DE60142393D1 - Verfahren zur herstellung einer schablone - Google Patents

Verfahren zur herstellung einer schablone

Info

Publication number
DE60142393D1
DE60142393D1 DE60142393T DE60142393T DE60142393D1 DE 60142393 D1 DE60142393 D1 DE 60142393D1 DE 60142393 T DE60142393 T DE 60142393T DE 60142393 T DE60142393 T DE 60142393T DE 60142393 D1 DE60142393 D1 DE 60142393D1
Authority
DE
Germany
Prior art keywords
template
plate
producing
production
thereafter fixed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60142393T
Other languages
English (en)
Inventor
Babak Heidari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Obducat AB
Original Assignee
Obducat AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Obducat AB filed Critical Obducat AB
Application granted granted Critical
Publication of DE60142393D1 publication Critical patent/DE60142393D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00—Manufacture or treatment of nanostructures
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0017—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor for the production of embossing, cutting or similar devices; for the production of casting means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41C—PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTING SURFACES
    • B41C2210/00—Preparation or type or constituents of the imaging layers, in relation to lithographic printing forme preparation
    • B41C2210/04—Negative working, i.e. the non-exposed (non-imaged) areas are removed
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
    • G11B7/261—Preparing a master, e.g. exposing photoresist, electroforming

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Manufacturing & Machinery (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Magnetic Ceramics (AREA)
  • Micromachines (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Auxiliary Devices For Music (AREA)
  • Mechanical Coupling Of Light Guides (AREA)
  • Adornments (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
DE60142393T 2000-05-24 2001-04-10 Verfahren zur herstellung einer schablone Expired - Lifetime DE60142393D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0001931A SE516414C2 (sv) 2000-05-24 2000-05-24 Metod vid tillverkning av en mall, samt mallen tillverkad därav
PCT/SE2001/000787 WO2001090816A1 (en) 2000-05-24 2001-04-10 Method in connection with the production of a template and the template thus produced

Publications (1)

Publication Number Publication Date
DE60142393D1 true DE60142393D1 (de) 2010-07-29

Family

ID=20279811

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60142393T Expired - Lifetime DE60142393D1 (de) 2000-05-24 2001-04-10 Verfahren zur herstellung einer schablone

Country Status (10)

Country Link
US (1) US7022465B2 (de)
EP (1) EP1290497B1 (de)
JP (1) JP2003534651A (de)
CN (1) CN1236359C (de)
AT (1) ATE471533T1 (de)
AU (1) AU2001247025A1 (de)
DE (1) DE60142393D1 (de)
HK (1) HK1052978B (de)
SE (1) SE516414C2 (de)
WO (1) WO2001090816A1 (de)

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US7037639B2 (en) 2002-05-01 2006-05-02 Molecular Imprints, Inc. Methods of manufacturing a lithography template
US6936194B2 (en) 2002-09-05 2005-08-30 Molecular Imprints, Inc. Functional patterning material for imprint lithography processes
GB0229191D0 (en) * 2002-12-14 2003-01-22 Plastic Logic Ltd Embossing of polymer devices
US6805054B1 (en) 2003-05-14 2004-10-19 Molecular Imprints, Inc. Method, system and holder for transferring templates during imprint lithography processes
US6951173B1 (en) 2003-05-14 2005-10-04 Molecular Imprints, Inc. Assembly and method for transferring imprint lithography templates
CN101124089B (zh) * 2004-01-12 2011-02-09 加利福尼亚大学董事会 纳米级电子光刻
US7730834B2 (en) * 2004-03-04 2010-06-08 Asml Netherlands B.V. Printing apparatus and device manufacturing method
CN102004393B (zh) * 2004-04-27 2013-05-01 伊利诺伊大学评议会 用于软光刻法的复合构图设备
AU2005282060A1 (en) * 2004-09-08 2006-03-16 Nil Technology Aps A flexible nano-imprint stamp
US7676088B2 (en) * 2004-12-23 2010-03-09 Asml Netherlands B.V. Imprint lithography
CN100541326C (zh) * 2004-12-30 2009-09-16 中国科学院电工研究所 纳米级别图形的压印制造方法及其装置
US7686970B2 (en) * 2004-12-30 2010-03-30 Asml Netherlands B.V. Imprint lithography
US7490547B2 (en) * 2004-12-30 2009-02-17 Asml Netherlands B.V. Imprint lithography
US20060144814A1 (en) * 2004-12-30 2006-07-06 Asml Netherlands B.V. Imprint lithography
US20060144274A1 (en) * 2004-12-30 2006-07-06 Asml Netherlands B.V. Imprint lithography
US7354698B2 (en) * 2005-01-07 2008-04-08 Asml Netherlands B.V. Imprint lithography
US7922474B2 (en) * 2005-02-17 2011-04-12 Asml Netherlands B.V. Imprint lithography
US7329115B2 (en) * 2005-02-18 2008-02-12 Hewlett-Packard Development Company, L.P. Patterning nanoline arrays with spatially varying pitch
US7523701B2 (en) 2005-03-07 2009-04-28 Asml Netherlands B.V. Imprint lithography method and apparatus
US7611348B2 (en) * 2005-04-19 2009-11-03 Asml Netherlands B.V. Imprint lithography
US7762186B2 (en) 2005-04-19 2010-07-27 Asml Netherlands B.V. Imprint lithography
US7442029B2 (en) 2005-05-16 2008-10-28 Asml Netherlands B.V. Imprint lithography
US7708924B2 (en) * 2005-07-21 2010-05-04 Asml Netherlands B.V. Imprint lithography
US7692771B2 (en) * 2005-05-27 2010-04-06 Asml Netherlands B.V. Imprint lithography
US20060267231A1 (en) 2005-05-27 2006-11-30 Asml Netherlands B.V. Imprint lithography
US7418902B2 (en) * 2005-05-31 2008-09-02 Asml Netherlands B.V. Imprint lithography including alignment
US7377764B2 (en) * 2005-06-13 2008-05-27 Asml Netherlands B.V. Imprint lithography
US20070023976A1 (en) * 2005-07-26 2007-02-01 Asml Netherlands B.V. Imprint lithography
US8011915B2 (en) 2005-11-04 2011-09-06 Asml Netherlands B.V. Imprint lithography
US7878791B2 (en) * 2005-11-04 2011-02-01 Asml Netherlands B.V. Imprint lithography
EP1795958A1 (de) * 2005-12-07 2007-06-13 Electronics And Telecommunications Research Institute Vorrichtung zur Herstellung einer Nanoimprintform
US7517211B2 (en) 2005-12-21 2009-04-14 Asml Netherlands B.V. Imprint lithography
US20070138699A1 (en) * 2005-12-21 2007-06-21 Asml Netherlands B.V. Imprint lithography
CN100396595C (zh) * 2005-12-27 2008-06-25 北京大学 应用纳米压印和反应离子刻蚀术制备纳米悬臂结构的方法
US20070134943A2 (en) * 2006-04-02 2007-06-14 Dunnrowicz Clarence J Subtractive - Additive Edge Defined Lithography
US20070291623A1 (en) * 2006-06-15 2007-12-20 Nanochip, Inc. Cantilever with control of vertical and lateral position of contact probe tip
US20070121477A1 (en) * 2006-06-15 2007-05-31 Nanochip, Inc. Cantilever with control of vertical and lateral position of contact probe tip
US20080023885A1 (en) * 2006-06-15 2008-01-31 Nanochip, Inc. Method for forming a nano-imprint lithography template having very high feature counts
US20070290282A1 (en) * 2006-06-15 2007-12-20 Nanochip, Inc. Bonded chip assembly with a micro-mover for microelectromechanical systems
US8318253B2 (en) * 2006-06-30 2012-11-27 Asml Netherlands B.V. Imprint lithography
US8015939B2 (en) * 2006-06-30 2011-09-13 Asml Netherlands B.V. Imprintable medium dispenser
JP5061525B2 (ja) * 2006-08-04 2012-10-31 株式会社日立製作所 インプリント方法及びインプリント装置
US20080074984A1 (en) * 2006-09-21 2008-03-27 Nanochip, Inc. Architecture for a Memory Device
US20080074792A1 (en) * 2006-09-21 2008-03-27 Nanochip, Inc. Control scheme for a memory device
US20090038636A1 (en) * 2007-08-09 2009-02-12 Asml Netherlands B.V. Cleaning method
US7854877B2 (en) 2007-08-14 2010-12-21 Asml Netherlands B.V. Lithography meandering order
US8144309B2 (en) 2007-09-05 2012-03-27 Asml Netherlands B.V. Imprint lithography
US7906274B2 (en) * 2007-11-21 2011-03-15 Molecular Imprints, Inc. Method of creating a template employing a lift-off process
DK2563453T3 (en) 2010-04-28 2017-05-22 Kimberly Clark Co Nano-patterned medical device with improved cellular interaction and process for its preparation
RU2014119897A (ru) 2011-10-27 2015-12-10 Кимберли-Кларк Ворлдвайд, Инк. Имплантируемое устройство для доставки биоактивного агента
TW201445246A (zh) * 2013-05-31 2014-12-01 Nanocrystal Asia Inc 無缺陷模仁之製造方法

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JPH01309989A (ja) * 1988-06-09 1989-12-14 Asahi Glass Co Ltd 樹脂またはガラス基板成型用スタンパー
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Also Published As

Publication number Publication date
EP1290497B1 (de) 2010-06-16
SE0001931L (sv) 2001-11-25
WO2001090816A1 (en) 2001-11-29
US20030139042A1 (en) 2003-07-24
JP2003534651A (ja) 2003-11-18
EP1290497A1 (de) 2003-03-12
HK1052978B (zh) 2010-09-17
CN1236359C (zh) 2006-01-11
AU2001247025A1 (en) 2001-12-03
CN1434930A (zh) 2003-08-06
ATE471533T1 (de) 2010-07-15
SE516414C2 (sv) 2002-01-15
HK1052978A1 (en) 2003-10-03
US7022465B2 (en) 2006-04-04
SE0001931D0 (sv) 2000-05-24

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