DE60117667D1 - Vorrichtung und Verfahren zur Messung der spektralen Reflexion - Google Patents

Vorrichtung und Verfahren zur Messung der spektralen Reflexion

Info

Publication number
DE60117667D1
DE60117667D1 DE60117667T DE60117667T DE60117667D1 DE 60117667 D1 DE60117667 D1 DE 60117667D1 DE 60117667 T DE60117667 T DE 60117667T DE 60117667 T DE60117667 T DE 60117667T DE 60117667 D1 DE60117667 D1 DE 60117667D1
Authority
DE
Germany
Prior art keywords
measuring
spectral reflection
spectral
reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60117667T
Other languages
English (en)
Other versions
DE60117667T2 (de
Inventor
Masashi Shinbori
Hiroyuki Kameda
Kotaro Moroishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ushio Denki KK
Original Assignee
Ushio Denki KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ushio Denki KK filed Critical Ushio Denki KK
Application granted granted Critical
Publication of DE60117667D1 publication Critical patent/DE60117667D1/de
Publication of DE60117667T2 publication Critical patent/DE60117667T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE2001617667 2000-12-11 2001-12-06 Vorrichtung und Verfahren zur Messung der spektralen Reflexion Expired - Lifetime DE60117667T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000376053 2000-12-11
JP2000376053A JP3674504B2 (ja) 2000-12-11 2000-12-11 分光反射率測定装置および分光反射率測定方法

Publications (2)

Publication Number Publication Date
DE60117667D1 true DE60117667D1 (de) 2006-05-04
DE60117667T2 DE60117667T2 (de) 2007-01-18

Family

ID=18844970

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2001617667 Expired - Lifetime DE60117667T2 (de) 2000-12-11 2001-12-06 Vorrichtung und Verfahren zur Messung der spektralen Reflexion

Country Status (6)

Country Link
US (1) US6618141B2 (de)
EP (1) EP1213567B1 (de)
JP (1) JP3674504B2 (de)
KR (1) KR100521616B1 (de)
DE (1) DE60117667T2 (de)
TW (1) TW504570B (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
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US6987566B1 (en) * 2002-11-27 2006-01-17 Itt Manufacturing Enterprises, Inc. Methods and apparatus for analyzing mirror reflectance
JP2007523321A (ja) * 2003-12-31 2007-08-16 ユニヴァーシティー オブ サウスカロライナ 気体及び他の流体のための薄層多孔光センサ
US7304724B2 (en) * 2004-04-13 2007-12-04 The Regents Of The University Of California Method and apparatus for quantification of optical properties of superficial volumes
US20070201136A1 (en) * 2004-09-13 2007-08-30 University Of South Carolina Thin Film Interference Filter and Bootstrap Method for Interference Filter Thin Film Deposition Process Control
WO2007061436A1 (en) * 2005-11-28 2007-05-31 University Of South Carolina Self calibration methods for optical analysis system
US20070166245A1 (en) 2005-11-28 2007-07-19 Leonard Mackles Propellant free foamable toothpaste composition
US8154726B2 (en) * 2005-11-28 2012-04-10 Halliburton Energy Services, Inc. Optical analysis system and method for real time multivariate optical computing
WO2007061435A1 (en) * 2005-11-28 2007-05-31 University Of South Carolina Method of high-speed monitoring based on the use of multivariate optical elements
WO2008002903A2 (en) 2006-06-26 2008-01-03 University Of South Carolina Data validation and classification in optical analysis systems
EP2078187A2 (de) * 2006-11-02 2009-07-15 University of South Carolina Optisches multianalyt-datenverarbeitungssystem
EP2140238B1 (de) * 2007-03-30 2020-11-11 Ometric Corporation Messsysteme und -verfahren für inline-verfahren
WO2008121684A1 (en) * 2007-03-30 2008-10-09 University Of South Carolina Novel multi-analyte optical computing system
US8184295B2 (en) * 2007-03-30 2012-05-22 Halliburton Energy Services, Inc. Tablet analysis and measurement system
US8283633B2 (en) * 2007-11-30 2012-10-09 Halliburton Energy Services, Inc. Tuning D* with modified thermal detectors
US8212213B2 (en) * 2008-04-07 2012-07-03 Halliburton Energy Services, Inc. Chemically-selective detector and methods relating thereto
CN106996922B (zh) * 2016-01-25 2019-08-23 杭州海康威视数字技术股份有限公司 一种目标物体红外反射率测量方法及装置
JP6449830B2 (ja) * 2016-10-11 2019-01-09 日機装株式会社 試験装置および発光装置の製造方法
CN112656415B (zh) * 2020-12-28 2021-07-13 军事科学院军事医学研究院环境医学与作业医学研究所 基于反应时的本顿视觉保持测试装置和方法
TWI747756B (zh) * 2021-03-02 2021-11-21 國立陽明交通大學 手持式雙套筒多光譜照相儀裝置及其量測方法
CN115268121B (zh) * 2022-09-29 2022-12-09 广东欧迪明光电科技股份有限公司 一种高色域显示光谱转换板生产工艺方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2451501A (en) * 1944-09-21 1948-10-19 Liben William Specular reflectometer
US3999864A (en) * 1975-11-17 1976-12-28 International Business Machines Corporation Gloss measuring instrument
US4167316A (en) 1978-06-26 1979-09-11 Polaroid Corporation Sonar controlled lens focus apparatus
US4423736A (en) * 1981-10-13 1984-01-03 Purdue Research Foundation Method for evaluation of erythema utilizing skin reflectance measurements
US4770530A (en) * 1986-04-23 1988-09-13 Kollmorgen Corporation Remote spectrophotometer
US4761676A (en) * 1986-08-22 1988-08-02 Ati Systems Inc. Fault detection and reset in surface reflectance meter
US4886355A (en) * 1988-03-28 1989-12-12 Keane Thomas J Combined gloss and color measuring instrument
DE4343345A1 (de) * 1993-12-18 1995-06-22 Zeiss Carl Fa Verfahren und Vorrichtungen zur Messung der reflektiven bzw. transmittierenden optischen Eigenschaften einer Probe
JP3364323B2 (ja) * 1994-05-17 2003-01-08 謙 石原 非侵襲血液分析装置
US5754283A (en) * 1994-10-26 1998-05-19 Byk-Gardner Usa, Division Of Atlana Color measuring device having interchangeable optical geometries
KR20000041337A (ko) * 1998-12-22 2000-07-15 구자홍 노광기용 광원의 감시장치
US6075612A (en) * 1999-06-18 2000-06-13 N&K Technology, Inc. Optical devices having toroidal mirrors for performing reflectance measurements

Also Published As

Publication number Publication date
TW504570B (en) 2002-10-01
EP1213567A2 (de) 2002-06-12
DE60117667T2 (de) 2007-01-18
EP1213567A3 (de) 2004-05-06
KR100521616B1 (ko) 2005-10-12
EP1213567B1 (de) 2006-03-08
JP3674504B2 (ja) 2005-07-20
US6618141B2 (en) 2003-09-09
KR20020046147A (ko) 2002-06-20
US20020071118A1 (en) 2002-06-13
JP2002181698A (ja) 2002-06-26

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