DE60120099D1 - Aktiver Bildsensor mit verbesserter Linearität - Google Patents

Aktiver Bildsensor mit verbesserter Linearität

Info

Publication number
DE60120099D1
DE60120099D1 DE60120099T DE60120099T DE60120099D1 DE 60120099 D1 DE60120099 D1 DE 60120099D1 DE 60120099 T DE60120099 T DE 60120099T DE 60120099 T DE60120099 T DE 60120099T DE 60120099 D1 DE60120099 D1 DE 60120099D1
Authority
DE
Germany
Prior art keywords
image sensor
active image
improved linearity
linearity
improved
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60120099T
Other languages
English (en)
Other versions
DE60120099T2 (de
Inventor
Robert M Guidash
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eastman Kodak Co
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of DE60120099D1 publication Critical patent/DE60120099D1/de
Application granted granted Critical
Publication of DE60120099T2 publication Critical patent/DE60120099T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50Control of the SSIS exposure
    • H04N25/57Control of the dynamic range
    • H04N25/59Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
DE60120099T 2000-12-29 2001-12-17 Aktiver pixelbildsensor mit verbesserter linearität Expired - Lifetime DE60120099T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/750,745 US6730897B2 (en) 2000-12-29 2000-12-29 Linearity and dynamic range for complementary metal oxide semiconductor active pixel image sensors
US750745 2000-12-29

Publications (2)

Publication Number Publication Date
DE60120099D1 true DE60120099D1 (de) 2006-07-06
DE60120099T2 DE60120099T2 (de) 2006-12-14

Family

ID=25019008

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60120099T Expired - Lifetime DE60120099T2 (de) 2000-12-29 2001-12-17 Aktiver pixelbildsensor mit verbesserter linearität

Country Status (4)

Country Link
US (1) US6730897B2 (de)
EP (1) EP1223746B1 (de)
JP (1) JP4156831B2 (de)
DE (1) DE60120099T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0318611D0 (en) * 2003-08-08 2003-09-10 Koninkl Philips Electronics Nv Circuit for signal amplification and use of the same in active matrix devices
KR20050077434A (ko) * 2004-01-28 2005-08-02 삼성전자주식회사 소비 전력을 줄일 수 있는 고체 촬상 장치
US7719583B1 (en) * 2004-09-07 2010-05-18 Melexis Tessenderlo Nv Active pixel image sensor with selectable source follower and common source amplifier modes
JP4940540B2 (ja) * 2004-10-07 2012-05-30 ソニー株式会社 半導体装置
US7446807B2 (en) * 2004-12-03 2008-11-04 Micron Technology, Inc. Imager pixel with capacitance for boosting reset voltage
JP4878123B2 (ja) * 2005-02-07 2012-02-15 浜松ホトニクス株式会社 固体撮像装置
US7718459B2 (en) * 2005-04-15 2010-05-18 Aptina Imaging Corporation Dual conversion gain pixel using Schottky and ohmic contacts to the floating diffusion region and methods of fabrication and operation
JP2006303019A (ja) * 2005-04-18 2006-11-02 Pentax Corp 撮像素子
US7427790B2 (en) * 2007-01-19 2008-09-23 Eastman Kodak Company Image sensor with gain control
US7674648B2 (en) 2007-03-21 2010-03-09 Eastman Kodak Company Extended dynamic range using variable sensitivity pixels
US8159585B2 (en) 2007-05-01 2012-04-17 Omnivision Technologies, Inc. Image sensor pixel with gain control
US20110074996A1 (en) * 2009-09-29 2011-03-31 Shen Wang Ccd image sensors with variable output gains in an output circuit
JP2011243704A (ja) * 2010-05-17 2011-12-01 Panasonic Corp 固体撮像装置
US9526468B2 (en) 2014-09-09 2016-12-27 General Electric Company Multiple frame acquisition for exposure control in X-ray medical imagers
WO2016114153A1 (ja) * 2015-01-13 2016-07-21 ソニー株式会社 固体撮像装置、駆動方法、及び、電子機器
DE102016212765A1 (de) * 2016-07-13 2018-01-18 Robert Bosch Gmbh Pixeleinheit für einen Bildsensor, Bildsensor, Verfahren zum Sensieren eines Lichtsignals, Verfahren zum Ansteuern einer Pixeleinheit und Verfahren zum Generieren eines Bildes unter Verwendung einer Pixeleinheit

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2965777B2 (ja) * 1992-01-29 1999-10-18 オリンパス光学工業株式会社 固体撮像装置
FR2737072B1 (fr) * 1995-07-20 1997-08-22 Commissariat Energie Atomique Circuit de lecture de detecteurs de rayonnements electromagnetiques avec remise a zero du circuit de lecture par les detecteurs
US5614744A (en) * 1995-08-04 1997-03-25 National Semiconductor Corporation CMOS-based, low leakage active pixel array with anti-blooming isolation
US6344877B1 (en) * 1997-06-12 2002-02-05 International Business Machines Corporation Image sensor with dummy pixel or dummy pixel array
US6069376A (en) * 1998-03-26 2000-05-30 Foveonics, Inc. Intra-pixel frame storage element, array, and electronic shutter method including speed switch suitable for electronic still camera applications
US6512544B1 (en) * 1998-06-17 2003-01-28 Foveon, Inc. Storage pixel sensor and array with compression
US6665012B1 (en) * 1998-09-22 2003-12-16 Pixim, Inc. Process-scalable high spatial resolution and low bit resolution CMOS area image sensor
US6384394B1 (en) * 1999-08-16 2002-05-07 Intel Corporation Apparatus and method for offset reduction in the image sensors
WO2002027763A2 (en) * 2000-09-25 2002-04-04 Foveon, Inc. Active pixel sensor with noise cancellation

Also Published As

Publication number Publication date
EP1223746A2 (de) 2002-07-17
US20020121589A1 (en) 2002-09-05
EP1223746B1 (de) 2006-05-31
JP4156831B2 (ja) 2008-09-24
DE60120099T2 (de) 2006-12-14
EP1223746A3 (de) 2004-09-22
JP2002305688A (ja) 2002-10-18
US6730897B2 (en) 2004-05-04

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Legal Events

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