DE602005009059D1 - Prüfsystem zur Messung differentieller Signale - Google Patents

Prüfsystem zur Messung differentieller Signale

Info

Publication number
DE602005009059D1
DE602005009059D1 DE602005009059T DE602005009059T DE602005009059D1 DE 602005009059 D1 DE602005009059 D1 DE 602005009059D1 DE 602005009059 T DE602005009059 T DE 602005009059T DE 602005009059 T DE602005009059 T DE 602005009059T DE 602005009059 D1 DE602005009059 D1 DE 602005009059D1
Authority
DE
Germany
Prior art keywords
test system
differential signals
measuring differential
measuring
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005009059T
Other languages
English (en)
Inventor
George W Conner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of DE602005009059D1 publication Critical patent/DE602005009059D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
DE602005009059T 2004-03-31 2005-02-01 Prüfsystem zur Messung differentieller Signale Active DE602005009059D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/813,712 US7174279B2 (en) 2004-03-31 2004-03-31 Test system with differential signal measurement

Publications (1)

Publication Number Publication Date
DE602005009059D1 true DE602005009059D1 (de) 2008-10-02

Family

ID=34887711

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005009059T Active DE602005009059D1 (de) 2004-03-31 2005-02-01 Prüfsystem zur Messung differentieller Signale

Country Status (6)

Country Link
US (1) US7174279B2 (de)
EP (1) EP1582885B1 (de)
JP (1) JP4708056B2 (de)
CN (1) CN100446208C (de)
DE (1) DE602005009059D1 (de)
TW (1) TWI280523B (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100982512B1 (ko) * 2003-10-10 2010-09-16 삼성전자주식회사 아이 패턴을 이용한 신호 품질 측정 방법 및 장치
US20060067391A1 (en) * 2004-09-30 2006-03-30 Rambus Inc. Methods and systems for margin testing high-speed communication channels
US7487150B2 (en) * 2005-07-02 2009-02-03 International Business Machines Corporation Method for matching pattern-based data
US7279908B2 (en) * 2005-12-06 2007-10-09 Honeywell International Inc. Dynamically switched line and fault detection for differential signaling systems
EP1863214A1 (de) 2007-01-25 2007-12-05 Agilent Technologies, Inc. Analyse von digitalen Signalen mit Auswertung ausgewählter Signalbits
WO2008136301A1 (ja) * 2007-04-27 2008-11-13 Advantest Corporation 試験装置および試験方法
US8995510B2 (en) * 2008-03-25 2015-03-31 Tektronix, Inc. Apparatus and method for analyzing a signal under test
JP2013074563A (ja) * 2011-09-29 2013-04-22 Elpida Memory Inc 半導体装置
US9479762B2 (en) * 2011-12-05 2016-10-25 Tektronix, Inc. Stereoscopic video temporal frame offset measurement
TWI506289B (zh) * 2013-06-26 2015-11-01 Inventec Corp 伺服器測試裝置
CN106680690B (zh) * 2016-11-17 2020-02-07 上海精密计量测试研究所 应用于ate测试的单端输入差分输出的时钟驱动方法
US10288674B2 (en) * 2017-05-04 2019-05-14 Analog Devices Global Impedance characteristic circuit for electrochemical sensor
US10782263B2 (en) 2017-05-04 2020-09-22 Analog Devices Global Systems and methods for determining the condition of a gas sensor
CN107390113A (zh) * 2017-08-16 2017-11-24 上海华岭集成电路技术股份有限公司 一种ate测试差分信号电平的方法
CN107707258B (zh) 2017-10-31 2022-06-10 上海兆芯集成电路有限公司 眼图产生器
WO2020141516A1 (en) 2018-12-30 2020-07-09 Proteantecs Ltd. Integrated circuit i/o integrity and degradation monitoring
US11209482B1 (en) * 2020-11-30 2021-12-28 Stmicroelectronics International N.V. Methods and devices for testing comparators

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4053844A (en) * 1975-09-26 1977-10-11 Moise N. Hamaoui Card-reader integrated circuit tester
US4547727A (en) * 1983-07-08 1985-10-15 The United States Of America As Represented By The Secretary Of The Air Force Simultaneous signal detection for IFM receivers by transient detection
US5210527A (en) * 1989-06-28 1993-05-11 Ceridian Corporation Programmable spike detector
CA2056679C (en) * 1991-11-29 2002-02-12 Timothy Joseph Nohara Automatic monitoring of digital communication channel conditions using eye patterns
US5294803A (en) * 1991-12-30 1994-03-15 Tandberg Data A/S System and a method for optically detecting an edge of a tape
US5729145A (en) * 1992-07-30 1998-03-17 Siemens Energy & Automation, Inc. Method and apparatus for detecting arcing in AC power systems by monitoring high frequency noise
JP2638520B2 (ja) * 1994-11-22 1997-08-06 日本電気株式会社 光情報記録媒体再生装置
US6107818A (en) * 1998-04-15 2000-08-22 Teradyne, Inc. High speed, real-time, state interconnect for automatic test equipment
US6865500B1 (en) * 1999-05-19 2005-03-08 Georgia Tech Research Corporation Method for testing analog circuits
US6424927B1 (en) * 1999-06-18 2002-07-23 Sri International Computer-based real-time transient pulse monitoring system and method
JP2001060854A (ja) * 1999-08-24 2001-03-06 Advantest Corp 差動伝送回路及びこれを用いるパルス幅可変回路及び可変遅延回路及び半導体試験装置
US6587814B1 (en) * 1999-08-27 2003-07-01 William K. Warburton Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources
US6640193B2 (en) * 1999-12-15 2003-10-28 Texas Instruments Incorporated Method and system for measuring jitter
US6597731B1 (en) * 2000-03-17 2003-07-22 Nvision, Inc. Circuit for processing a digital data signal
US6694462B1 (en) * 2000-08-09 2004-02-17 Teradyne, Inc. Capturing and evaluating high speed data streams
JP2002156422A (ja) * 2000-11-17 2002-05-31 Advantest Corp 半導体試験装置
US6288577B1 (en) * 2001-03-02 2001-09-11 Pericom Semiconductor Corp. Active fail-safe detect circuit for differential receiver
DE60103361T2 (de) * 2001-03-16 2005-06-09 Agilent Technologies Inc., A Delaware Corp., Palo Alto Bitfehlerratenmessung
US6504409B1 (en) * 2001-04-17 2003-01-07 K-Tek Corporation Controller for generating a periodic signal with an adjustable duty cycle
JP3660914B2 (ja) * 2001-05-17 2005-06-15 松下電器産業株式会社 信号検知回路
JP2002374312A (ja) * 2001-06-18 2002-12-26 Matsushita Electric Ind Co Ltd 差動信号遅延装置、並びに、それを用いた受信装置及び通信システム
US20030099307A1 (en) * 2001-11-13 2003-05-29 Narad Networks, Inc. Differential slicer circuit for data communication
US6812803B2 (en) * 2002-02-05 2004-11-02 Force10 Networks, Inc. Passive transmission line equalization using circuit-board thru-holes
US6759864B2 (en) * 2002-06-20 2004-07-06 Agilent Technologies, Inc. System and method for testing integrated circuits by transient signal analysis
JP2004045085A (ja) * 2002-07-09 2004-02-12 Matsushita Electric Ind Co Ltd クロスオーバ電圧評価方法および検査装置

Also Published As

Publication number Publication date
JP2005292134A (ja) 2005-10-20
CN100446208C (zh) 2008-12-24
TW200535744A (en) 2005-11-01
TWI280523B (en) 2007-05-01
JP4708056B2 (ja) 2011-06-22
EP1582885B1 (de) 2008-08-20
CN1677640A (zh) 2005-10-05
US7174279B2 (en) 2007-02-06
EP1582885A1 (de) 2005-10-05
US20050222821A1 (en) 2005-10-06

Similar Documents

Publication Publication Date Title
DE602005009059D1 (de) Prüfsystem zur Messung differentieller Signale
DE602006019024D1 (de) Vorrichtung zur Messung von Magnetsignalen
DE602005027638D1 (de) System zur Messung der Körperaktivität
DE602005003147D1 (de) Messsystem
DE602005016768D1 (de) Messsystem für Knotenposition
EP2047268A4 (de) Indikatorsystem zur bestimmung einer analytenkonzentration
IL169103A0 (en) An analyte measuring system which prevents the reuse of a test strip
AU305356S (en) Analyte test meter
DE602006009202D1 (de) Formmessgerät
DE602005027188D1 (de) Dreidimensionales Messsystem
DE602006000455D1 (de) Sensormessfehler
PL2019960T3 (pl) Urządzenie pomiarowe do ustalania faktycznego stanu zestawów kół
DE602006002448D1 (de) Vorrichtung zur Interferenzmessung
DE602006021612D1 (de) Systeme und verfahren zur messung von glykiertem hämoglobin
DE602005007495D1 (de) Gerät zur Messung der Stoffwechselaktivität
AT6894U3 (de) Messkammer für photoakustische sensoren
DE602005020180D1 (de) Verbessertes messsystem
DE502006000947D1 (de) Messeinrichtung zur kapazitiven Druckmessung
PL1715316T3 (pl) Układ czujników pomiarowych
DE602006004515D1 (de) Vorrichtung zur Interferenzmessung
ATE479905T1 (de) Einrichtung zur messung des verlustfaktors
GB2438577B (en) Acoustic sounding system for measuring distances
DE502006007105D1 (de) Vibrationsmesssystem
FI10956U1 (fi) Mittaväline ajoneuvon mittaukseen
DE602004027807D1 (de) Instrument zur messung der augenrefraktionsstärke

Legal Events

Date Code Title Description
8364 No opposition during term of opposition