DE602004002947D1 - NAND Flash Speicher mit Speicherredundanz - Google Patents

NAND Flash Speicher mit Speicherredundanz

Info

Publication number
DE602004002947D1
DE602004002947D1 DE602004002947T DE602004002947T DE602004002947D1 DE 602004002947 D1 DE602004002947 D1 DE 602004002947D1 DE 602004002947 T DE602004002947 T DE 602004002947T DE 602004002947 T DE602004002947 T DE 602004002947T DE 602004002947 D1 DE602004002947 D1 DE 602004002947D1
Authority
DE
Germany
Prior art keywords
memory
nand flash
redundancy
flash memory
memory redundancy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004002947T
Other languages
English (en)
Other versions
DE602004002947T2 (de
Inventor
Massimiliano Picca
Stefano Zanardi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
STMicroelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SRL filed Critical STMicroelectronics SRL
Publication of DE602004002947D1 publication Critical patent/DE602004002947D1/de
Application granted granted Critical
Publication of DE602004002947T2 publication Critical patent/DE602004002947T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/816—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
    • G11C29/82—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for EEPROMs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
DE602004002947T 2004-07-14 2004-07-14 NAND Flash Speicher mit Speicherredundanz Active DE602004002947T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04103354A EP1617438B1 (de) 2004-07-14 2004-07-14 NAND Flash Speicher mit Speicherredundanz

Publications (2)

Publication Number Publication Date
DE602004002947D1 true DE602004002947D1 (de) 2006-12-07
DE602004002947T2 DE602004002947T2 (de) 2007-06-28

Family

ID=34929325

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004002947T Active DE602004002947T2 (de) 2004-07-14 2004-07-14 NAND Flash Speicher mit Speicherredundanz

Country Status (3)

Country Link
US (1) US7733697B2 (de)
EP (1) EP1617438B1 (de)
DE (1) DE602004002947T2 (de)

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US8131026B2 (en) 2004-04-16 2012-03-06 Validity Sensors, Inc. Method and apparatus for fingerprint image reconstruction
US8229184B2 (en) 2004-04-16 2012-07-24 Validity Sensors, Inc. Method and algorithm for accurate finger motion tracking
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US8276816B2 (en) 2007-12-14 2012-10-02 Validity Sensors, Inc. Smart card system with ergonomic fingerprint sensor and method of using
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US9336428B2 (en) * 2009-10-30 2016-05-10 Synaptics Incorporated Integrated fingerprint sensor and display
US9274553B2 (en) 2009-10-30 2016-03-01 Synaptics Incorporated Fingerprint sensor and integratable electronic display
US8421890B2 (en) 2010-01-15 2013-04-16 Picofield Technologies, Inc. Electronic imager using an impedance sensor grid array and method of making
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US8238178B2 (en) 2010-02-12 2012-08-07 Taiwan Semiconductor Manufacturing Company, Ltd. Redundancy circuits and operating methods thereof
US9666635B2 (en) 2010-02-19 2017-05-30 Synaptics Incorporated Fingerprint sensing circuit
US8716613B2 (en) 2010-03-02 2014-05-06 Synaptics Incoporated Apparatus and method for electrostatic discharge protection
US9001040B2 (en) 2010-06-02 2015-04-07 Synaptics Incorporated Integrated fingerprint sensor and navigation device
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US8331096B2 (en) 2010-08-20 2012-12-11 Validity Sensors, Inc. Fingerprint acquisition expansion card apparatus
US8594393B2 (en) 2011-01-26 2013-11-26 Validity Sensors System for and method of image reconstruction with dual line scanner using line counts
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US9406580B2 (en) 2011-03-16 2016-08-02 Synaptics Incorporated Packaging for fingerprint sensors and methods of manufacture
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KR101797565B1 (ko) * 2011-08-22 2017-12-12 삼성전자 주식회사 불량 페이지를 관리하는 메모리 장치
US10043052B2 (en) 2011-10-27 2018-08-07 Synaptics Incorporated Electronic device packages and methods
US9195877B2 (en) 2011-12-23 2015-11-24 Synaptics Incorporated Methods and devices for capacitive image sensing
US9785299B2 (en) 2012-01-03 2017-10-10 Synaptics Incorporated Structures and manufacturing methods for glass covered electronic devices
US9251329B2 (en) 2012-03-27 2016-02-02 Synaptics Incorporated Button depress wakeup and wakeup strategy
US9137438B2 (en) 2012-03-27 2015-09-15 Synaptics Incorporated Biometric object sensor and method
US9268991B2 (en) 2012-03-27 2016-02-23 Synaptics Incorporated Method of and system for enrolling and matching biometric data
US9600709B2 (en) 2012-03-28 2017-03-21 Synaptics Incorporated Methods and systems for enrolling biometric data
US9152838B2 (en) 2012-03-29 2015-10-06 Synaptics Incorporated Fingerprint sensor packagings and methods
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KR20130136734A (ko) * 2012-06-05 2013-12-13 에스케이하이닉스 주식회사 불휘발성 메모리 장치
US9111648B2 (en) 2012-08-28 2015-08-18 Apple Inc. Redundancy schemes for non-volatile memory based on physical memory layout
US9665762B2 (en) 2013-01-11 2017-05-30 Synaptics Incorporated Tiered wakeup strategy
JP5714681B2 (ja) * 2013-10-25 2015-05-07 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置
FR3044817B1 (fr) 2015-12-02 2017-12-22 St Microelectronics Rousset Procede de gestion d'une ligne de bits defectueuse du plan memoire d'une memoire non volatile et dispositif de memoire correspondant
US9905315B1 (en) * 2017-01-24 2018-02-27 Nxp B.V. Error-resilient memory device with row and/or column folding with redundant resources and repair method thereof
CN106951297B (zh) * 2017-04-06 2020-07-28 惠州佰维存储科技有限公司 嵌入式多媒体卡的生产方法及其系统
KR20190084488A (ko) * 2018-01-08 2019-07-17 에스케이하이닉스 주식회사 데이터 저장 장치 및 그것의 동작 방법
US11438574B2 (en) 2020-10-26 2022-09-06 Semiconductor Components Industries, Llc Stitched integrated circuit dies

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DE69323076T2 (de) * 1993-07-26 1999-06-24 St Microelectronics Srl Verfahren zur Erkennung fehlerhafter Elemente eines redundanten Halbleiterspeichers
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Also Published As

Publication number Publication date
EP1617438B1 (de) 2006-10-25
EP1617438A1 (de) 2006-01-18
US20060018159A1 (en) 2006-01-26
US7733697B2 (en) 2010-06-08
DE602004002947T2 (de) 2007-06-28

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