and method
KR100977806B1 (ko) 2008-05-14 2010-08-25 (주)제노레이 Ｘ선 영상처리장치 및 이를 이용한 영상처리방법
US8432413B2 (en) * 2008-11-17 2013-04-30 Xrfiles, Inc. System and method for the display of extended bit depth high resolution images
JP5136478B2 (ja) * 2009-03-17 2013-02-06 株式会社島津製作所 放射線撮影装置
EP2424436B1 (de) 2009-04-29 2020-04-08 XCounter AB Computerunterstütztes tomographie-scansystem
EP2517048B1 (de) 2009-12-21 2018-02-21 Koninklijke Philips N.V. Strahlungsdetektoranordnung mit teststromkreis
DE11173533T8 (de) 2010-07-14 2013-04-25 Xcounter Ab Computertomografie-Abtastsystem und Verfahren
FR2965441B1 (fr) * 2010-09-27 2013-04-19 Commissariat Energie Atomique Procédé de détermination et de correction de la stabilité de réponse d'un détecteur matriciel a semi-conducteur
DE102011003454A1 (de) * 2011-02-01 2012-08-02 Siemens Aktiengesellschaft Strahlungsdirektkonverter, Strahlungsdetektor, medizintechnisches Gerät und Verfahren zum Erzeugen eines Strahlungsdirektkonverters
CN102670232B (zh) * 2011-03-11 2015-01-28 株式会社东芝 正电子发射计算机断层摄影装置、以及通过它执行的方法
US8294110B2 (en) * 2011-03-11 2012-10-23 Kabushiki Kaisha Toshiba Method for improved correction of SiPM non-linearity in multiplexed radiation detectors
DE102011076781B4 (de) * 2011-05-31 2018-05-03 Siemens Healthcare Gmbh Verfahren zur Korrektur einer Zählratendrift bei einem quantenzählenden Detektor, Röntgen-System mit quantenzählendem Detektor und Schaltungsanordnung für einen quantenzählenden Detektor
WO2012174508A1 (en) * 2011-06-16 2012-12-20 Suni Medical Imaging, Inc. Digital x-ray image sensor device
JP5921180B2 (ja) * 2011-12-15 2016-05-24 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
US10278585B2 (en) 2012-06-21 2019-05-07 Novadaq Technologies ULC Quantification and analysis of angiography and perfusion
JP6310550B2 (ja) 2013-06-14 2018-04-11 ノバダック テクノロジーズ インコーポレイテッド 蛍光媒介フォトプレチスモグラフィを用いた組織の絶対血流の定量化
US10426361B2 (en) 2013-06-14 2019-10-01 Novadaq Technologies ULC Quantification of absolute blood flow in tissue using fluorescence-mediated photoplethysmography
US9615037B2 (en) * 2013-11-08 2017-04-04 Drs Network & Imaging Systems, Llc Method and system for output of dual video stream via a single parallel digital video interface
DE102014204042A1 (de) * 2014-03-05 2015-09-10 Siemens Aktiengesellschaft Verfahren zur Ansteuerung eines Röntgendetektors und zugehörige Steuereinheit
US9526468B2 (en) 2014-09-09 2016-12-27 General Electric Company Multiple frame acquisition for exposure control in X-ray medical imagers
KR101955134B1 (ko) * 2014-10-09 2019-03-06 노바다크 테크놀러지즈 유엘씨 형광-조정 광전용적맥파 측정기를 사용한 조직 내의 절대적인 혈류의 정량화
US10405813B2 (en) 2015-02-04 2019-09-10 Dental Imaging Technologies Corporation Panoramic imaging using multi-spectral X-ray source
GB201509580D0 (en) * 2015-06-03 2015-07-15 Rolls Royce Plc Manufacture of component with cavity
DE102015213911B4 (de) * 2015-07-23 2019-03-07 Siemens Healthcare Gmbh Verfahren zum Erzeugen eines Röntgenbildes und Datenverarbeitungseinrichtung zum Ausführen des Verfahrens
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
AU2016325592B2 (en) * 2015-09-23 2019-06-27 Novadaq Technologies Inc. Methods and systems for assessing healing of tissue
KR101656220B1 (ko) * 2015-11-04 2016-09-09 연세대학교 원주산학협력단 상보형금속산화막반도체 엑스-선 영상 검출기를 위한 이득 교정 방법 및 장치
US10646128B2 (en) 2016-02-16 2020-05-12 Novadaq Technologies ULC Facilitating assessment of blood flow and tissue perfusion using fluorescence-mediated photoplethysmography
US10641912B1 (en) * 2016-06-15 2020-05-05 Triad National Security, Llc “4H” X-ray camera
JP2018014555A (ja) * 2016-07-19 2018-01-25 東芝電子管デバイス株式会社 放射線検出器、および放射線画像撮影装置
CA3049922A1 (en) 2017-02-10 2018-08-16 Novadaq Technologies ULC Open-field handheld fluorescence imaging systems and methods
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
CN107569249A (zh) * 2017-08-25 2018-01-12 沈阳东软医疗系统有限公司 一种晶体能量校正方法和装置
FI20187059A1 (en) 2018-04-25 2019-10-26 Athlos Oy An ultra-fast scanning X-ray machine
UA125070C2 (uk) * 2018-12-28 2022-01-05 Сергій Іванович Мірошниченко Спосіб комп'ютерної томографії
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
KR102182848B1 (ko) * 2020-07-02 2020-11-25 한전케이피에스 주식회사 방사성폐기물의 방사능을 분석하기 위한 방사능 분석 시스템 및 방사능 분석 방법

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4135247A (en) * 1977-08-15 1979-01-16 Siemens Aktiengesellschaft Tomography signal processing system
FR2651331B1 (fr) * 1989-08-22 1991-10-25 Thomson Tubes Electroniques Procede de correction des signaux d'un detecteur lineaire de radiations et dispositif de correction mettant en óoeuvre ce procede.
CA2095366C (en) 1992-05-21 1999-09-14 Timothy C. Collins Hybridized semiconductor pixel detector arrays for use in digital radiography
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
EP0854639B1 (de) * 1994-06-01 2005-01-26 Simage Oy Vorrichtung, System und Methode zur Aufnahme von Bildern
GB2314227B (en) 1996-06-14 1998-12-23 Simage Oy Calibration method and system for imaging devices
JPH1098651A (ja) 1996-09-25 1998-04-14 Toshiba Corp 固体撮像装置
US5920070A (en) * 1996-11-27 1999-07-06 General Electric Company Solid state area x-ray detector with adjustable bias
EP0888686B1 (de) * 1996-12-23 2007-09-05 Koninklijke Philips Electronics N.V. Röntgenstrahl-Untersuchungsvorrichtung mit Röntgenstrahl-Bildsensormatrix und Korrektureinheit
JPH11307756A (ja) * 1998-02-20 1999-11-05 Canon Inc 光電変換装置および放射線読取装置
JPH11311673A (ja) * 1998-04-28 1999-11-09 Shimadzu Corp 放射線撮像装置
US6278765B1 (en) * 1999-12-30 2001-08-21 Leonard Berliner Process for producing diagnostic quality x-ray images from a fluoroscopic sequence
JP2003066149A (ja) 2000-08-14 2003-03-05 Toshiba Corp 放射線検出器、放射線検出システム、ｘ線ｃｔ装置
US6417504B1 (en) * 2000-09-29 2002-07-09 Innovative Technology Licensing, Llc Compact ultra-low noise high-bandwidth pixel amplifier for single-photon readout of photodetectors
DE10114303A1 (de) * 2001-03-23 2002-09-26 Philips Corp Intellectual Pty Verfahren zur Bestimmung der von einem Strahlungssensor absorbierten Strahlungsmenge
US6818899B2 (en) * 2001-06-07 2004-11-16 Canon Kabushiki Kaisha Radiographic image pickup apparatus and method of driving the apparatus
US6510195B1 (en) 2001-07-18 2003-01-21 Koninklijke Philips Electronics, N.V. Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same
JP2003156565A (ja) 2001-11-20 2003-05-30 Canon Inc 光電変換装置を用いた撮影装置
US7189971B2 (en) * 2002-02-15 2007-03-13 Oy Ajat Ltd Radiation imaging device and system
US6933505B2 (en) * 2002-03-13 2005-08-23 Oy Ajat Ltd Low temperature, bump-bonded radiation imaging device
US7170062B2 (en) * 2002-03-29 2007-01-30 Oy Ajat Ltd. Conductive adhesive bonded semiconductor substrates for radiation imaging devices
IL151634A0 (en) * 2002-09-05 2003-04-10 Real Time Radiography Ltd Direct detection of high energy single photons
US6890098B2 (en) * 2002-11-22 2005-05-10 Agilent Technologies, Inc. Method for calibrating the intensity profile for a movable x-ray source
US20040120459A1 (en) * 2002-12-18 2004-06-24 Crowley John P. Industrial machine vision system having a direct conversion X-ray detector

Also Published As

Publication number Publication date
KR20090006228A (ko) 2009-01-14
US20060011853A1 (en) 2006-01-19
EP2192422B1 (de) 2013-03-06
EP2192422A1 (de) 2010-06-02
KR100987404B1 (ko) 2010-10-12
EP1763685A1 (de) 2007-03-21
KR20090006227A (ko) 2009-01-14
WO2006003487B1 (en) 2006-04-06
US20060071174A1 (en) 2006-04-06
KR100989666B1 (ko) 2010-10-28
WO2006003487A1 (en) 2006-01-12
US8530850B2 (en) 2013-09-10
EP1763685B1 (de) 2010-02-10
KR100962002B1 (ko) 2010-06-08
US20130334433A1 (en) 2013-12-19
KR20070036780A (ko) 2007-04-03
DE602005019297D1 (de) 2010-03-25

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