DE60037595D1 - Vorrichtung zur zerstörungsfreien prüfung - Google Patents

Vorrichtung zur zerstörungsfreien prüfung

Info

Publication number
DE60037595D1
DE60037595D1 DE60037595T DE60037595T DE60037595D1 DE 60037595 D1 DE60037595 D1 DE 60037595D1 DE 60037595 T DE60037595 T DE 60037595T DE 60037595 T DE60037595 T DE 60037595T DE 60037595 D1 DE60037595 D1 DE 60037595D1
Authority
DE
Germany
Prior art keywords
destructive testing
destructive
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60037595T
Other languages
English (en)
Other versions
DE60037595T2 (de
Inventor
Yutaka Ochiai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE60037595D1 publication Critical patent/DE60037595D1/de
Application granted granted Critical
Publication of DE60037595T2 publication Critical patent/DE60037595T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/10—Power supply arrangements for feeding the X-ray tube
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/02—Electron guns
    • H01J3/028—Replacing parts of the gun; Relative adjustment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/025—X-ray tubes with structurally associated circuit elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/066—Details of electron optical components, e.g. cathode cups
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • H05G1/04—Mounting the X-ray tube within a closed housing
    • H05G1/06—X-ray tube and at least part of the power supply apparatus being mounted within the same housing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • X-Ray Techniques (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE60037595T 1999-10-29 2000-10-27 Vorrichtung zur zerstörungsfreien prüfung Expired - Lifetime DE60037595T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP30983599 1999-10-29
JP30983599A JP3934836B2 (ja) 1999-10-29 1999-10-29 非破壊検査装置
PCT/JP2000/007561 WO2001033920A1 (fr) 1999-10-29 2000-10-27 Appareil d'inspection non destructive

Publications (2)

Publication Number Publication Date
DE60037595D1 true DE60037595D1 (de) 2008-02-07
DE60037595T2 DE60037595T2 (de) 2008-12-11

Family

ID=17997851

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60037595T Expired - Lifetime DE60037595T2 (de) 1999-10-29 2000-10-27 Vorrichtung zur zerstörungsfreien prüfung

Country Status (9)

Country Link
US (1) US6600809B1 (de)
EP (1) EP1233659B1 (de)
JP (1) JP3934836B2 (de)
KR (1) KR100587619B1 (de)
CN (1) CN1161603C (de)
AU (1) AU7960900A (de)
DE (1) DE60037595T2 (de)
TW (1) TW466532B (de)
WO (1) WO2001033920A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101115344A (zh) * 2003-02-20 2008-01-30 因普有限公司 产生x射线的系统
JP4664025B2 (ja) * 2004-09-02 2011-04-06 浜松ホトニクス株式会社 Ｘ線源
US7885386B2 (en) * 2006-03-31 2011-02-08 General Electric Company Systems and apparatus for a compact low power X-ray generator
JP2009068973A (ja) * 2007-09-12 2009-04-02 Hamamatsu Photonics Kk 電子線照射装置
JP5153537B2 (ja) * 2008-09-17 2013-02-27 Ｔｄｋラムダ株式会社 スイッチング電源装置
JP5406595B2 (ja) * 2009-05-21 2014-02-05 株式会社日立製作所 電子線源用フィラメント構造体
EP2556525B1 (de) * 2010-04-09 2018-08-22 GE Sensing & Inspection Technologies GmbH Mikrofokus-röntgenröhre mit kathodenelement und verfahren damit
US8675817B2 (en) 2010-07-30 2014-03-18 Rigaku Corporation Industrial X-ray generator
US8903047B1 (en) * 2010-11-02 2014-12-02 Moxtek, Inc. High voltage circuit with arc protection
WO2014050931A1 (ja) * 2012-09-26 2014-04-03 株式会社ニコン Ｘ線装置、及び構造物の製造方法
CN102891059B (zh) * 2012-10-31 2015-12-09 丹东奥龙射线仪器集团有限公司 开放式微焦点x射线管
DE102015213810B4 (de) * 2015-07-22 2021-11-25 Siemens Healthcare Gmbh Hochspannungszuführung für einen Röntgenstrahler
JP7502359B2 (ja) * 2022-03-29 2024-06-18 日本電子株式会社 荷電粒子線源および荷電粒子線装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2202687A (en) * 1936-12-16 1940-05-28 Philips Nv High-voltage discharge tube
US3812366A (en) * 1971-03-08 1974-05-21 Watkins Johnson Co Composite x-ray tube/transformer assembly
DE2537019B2 (de) * 1975-08-20 1980-11-06 Philips Patentverwaltung Gmbh, 2000 Hamburg Einen Röntgenstrahier, bestehend aus Röntgenröhre und Röhrengehäuse, oder eine Röntgenröhre mit Metallkolben enthaltende Anordnung
JPS5814499A (ja) 1981-07-20 1983-01-27 Toshiba Corp Ｘ線発生装置
US4521902A (en) * 1983-07-05 1985-06-04 Ridge, Inc. Microfocus X-ray system
JPH06188092A (ja) 1992-12-17 1994-07-08 Hitachi Ltd Ｘ線発生用タ−ゲットとｘ線源とｘ線撮像装置
JPH08162285A (ja) 1994-10-03 1996-06-21 Rigaku Corp 回転対陰極ｘ線管、ｘ線発生装置、およびｘ線発生装置の組立方法
DE19509516C1 (de) 1995-03-20 1996-09-26 Medixtec Gmbh Medizinische Ger Mikrofokus-Röntgeneinrichtung
JP3717239B2 (ja) 1996-07-19 2005-11-16 株式会社リガク Ｘ線発生装置

Also Published As

Publication number Publication date
EP1233659A4 (de) 2006-05-03
EP1233659B1 (de) 2007-12-26
CN1387744A (zh) 2002-12-25
JP2001135497A (ja) 2001-05-18
DE60037595T2 (de) 2008-12-11
TW466532B (en) 2001-12-01
JP3934836B2 (ja) 2007-06-20
AU7960900A (en) 2001-05-14
KR20020060722A (ko) 2002-07-18
WO2001033920A1 (fr) 2001-05-10
CN1161603C (zh) 2004-08-11
US6600809B1 (en) 2003-07-29
EP1233659A1 (de) 2002-08-21
KR100587619B1 (ko) 2006-06-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition