DE60140851D1 - Vorrichtung zur Umwandlung elektromagnetischer Wellen - Google Patents

Vorrichtung zur Umwandlung elektromagnetischer Wellen

Info

Publication number
DE60140851D1
DE60140851D1 DE60140851T DE60140851T DE60140851D1 DE 60140851 D1 DE60140851 D1 DE 60140851D1 DE 60140851 T DE60140851 T DE 60140851T DE 60140851 T DE60140851 T DE 60140851T DE 60140851 D1 DE60140851 D1 DE 60140851D1
Authority
DE
Germany
Prior art keywords
electromagnetic waves
converting electromagnetic
converting
waves
electromagnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60140851T
Other languages
English (en)
Inventor
Masakazu Morishita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Application granted granted Critical
Publication of DE60140851D1 publication Critical patent/DE60140851D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14663—Indirect radiation imagers, e.g. using luminescent members
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
    • A61B6/4233—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using matrix detectors
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/54—Control of apparatus or devices for radiation diagnosis
    • A61B6/542—Control of apparatus or devices for radiation diagnosis involving control of exposure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14661—X-ray, gamma-ray or corpuscular radiation imagers of the hybrid type
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • Power Engineering (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
  • X-Ray Techniques (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measuring Magnetic Variables (AREA)
DE60140851T 2000-11-01 2001-10-31 Vorrichtung zur Umwandlung elektromagnetischer Wellen Expired - Lifetime DE60140851D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000335004A JP3840050B2 (ja) 2000-11-01 2000-11-01 電磁波変換装置

Publications (1)

Publication Number Publication Date
DE60140851D1 true DE60140851D1 (de) 2010-02-04

Family

ID=18810822

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60140851T Expired - Lifetime DE60140851D1 (de) 2000-11-01 2001-10-31 Vorrichtung zur Umwandlung elektromagnetischer Wellen

Country Status (4)

Country Link
US (1) US6838673B2 (de)
EP (1) EP1207560B1 (de)
JP (1) JP3840050B2 (de)
DE (1) DE60140851D1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3840050B2 (ja) 2000-11-01 2006-11-01 キヤノン株式会社 電磁波変換装置
JP2002148342A (ja) * 2000-11-07 2002-05-22 Canon Inc 放射線撮像装置
US6765187B2 (en) 2001-06-27 2004-07-20 Canon Kabushiki Kaisha Imaging apparatus
JP2003240861A (ja) * 2002-02-20 2003-08-27 Canon Inc 放射線検出素子、放射線撮像装置及び放射線検出方法
WO2003103014A2 (en) * 2002-05-30 2003-12-11 Koninklijke Philips Electronics N.V. Electronic imaging device
US7214945B2 (en) * 2002-06-11 2007-05-08 Canon Kabushiki Kaisha Radiation detecting apparatus, manufacturing method therefor, and radiation image pickup system
US7006598B2 (en) * 2002-08-09 2006-02-28 Canon Kabushiki Kaisha Imaging method and apparatus with exposure control
US7148487B2 (en) * 2002-08-27 2006-12-12 Canon Kabushiki Kaisha Image sensing apparatus and method using radiation
EP1420453B1 (de) * 2002-11-13 2011-03-09 Canon Kabushiki Kaisha Bildaufnahmevorrichtung, Strahlungsbildaufnahmevorrichtung und Strahlungsbildaufnahmesystem
US7379528B2 (en) * 2003-01-06 2008-05-27 Koninklijke Philips Electronics N.V. Radiation detector with shielded electronics for computed tomography
JP4418720B2 (ja) * 2003-11-21 2010-02-24 キヤノン株式会社 放射線撮像装置及び方法、並びに放射線撮像システム
JP4537483B2 (ja) * 2005-09-21 2010-09-01 アール・ジェイ・エス・テクノロジー・インコーポレイテッド 高分解能および広ダイナミックレンジ積分器
EP1787585B1 (de) * 2005-11-15 2008-06-11 Trophy X-ray source with a feedback loop in a radiography apparatus
US7916199B2 (en) * 2006-02-02 2011-03-29 National University Corporation Nara Photo detection device
US7659516B2 (en) 2006-06-29 2010-02-09 Dalsa Corporation C-MOS sensor readout from multiple cells across the array to generate dose sensing signal
GB0802088D0 (en) * 2008-02-05 2008-03-12 Panalytical Bv Imaging detector
US20120205549A1 (en) * 2009-11-03 2012-08-16 Koninklijke Philips Electronics N.V. Detector unit for detecting electromagnetic radiation
KR101785560B1 (ko) 2010-12-28 2017-10-17 삼성디스플레이 주식회사 엑스레이 검출기 및 엑스레이 검출기의 구동 방법
CN103339527B (zh) * 2011-02-03 2016-06-22 皇家飞利浦有限公司 单能量或多能量垂直辐射敏感探测器
US8610482B2 (en) 2011-05-27 2013-12-17 Semiconductor Energy Laboratory Co., Ltd. Trimming circuit and method for driving trimming circuit
US8803061B2 (en) * 2012-07-16 2014-08-12 Varian Medical Systems International Ag Circuitry and method for collecting image array data with separate addressing and dynamic clamping of pixels to allow for faster pixel data readout and full removal of pixel charges
JP6555909B2 (ja) * 2015-03-20 2019-08-07 キヤノン株式会社 放射線撮像装置及び放射線撮像システム

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH065289B2 (ja) * 1985-05-14 1994-01-19 株式会社東芝 Ｘ線検出器
JPH02275670A (ja) * 1989-01-18 1990-11-09 Canon Inc 光電変換装置および画像読取装置
JP2977060B2 (ja) 1992-01-29 1999-11-10 オリンパス光学工業株式会社 固体撮像装置及びその制御方法
US5319206A (en) 1992-12-16 1994-06-07 E. I. Du Pont De Nemours And Company Method and apparatus for acquiring an X-ray image using a solid state device
JPH07171142A (ja) 1993-12-21 1995-07-11 Toshiba Corp 放射線診断装置
GB2289983B (en) * 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
US5528043A (en) * 1995-04-21 1996-06-18 Thermotrex Corporation X-ray image sensor
DE69529096D1 (de) * 1995-07-31 2003-01-16 Ifire Technology Inc Flachbildschirm-strahlungsdetektor mit reduziertem elektronischen rauschen
JP3957803B2 (ja) 1996-02-22 2007-08-15 キヤノン株式会社 光電変換装置
JPH09260627A (ja) * 1996-03-18 1997-10-03 Sharp Corp 増幅型固体撮像装置
JPH11183626A (ja) 1997-12-25 1999-07-09 Shimadzu Corp 放射線検出素子アレイ
JP3649907B2 (ja) * 1998-01-20 2005-05-18 シャープ株式会社 二次元画像検出器およびその製造方法
JPH11307756A (ja) 1998-02-20 1999-11-05 Canon Inc 光電変換装置および放射線読取装置
US6323490B1 (en) * 1998-03-20 2001-11-27 Kabushiki Kaisha Toshiba X-ray semiconductor detector
US6407418B1 (en) * 1998-09-16 2002-06-18 Nec Corporation Semiconductor device, method of manufacturing the same, image sensor apparatus having the same and image reader having the same
US6429436B1 (en) * 1998-09-22 2002-08-06 Kabushiki Kaisha Toshiba Radiographic flat panel detector
JP2000165747A (ja) * 1998-11-27 2000-06-16 Sharp Corp Ｘ線撮像装置
DE60045404D1 (de) * 1999-07-30 2011-02-03 Canon Kk Strahlungsbildaufnahmeapparatus
TW480727B (en) * 2000-01-11 2002-03-21 Semiconductor Energy Laboratro Semiconductor display device
JP3840050B2 (ja) 2000-11-01 2006-11-01 キヤノン株式会社 電磁波変換装置
US6538253B2 (en) * 2000-12-29 2003-03-25 Ge Medical Systems Global Technology Company, Llc Self cycling solid state X-ray detector

Also Published As

Publication number Publication date
EP1207560B1 (de) 2009-12-23
EP1207560A3 (de) 2006-06-14
EP1207560A2 (de) 2002-05-22
JP3840050B2 (ja) 2006-11-01
JP2002139571A (ja) 2002-05-17
US20020066861A1 (en) 2002-06-06
US6838673B2 (en) 2005-01-04

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