DE69803343D1 - Element und Vorrichtung zur Messung der abgeschwächten Totalreflektion und diese verwendendes Verfahren zum Messen spezifischer Komponenten - Google Patents

Element und Vorrichtung zur Messung der abgeschwächten Totalreflektion und diese verwendendes Verfahren zum Messen spezifischer Komponenten

Info

Publication number
DE69803343D1
DE69803343D1 DE69803343T DE69803343T DE69803343D1 DE 69803343 D1 DE69803343 D1 DE 69803343D1 DE 69803343 T DE69803343 T DE 69803343T DE 69803343 T DE69803343 T DE 69803343T DE 69803343 D1 DE69803343 D1 DE 69803343D1
Authority
DE
Germany
Prior art keywords
measuring
total reflection
specific components
attenuated total
measuring specific
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69803343T
Other languages
English (en)
Other versions
DE69803343T2 (de
Inventor
Shinji Uchida
Hiroshi Atsuta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of DE69803343D1 publication Critical patent/DE69803343D1/de
Publication of DE69803343T2 publication Critical patent/DE69803343T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
DE1998603343 1997-08-26 1998-08-24 Element und Vorrichtung zur Messung der abgeschwächten Totalreflektion und diese verwendendes Verfahren zum Messen spezifischer Komponenten Expired - Fee Related DE69803343T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22981697A JP3770707B2 (ja) 1997-08-26 1997-08-26 減衰全反射測定装置およびそれを用いた特定成分の測定方法

Publications (2)

Publication Number Publication Date
DE69803343D1 true DE69803343D1 (de) 2002-02-28
DE69803343T2 DE69803343T2 (de) 2002-08-14

Family

ID=16898126

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1998603343 Expired - Fee Related DE69803343T2 (de) 1997-08-26 1998-08-24 Element und Vorrichtung zur Messung der abgeschwächten Totalreflektion und diese verwendendes Verfahren zum Messen spezifischer Komponenten

Country Status (4)

Country Link
US (1) US6128091A (de)
EP (1) EP0899557B1 (de)
JP (1) JP3770707B2 (de)
DE (1) DE69803343T2 (de)

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JP3887142B2 (ja) 2000-05-18 2007-02-28 矢崎総業株式会社 半嵌合検知コネクタ
US6522903B1 (en) * 2000-10-19 2003-02-18 Medoptix, Inc. Glucose measurement utilizing non-invasive assessment methods
US6951715B2 (en) * 2000-10-30 2005-10-04 Sru Biosystems, Inc. Optical detection of label-free biomolecular interactions using microreplicated plastic sensor elements
DE60231960D1 (de) * 2001-01-23 2009-05-28 Univ Dublin City Lumineszenz-detektor
EP1373863A4 (de) * 2001-03-27 2005-01-26 Euro Celtique Sa Atr-kristall-vorrichtung
US20090137888A9 (en) * 2001-04-27 2009-05-28 Berman Herbert L System for monitoring of patients
US6748250B1 (en) * 2001-04-27 2004-06-08 Medoptix, Inc. Method and system of monitoring a patient
WO2003014711A1 (fr) * 2001-08-07 2003-02-20 Mitsubishi Chemical Corporation Puce de detection a resonance de plasmon de surface et procede et dispositif d'analyse d'echantillon utilisant cette puce
US20040024541A1 (en) * 2001-08-28 2004-02-05 Shinji Uchida Apparatus for measuring information on particular component
CN1498343A (zh) * 2001-12-26 2004-05-19 松下电器产业株式会社 信息测量装置
CN1300569C (zh) * 2002-02-21 2007-02-14 松下电器产业株式会社 生物信息测量装置和生物信息测量方法
US20040225206A1 (en) * 2003-05-09 2004-11-11 Kouchnir Mikhail A. Non-invasive analyte measurement device having increased signal to noise ratios
US20050171413A1 (en) * 2004-02-04 2005-08-04 Medoptix, Inc. Integrated device for non-invasive analyte measurement
US7391516B2 (en) * 2004-03-29 2008-06-24 Matsushita Electric Industrial Co., Ltd. Optical element for measuring information of living body and device for measuring information of living body using the optical element
JP4047904B2 (ja) * 2004-05-26 2008-02-13 松下電器産業株式会社 生体情報測定用光学素子およびそれを用いた生体情報測定装置
JP4170262B2 (ja) * 2004-06-10 2008-10-22 松下電器産業株式会社 生体情報測定装置及び標準素子
US7236814B2 (en) * 2004-08-20 2007-06-26 Matsushita Electric Industrial Co., Ltd. Optical member for biological information measurement, biological information calculation apparatus, biological information calculation method, computer-executable program, and recording medium
KR100606906B1 (ko) * 2004-12-29 2006-08-01 동부일렉트로닉스 주식회사 씨모스 이미지 센서의 포토다이오드 및 그 제조방법
KR100672664B1 (ko) * 2004-12-29 2007-01-24 동부일렉트로닉스 주식회사 버티컬 씨모스 이미지 센서의 제조방법
KR100660319B1 (ko) * 2004-12-30 2006-12-22 동부일렉트로닉스 주식회사 씨모스 이미지센서 및 그의 제조방법
EP1820441A1 (de) * 2006-02-16 2007-08-22 Roche Diagnostics GmbH Mikronadelanordnung mit Sensor basierend auf der abgeschwächten Totalreflexion (ATR)
JP4957398B2 (ja) * 2007-06-15 2012-06-20 トヨタ自動車株式会社 近接場分光分析用の試料測定基板
KR101414927B1 (ko) * 2007-08-27 2014-07-07 삼성전자주식회사 생체정보 측정용 센서 및 이를 구비한 이어폰
CN101806731B (zh) * 2010-03-17 2011-11-16 哈尔滨工程大学 基于ccd和梯形玻璃体的差分式溶液浓度测量方法及装置
US8639306B2 (en) * 2011-02-07 2014-01-28 Brien Holden Vision Diagnostics, Inc. Noninvasive eye-property monitoring, including aqueous-humor glucose monitoring as an indication of blood glucose level
CN102297847B (zh) * 2011-07-29 2013-03-20 浦城正大生化有限公司 用折射计测定金霉素发酵液总糖含量的测试方法
CN103811082B (zh) * 2012-11-14 2016-07-20 中国广核集团有限公司 核电站冷凝器系统及其故障排除方法和装置
DE102013211814A1 (de) 2013-06-21 2014-12-24 Siemens Aktiengesellschaft Bildgebung durch abgeschwächte Totalreflexion (ATR)
CN103398948B (zh) * 2013-08-14 2015-09-16 武汉大学 一种用于傅里叶变换红外光谱仪的atr探头
AT515612A1 (de) * 2014-04-09 2015-10-15 Anton Paar Gmbh Umlenkprisma und Messanordnung
DE102015011687B4 (de) 2015-09-14 2023-05-11 Irubis Gmbh ATR-Reflexionselement und ATR-Spektroskopieverfahren
CN105424610B (zh) * 2015-11-10 2018-02-02 上海交通大学 一种实现探头侧壁和顶端同时测量的光纤式atr探头
US11197614B2 (en) * 2016-12-26 2021-12-14 Mitsubishi Electric Corporation Biological material measuring apparatus and method of measuring biological material
US11234648B2 (en) * 2016-12-26 2022-02-01 Mitsubishi Electric Corporation Biological material measuring apparatus

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DE304092C (de) * 1900-01-01
DE478137C (de) * 1924-09-23 1929-06-18 Brown Broveri & Cie Ag Unterfeuerung fuer UEberhitzer, Dampferzeuger, Wasservorwaermer u. dgl. mit Rueckfuehrung von Rauchgasen aus dem Abzugkanal in die Brennkammer
JPH01145785A (ja) * 1987-08-21 1989-06-07 Nec Corp 表面形状計測方法および装置
DE3830002A1 (de) * 1988-08-31 1990-03-01 Naumann Dieter Vorrichtung fuer eine bewegliche kuevette fuer vergleichende reflektionsspektroskopische messungen
US5229611A (en) * 1989-11-03 1993-07-20 Horiba, Ltd. Infrared microscopic spectrometer using the attenuated total reflection method
GB2248497B (en) * 1990-09-26 1994-05-25 Marconi Gec Ltd An optical sensor
US5172182A (en) * 1991-05-31 1992-12-15 Sting Donald W Internal reflectance element with very small sample contacting surface
DE4227813A1 (de) * 1992-08-21 1994-02-24 Kim Yoon Ok Vorrichtung zur qualitativen und/oder quantitativen Bestimmung einer zu analysierenden Probe
JPH07184883A (ja) * 1993-12-27 1995-07-25 Satoshi Yoshida 生体表面測定装置
DE4425445A1 (de) * 1994-07-19 1996-01-25 Herbert Reinl Verfahren zur Messung der Permeationskinetik und des Transportes von Substanzen durch Hautschichten
DE69530473T2 (de) * 1995-03-03 2003-11-20 Perkin Elmer Ltd ATR-Kristallträger (abgeschwächte Totalreflexion) für Infrarotmikrospektroskopie
JPH09113439A (ja) * 1995-10-20 1997-05-02 Kdk Corp 生体成分測定方法及びこれを用いた生体成分測定装置

Also Published As

Publication number Publication date
EP0899557B1 (de) 2002-01-02
JP3770707B2 (ja) 2006-04-26
EP0899557A3 (de) 1999-07-28
US6128091A (en) 2000-10-03
DE69803343T2 (de) 2002-08-14
JPH1164216A (ja) 1999-03-05
EP0899557A2 (de) 1999-03-03

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Representative=s name: JUNG, SCHIRDEWAHN, GRUENBERG, SCHNEIDER PATENTANWAELTE

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Representative=s name: ADVOTEC. PATENT- UND RECHTSANWAELTE, 80538 MUENCHE

8339 Ceased/non-payment of the annual fee