DE602004012422D1 - Schiebetakt-erzeugungseinrichtung - Google Patents

Schiebetakt-erzeugungseinrichtung

Info

Publication number
DE602004012422D1
DE602004012422D1 DE602004012422T DE602004012422T DE602004012422D1 DE 602004012422 D1 DE602004012422 D1 DE 602004012422D1 DE 602004012422 T DE602004012422 T DE 602004012422T DE 602004012422 T DE602004012422 T DE 602004012422T DE 602004012422 D1 DE602004012422 D1 DE 602004012422D1
Authority
DE
Germany
Prior art keywords
generation device
clock generation
shift clock
shift
generation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004012422T
Other languages
English (en)
Other versions
DE602004012422T2 (de
Inventor
Shinya Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602004012422D1 publication Critical patent/DE602004012422D1/de
Application granted granted Critical
Publication of DE602004012422T2 publication Critical patent/DE602004012422T2/de
Anticipated expiration legal-status Critical
Active legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE602004012422T 2003-07-16 2004-07-15 Schiebetakt-erzeugungseinrichtung Active DE602004012422T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2003275267A JP4416446B2 (ja) 2003-07-16 2003-07-16 シフトクロック発生装置、タイミング発生器、及び試験装置
JP2003275267 2003-07-16
PCT/JP2004/010113 WO2005008264A1 (ja) 2003-07-16 2004-07-15 シフトクロック発生装置、タイミング発生器、及び試験装置

Publications (2)

Publication Number Publication Date
DE602004012422D1 true DE602004012422D1 (de) 2008-04-24
DE602004012422T2 DE602004012422T2 (de) 2009-03-12

Family

ID=34074544

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004012422T Active DE602004012422T2 (de) 2003-07-16 2004-07-15 Schiebetakt-erzeugungseinrichtung

Country Status (7)

Country Link
US (1) US7183828B2 (de)
EP (1) EP1662267B1 (de)
JP (1) JP4416446B2 (de)
KR (1) KR100882362B1 (de)
DE (1) DE602004012422T2 (de)
TW (1) TWI350953B (de)
WO (1) WO2005008264A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7257508B2 (en) * 2005-09-09 2007-08-14 Advantest Corporation Timing generator, and timing generating method
TWI461717B (zh) * 2012-11-05 2014-11-21 Realtek Semiconductor Corp 掃描時脈產生器以及掃描時脈產生方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0420667B1 (de) * 1989-09-29 1997-08-06 Kabushiki Kaisha Toshiba Phasensynchrone Regeleinrichtung zur Herstellung eines Referenztaktsignals in einem Plattenantriebssystem
JP3552184B2 (ja) * 1996-10-18 2004-08-11 株式会社アドバンテスト 半導体メモリ試験装置
JPH1138095A (ja) * 1997-07-23 1999-02-12 Ando Electric Co Ltd Ｉｃテスタのタイミングデータ転送回路、及びタイミングデータ転送方法
JPH1172538A (ja) * 1997-08-29 1999-03-16 Ando Electric Co Ltd Ｉｃ試験装置、ｉｃ試験装置における測定方法及び記憶媒体
JP4286375B2 (ja) * 1999-04-02 2009-06-24 株式会社アドバンテスト 遅延クロック生成装置および遅延時間測定装置
JP4146965B2 (ja) 1999-05-17 2008-09-10 株式会社アドバンテスト 遅延信号生成装置および半導体試験装置
KR101019833B1 (ko) * 2003-11-20 2011-03-04 주식회사 아도반테스토 타이밍 비교기, 데이터 샘플링 장치, 및 시험 장치

Also Published As

Publication number Publication date
DE602004012422T2 (de) 2009-03-12
EP1662267B1 (de) 2008-03-12
JP4416446B2 (ja) 2010-02-17
TWI350953B (en) 2011-10-21
US7183828B2 (en) 2007-02-27
EP1662267A1 (de) 2006-05-31
US20060195741A1 (en) 2006-08-31
JP2005037269A (ja) 2005-02-10
EP1662267A4 (de) 2006-06-14
WO2005008264A1 (ja) 2005-01-27
TW200513826A (en) 2005-04-16
KR100882362B1 (ko) 2009-02-05
KR20060033019A (ko) 2006-04-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition