DE602005011067D1 - Ultraviolettdetektionssensor und Verfahren zu dessen Herstellung - Google Patents
Ultraviolettdetektionssensor und Verfahren zu dessen HerstellungInfo
- Publication number
- DE602005011067D1 DE602005011067D1 DE200560011067 DE602005011067T DE602005011067D1 DE 602005011067 D1 DE602005011067 D1 DE 602005011067D1 DE 200560011067 DE200560011067 DE 200560011067 DE 602005011067 T DE602005011067 T DE 602005011067T DE 602005011067 D1 DE602005011067 D1 DE 602005011067D1
- Authority
- DE
- Germany
- Prior art keywords
- region
- diamond layer
- sub
- production
- detection sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 title abstract 2
- 238000000825 ultraviolet detection Methods 0.000 title 1
- 229910003460 diamond Inorganic materials 0.000 abstract 6
- 239000010432 diamond Substances 0.000 abstract 6
- 239000000758 substrate Substances 0.000 abstract 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/429—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to measurement of ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/028—Inorganic materials including, apart from doping material or other impurities, only elements of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/09—Devices sensitive to infrared, visible or ultraviolet radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/108—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the Schottky type
- H01L31/1085—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the Schottky type the devices being of the Metal-Semiconductor-Metal [MSM] Schottky barrier type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J2001/0276—Protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1203—Rectifying Diode
- H01L2924/12032—Schottky diode
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Inorganic Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Light Receiving Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Fire-Detection Mechanisms (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004039083A JP4233467B2 (ja) | 2004-02-16 | 2004-02-16 | 紫外線センサ及びその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602005011067D1 true DE602005011067D1 (de) | 2009-01-02 |
Family
ID=34836336
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE200560011067 Active DE602005011067D1 (de) | 2004-02-16 | 2005-02-16 | Ultraviolettdetektionssensor und Verfahren zu dessen Herstellung |
Country Status (8)
Country | Link |
---|---|
US (1) | US7193241B2 (de) |
EP (1) | EP1583156B1 (de) |
JP (1) | JP4233467B2 (de) |
KR (1) | KR100626775B1 (de) |
CN (1) | CN100433369C (de) |
AT (1) | ATE414993T1 (de) |
DE (1) | DE602005011067D1 (de) |
TW (1) | TWI263777B (de) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006019649A (ja) * | 2004-07-05 | 2006-01-19 | Kobe Steel Ltd | ダイヤモンドセンサ及びその製造方法 |
JP5019305B2 (ja) * | 2005-08-29 | 2012-09-05 | 独立行政法人物質・材料研究機構 | ダイヤモンド紫外線センサー |
JP4931475B2 (ja) * | 2006-05-11 | 2012-05-16 | 株式会社神戸製鋼所 | 紫外線検出素子及び検出方法 |
US8395318B2 (en) * | 2007-02-14 | 2013-03-12 | Ritedia Corporation | Diamond insulated circuits and associated methods |
KR100926533B1 (ko) * | 2007-08-24 | 2009-11-12 | (주)실리콘화일 | 자외선의 강도를 측정할 수 있는 이미지센서 |
JP4930499B2 (ja) * | 2008-03-31 | 2012-05-16 | ウシオ電機株式会社 | 光センサ |
TWI368730B (en) | 2008-05-30 | 2012-07-21 | Au Optronics Corp | Method for using display panel to detect intensity of ultraviolet rays and display device using the same |
US8936367B2 (en) * | 2008-06-17 | 2015-01-20 | The Invention Science Fund I, Llc | Systems and methods associated with projecting in response to conformation |
US8262236B2 (en) * | 2008-06-17 | 2012-09-11 | The Invention Science Fund I, Llc | Systems and methods for transmitting information associated with change of a projection surface |
US20090313153A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware. | Systems associated with projection system billing |
US8641203B2 (en) * | 2008-06-17 | 2014-02-04 | The Invention Science Fund I, Llc | Methods and systems for receiving and transmitting signals between server and projector apparatuses |
US8608321B2 (en) * | 2008-06-17 | 2013-12-17 | The Invention Science Fund I, Llc | Systems and methods for projecting in response to conformation |
US20090313151A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Methods associated with projection system billing |
US20090309826A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Systems and devices |
US20100066689A1 (en) * | 2008-06-17 | 2010-03-18 | Jung Edward K Y | Devices related to projection input surfaces |
US8308304B2 (en) * | 2008-06-17 | 2012-11-13 | The Invention Science Fund I, Llc | Systems associated with receiving and transmitting information related to projection |
US20090310039A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Methods and systems for user parameter responsive projection |
US20090310098A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Methods and systems for projecting in response to conformation |
US20090310103A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Methods and systems for receiving information associated with the coordinated use of two or more user responsive projectors |
US8944608B2 (en) * | 2008-06-17 | 2015-02-03 | The Invention Science Fund I, Llc | Systems and methods associated with projecting in response to conformation |
US20100066983A1 (en) * | 2008-06-17 | 2010-03-18 | Jun Edward K Y | Methods and systems related to a projection surface |
US20110176119A1 (en) * | 2008-06-17 | 2011-07-21 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Methods and systems for projecting in response to conformation |
US8403501B2 (en) | 2008-06-17 | 2013-03-26 | The Invention Science Fund, I, LLC | Motion responsive devices and systems |
US8267526B2 (en) * | 2008-06-17 | 2012-09-18 | The Invention Science Fund I, Llc | Methods associated with receiving and transmitting information related to projection |
US20090312854A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Methods and systems for transmitting information associated with the coordinated use of two or more user responsive projectors |
US8820939B2 (en) * | 2008-06-17 | 2014-09-02 | The Invention Science Fund I, Llc | Projection associated methods and systems |
US20090310040A1 (en) * | 2008-06-17 | 2009-12-17 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Methods and systems for receiving instructions associated with user parameter responsive projection |
US8723787B2 (en) * | 2008-06-17 | 2014-05-13 | The Invention Science Fund I, Llc | Methods and systems related to an image capture projection surface |
US8384005B2 (en) * | 2008-06-17 | 2013-02-26 | The Invention Science Fund I, Llc | Systems and methods for selectively projecting information in response to at least one specified motion associated with pressure applied to at least one projection surface |
US8602564B2 (en) * | 2008-06-17 | 2013-12-10 | The Invention Science Fund I, Llc | Methods and systems for projecting in response to position |
US8733952B2 (en) * | 2008-06-17 | 2014-05-27 | The Invention Science Fund I, Llc | Methods and systems for coordinated use of two or more user responsive projectors |
CA2732337C (en) * | 2008-08-18 | 2021-12-07 | Burcon Nutrascience (Mb) Corp. | Production of canola protein isolate without heat treatment ("c200ca") |
JP5460067B2 (ja) * | 2009-02-09 | 2014-04-02 | 株式会社トクヤマ | 放射線検出装置 |
KR101104735B1 (ko) * | 2010-05-12 | 2012-01-11 | 한국전기안전공사 | 일체형 멀티 타입 어레이 자외선 센서 |
TWI422052B (zh) * | 2010-11-30 | 2014-01-01 | Univ Cheng Shiu | Ultraviolet photodetector with passivation layer |
JP6679064B2 (ja) * | 2015-06-24 | 2020-04-15 | ウシオ電機株式会社 | 真空紫外線センサ |
RU2610522C1 (ru) * | 2015-09-25 | 2017-02-13 | Общество с ограниченной ответственностью "Интерпром" (ООО "Интерпром") | Способ регистрации вакуумного ультрафиолета |
CN108807562B (zh) * | 2017-04-28 | 2021-01-05 | 清华大学 | 光电探测器及其制备方法 |
TWI643320B (zh) * | 2017-09-12 | 2018-12-01 | 鼎元光電科技股份有限公司 | 具寬能隙氧化物之深紫外線感測裝置 |
FR3078169B1 (fr) * | 2018-02-16 | 2020-03-13 | Thales | Dispositif et procede d'analyse en frequence d'un signal |
WO2023214787A1 (ko) * | 2022-05-03 | 2023-11-09 | 박재혁 | 자외선 센서 |
CN116072744B (zh) * | 2023-01-16 | 2024-10-08 | 哈尔滨工业大学 | 一种采用铟纳米粒子局域表面等离激元共振提升金刚石紫外探测性能的方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4965252A (en) * | 1988-06-28 | 1990-10-23 | Hauser-Kuhrts, Inc. | Cholesterol-lowering combination compositions of guar gum and niacin |
JP2952906B2 (ja) * | 1989-10-20 | 1999-09-27 | 株式会社島津製作所 | フォトダイオード |
US5352897A (en) * | 1992-03-16 | 1994-10-04 | Olympus Optical Co., Ltd. | Device for detecting X-rays |
JPH05281030A (ja) * | 1992-04-03 | 1993-10-29 | Osaka Gas Co Ltd | 紫外線検出素子 |
JPH05335613A (ja) | 1992-06-03 | 1993-12-17 | Idemitsu Petrochem Co Ltd | 紫外線受光デバイスおよびその製造方法 |
TW347149U (en) * | 1993-02-26 | 1998-12-01 | Dow Corning | Integrated circuits protected from the environment by ceramic and barrier metal layers |
DE69503285T2 (de) * | 1994-04-07 | 1998-11-05 | Sumitomo Electric Industries | Diamantwafer und Verfahren zur Herstellung eines Diamantwafers |
JPH08330624A (ja) * | 1995-06-02 | 1996-12-13 | Kobe Steel Ltd | ダイヤモンド発光素子 |
US5677538A (en) | 1995-07-07 | 1997-10-14 | Trustees Of Boston University | Photodetectors using III-V nitrides |
JP4114709B2 (ja) * | 1996-09-05 | 2008-07-09 | 株式会社神戸製鋼所 | ダイヤモンド膜の形成方法 |
JP3560462B2 (ja) | 1998-03-04 | 2004-09-02 | 株式会社神戸製鋼所 | ダイヤモンド膜紫外線センサ及びセンサアレイ |
KR20010006514A (ko) * | 1999-10-16 | 2001-01-26 | 오오오 비소키 테크놀로기 | 기상합성에 의해 다이아몬드층을 얻는 방법 |
US6608360B2 (en) * | 2000-12-15 | 2003-08-19 | University Of Houston | One-chip micro-integrated optoelectronic sensor |
JP4166990B2 (ja) * | 2002-02-22 | 2008-10-15 | 浜松ホトニクス株式会社 | 透過型光電陰極及び電子管 |
JP2003245599A (ja) * | 2002-02-22 | 2003-09-02 | Seiko Epson Corp | 光学物品とその製造方法 |
KR100572853B1 (ko) * | 2003-12-26 | 2006-04-24 | 한국전자통신연구원 | 반도체 광센서 |
-
2004
- 2004-02-16 JP JP2004039083A patent/JP4233467B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-01 TW TW94103059A patent/TWI263777B/zh active
- 2005-02-15 KR KR20050012202A patent/KR100626775B1/ko not_active IP Right Cessation
- 2005-02-15 US US11/057,603 patent/US7193241B2/en not_active Expired - Fee Related
- 2005-02-16 EP EP20050101150 patent/EP1583156B1/de not_active Not-in-force
- 2005-02-16 DE DE200560011067 patent/DE602005011067D1/de active Active
- 2005-02-16 AT AT05101150T patent/ATE414993T1/de not_active IP Right Cessation
- 2005-02-16 CN CNB2005100090278A patent/CN100433369C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1583156A2 (de) | 2005-10-05 |
TW200537079A (en) | 2005-11-16 |
US7193241B2 (en) | 2007-03-20 |
TWI263777B (en) | 2006-10-11 |
CN1674301A (zh) | 2005-09-28 |
CN100433369C (zh) | 2008-11-12 |
EP1583156A3 (de) | 2007-04-18 |
EP1583156B1 (de) | 2008-11-19 |
ATE414993T1 (de) | 2008-12-15 |
KR100626775B1 (ko) | 2006-09-25 |
KR20060041936A (ko) | 2006-05-12 |
JP4233467B2 (ja) | 2009-03-04 |
US20050181122A1 (en) | 2005-08-18 |
JP2005229078A (ja) | 2005-08-25 |
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