DE60038994D1 - Etalon Spektrometer mit doppeltem Strahldurchgang - Google Patents

Etalon Spektrometer mit doppeltem Strahldurchgang

Info

Publication number
DE60038994D1
DE60038994D1 DE60038994T DE60038994T DE60038994D1 DE 60038994 D1 DE60038994 D1 DE 60038994D1 DE 60038994 T DE60038994 T DE 60038994T DE 60038994 T DE60038994 T DE 60038994T DE 60038994 D1 DE60038994 D1 DE 60038994D1
Authority
DE
Germany
Prior art keywords
etalon
transmitted
spectrometer
beam passage
double beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60038994T
Other languages
English (en)
Inventor
Alexander I Ershov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cymer Inc
Original Assignee
Cymer Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cymer Inc filed Critical Cymer Inc
Application granted granted Critical
Publication of DE60038994D1 publication Critical patent/DE60038994D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0224—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using polarising or depolarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE60038994T 1999-02-04 2000-02-03 Etalon Spektrometer mit doppeltem Strahldurchgang Expired - Lifetime DE60038994D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/245,134 US6243170B1 (en) 1999-02-04 1999-02-04 Double pass etalon spectrometer

Publications (1)

Publication Number Publication Date
DE60038994D1 true DE60038994D1 (de) 2008-07-10

Family

ID=22925424

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60038994T Expired - Lifetime DE60038994D1 (de) 1999-02-04 2000-02-03 Etalon Spektrometer mit doppeltem Strahldurchgang

Country Status (7)

Country Link
US (1) US6243170B1 (de)
EP (1) EP1026487B1 (de)
JP (1) JP3624783B2 (de)
KR (1) KR100356108B1 (de)
AT (1) ATE397201T1 (de)
DE (1) DE60038994D1 (de)
TW (1) TW459125B (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6580517B2 (en) 2000-03-01 2003-06-17 Lambda Physik Ag Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp
US6160832A (en) 1998-06-01 2000-12-12 Lambda Physik Gmbh Method and apparatus for wavelength calibration
US7006541B2 (en) * 1998-06-01 2006-02-28 Lambda Physik Ag Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp
US6597462B2 (en) 2000-03-01 2003-07-22 Lambda Physik Ag Laser wavelength and bandwidth monitor
US6819429B2 (en) * 2000-04-07 2004-11-16 Exfo Electro-Optical Engineering Inc. Multi-pass optical spectrum analyzer having a polarization-dependent tunable filter
US6807205B1 (en) 2000-07-14 2004-10-19 Lambda Physik Ag Precise monitor etalon calibration technique
US6747741B1 (en) * 2000-10-12 2004-06-08 Lambda Physik Ag Multiple-pass interferometric device
US20030161374A1 (en) * 2001-11-21 2003-08-28 Lambda Physik Ag High-resolution confocal Fabry-Perot interferometer for absolute spectral parameter detection of excimer laser used in lithography applications
US6788726B2 (en) * 2002-02-26 2004-09-07 New Focus, Inc. External cavity laser with high spectral purity output
AU2002251525A1 (en) * 2002-04-23 2003-11-10 Hiromu Maeda Small packaged spectroscopic sensor unit
US6741348B2 (en) 2002-04-29 2004-05-25 The Curators Of The University Of Missouri Ultrasensitive spectrophotometer
TWI238269B (en) * 2002-06-07 2005-08-21 Delta Electronics Inc Fabry-Perot optical filter device
US20040071181A1 (en) * 2002-10-15 2004-04-15 Rong Huang Retro-reflective etalon and the devices using the same
US20040141182A1 (en) * 2002-12-16 2004-07-22 Thomas Schroder Monitoring of spectral purity and advanced spectral characteristics of a narrow bandwidth excimer laser
US7050215B1 (en) 2003-08-01 2006-05-23 Ball Aerospace & Technologies Corp. Method and apparatus for providing a gas correlation filter for remote sensing of atmospheric trace gases
US7030991B1 (en) * 2003-08-01 2006-04-18 Ball Aerospace & Technologies Corp. Field condensing imaging system for remote sensing of atmospheric trace gases
US7268881B2 (en) * 2004-02-17 2007-09-11 The Curators Of The University Of Missouri Light scattering detector
US7903252B2 (en) * 2005-01-13 2011-03-08 The Curators Of The University Of Missouri Noise cancellation in fourier transform spectrophotometry
KR20090004926A (ko) 2006-03-09 2009-01-12 올테크 어소시에이츠, 인크. 복합 관형 부재, 관형 부재, 드리프트 튜브, 카트리지/임팩터 조립체, 카트리지, 전자 회로, 증기화 광 산란 검출기, 테스트 샘플 분석 방법 및 입력된 전압 신호 처리 방법
US7817274B2 (en) 2007-10-05 2010-10-19 Jingyun Zhang Compact spectrometer
WO2009070459A1 (en) 2007-11-30 2009-06-04 Jingyun Zhang Miniature spectrometers working with cellular phones and other portable electronic devices
US20110083493A1 (en) * 2008-06-11 2011-04-14 The Curators Of The University Of Missouri Liquid Chromatography Detector and Flow Controller Therefor
DE102008050867B4 (de) 2008-09-30 2011-12-08 Carl Zeiss Laser Optics Gmbh Verfahren zum Messen eines Spektrums einer schmalbandigen Lichtquelle sowie Spektrometeranordnung
JP5502623B2 (ja) * 2010-07-07 2014-05-28 浜松ホトニクス株式会社 分光装置
US8599381B2 (en) 2011-01-19 2013-12-03 Massachusetts Institute Of Technology Gas detector for atmospheric species detection
JP5634291B2 (ja) * 2011-02-10 2014-12-03 アンリツ株式会社 光スペクトラム測定装置及び光スペクトラム測定方法
US9846079B2 (en) * 2015-09-17 2017-12-19 The United States Of America As Represented By The Administrator Of Nasa Recirculating etalon spectrometer
MX2018009833A (es) * 2016-02-12 2018-09-11 Massachusetts Gen Hospital Sistema para realizar una espectroscopia.
EP3921612A4 (de) 2019-02-06 2022-11-02 California Institute of Technology Kompaktes hyperspektrales mittelinfrarot-spektrometer
US11313722B2 (en) 2019-11-08 2022-04-26 California Institute Of Technology Infrared spectrometer having dielectric-polymer-based spectral filter

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3729261A (en) 1971-06-21 1973-04-24 Rca Corp Stabilized multipass interferometer
US4005937A (en) * 1974-11-26 1977-02-01 Allied Chemical Corporation Simultaneous interferometric transmission of periodic spectral components
JPS5331027B2 (de) * 1975-02-24 1978-08-30
JPS62203024A (ja) 1986-03-04 1987-09-07 Canon Inc フアブリ・ペロ−分光装置
US4850709A (en) * 1986-03-04 1989-07-25 Canon Kabushiki Kaisha Fabri-perot spectroscopy method and apparatus utilizing the same
US5025445A (en) 1989-11-22 1991-06-18 Cymer Laser Technologies System for, and method of, regulating the wavelength of a light beam
JPH03173486A (ja) 1989-12-01 1991-07-26 Toshiba Corp 狭帯域化レーザ装置
US5243614A (en) * 1990-11-28 1993-09-07 Mitsubishi Denki Kabushiki Kaisha Wavelength stabilizer for narrow bandwidth laser
JP2997956B2 (ja) 1991-06-27 2000-01-11 株式会社小松製作所 波長検出装置
US5450207A (en) 1993-07-16 1995-09-12 Cymer Laser Technologies Method and apparatus for calibrating a laser wavelength control mechanism
JPH10300587A (ja) 1997-04-30 1998-11-13 Nikon Corp 波長測定装置及び方法

Also Published As

Publication number Publication date
EP1026487A3 (de) 2000-12-13
TW459125B (en) 2001-10-11
KR100356108B1 (ko) 2002-10-19
JP3624783B2 (ja) 2005-03-02
EP1026487B1 (de) 2008-05-28
US6243170B1 (en) 2001-06-05
JP2000283847A (ja) 2000-10-13
EP1026487A2 (de) 2000-08-09
KR20000057929A (ko) 2000-09-25
ATE397201T1 (de) 2008-06-15

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