DE4007978C2 - - Google Patents

Info

Publication number
DE4007978C2
DE4007978C2 DE19904007978 DE4007978A DE4007978C2 DE 4007978 C2 DE4007978 C2 DE 4007978C2 DE 19904007978 DE19904007978 DE 19904007978 DE 4007978 A DE4007978 A DE 4007978A DE 4007978 C2 DE4007978 C2 DE 4007978C2
Authority
DE
Germany
Prior art keywords
level
enable signal
low
output
variable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19904007978
Other languages
German (de)
English (en)
Other versions
DE4007978A1 (de
Inventor
Christopher W. Hillsboro Oreg. Us Branson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Credence Systems Corp
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of DE4007978A1 publication Critical patent/DE4007978A1/de
Application granted granted Critical
Publication of DE4007978C2 publication Critical patent/DE4007978C2/de
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16Modifications for eliminating interference voltages or currents
    • H03K17/161Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/162Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/693Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0005Modifications of input or output impedance
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175Coupling arrangements; Interface arrangements
    • H03K19/0185Coupling arrangements; Interface arrangements using field effect transistors only
    • H03K19/018557Coupling arrangements; Impedance matching circuits
    • H03K19/018571Coupling arrangements; Impedance matching circuits of complementary type, e.g. CMOS

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
DE19904007978 1989-03-17 1990-03-13 Ausgangstreiber-schaltungsanordnung zur minimierung von uebergangsimpedanzschwankungen und verfahren zur minimierung von impedanzfehlanpassungen Granted DE4007978A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US32526389A 1989-03-17 1989-03-17

Publications (2)

Publication Number Publication Date
DE4007978A1 DE4007978A1 (de) 1990-09-20
DE4007978C2 true DE4007978C2 (enExample) 1993-08-05

Family

ID=23267137

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19904007978 Granted DE4007978A1 (de) 1989-03-17 1990-03-13 Ausgangstreiber-schaltungsanordnung zur minimierung von uebergangsimpedanzschwankungen und verfahren zur minimierung von impedanzfehlanpassungen

Country Status (3)

Country Link
JP (1) JPH07109984B2 (enExample)
DE (1) DE4007978A1 (enExample)
FR (1) FR2644650B1 (enExample)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61170130A (ja) * 1985-01-24 1986-07-31 Seikosha Co Ltd 出力インバ−タの貫通電流防止回路
US4707620A (en) * 1986-07-22 1987-11-17 Tektronix, Inc. Adjustable impedance driver network
US4712058A (en) * 1986-07-22 1987-12-08 Tektronix, Inc. Active load network

Also Published As

Publication number Publication date
DE4007978A1 (de) 1990-09-20
JPH02280522A (ja) 1990-11-16
FR2644650B1 (fr) 1993-07-16
FR2644650A1 (fr) 1990-09-21
JPH07109984B2 (ja) 1995-11-22

Similar Documents

Publication Publication Date Title
DE60111263T2 (de) Kalibrierung von einseitig abgeschlossenen kanälen zur erzielung differentielles signal-niveau
DE10082751C2 (de) Zeitkalibrierverfahren für IC-Tester und das Kalibrierverfahren verwendender IC-Tester mit Kalibrierfunktion
DE69431266T2 (de) Pufferschaltungen
DE3637145C2 (enExample)
DE19780110C2 (de) Vergleichsschaltung für ein Halbleitertestsystem
DE2658611A1 (de) Vorrichtung zur erzeugung und zum empfang von digitalwoertern
DE112004002222T5 (de) Taktwiedergewinnungsschaltung und Kommunikationsvorrichtung
DE10212950B4 (de) Pegelwandler, Signalwandlungsvorrichtung und Signalwandlungsverfahren
DE3712780A1 (de) Verfahren und vorrichtung zur messung der laenge einer elektrischen leitung
DE102006053281B4 (de) Halbleiterbauelement, Testsystem und ODT-Testverfahren
DE10002370A1 (de) LSI-Testvorrichtung, sowie Zeitverhaltenkalibrierverfahren zur Verwendung hiermit
DE3428580C2 (enExample)
DE60002079T2 (de) Verfahren und apparat zum test von impedanz-kontrolliertem i/o buffer auf höchst effiziente weise
DE2146304A1 (de) Schaltung zur Prüfung elektrischer Schaltelemente durch Impulstastung
DE10048895A1 (de) Testverfahren und -vorrichtung für quellensynchrone Signale
DE1226635B (de) Verfahren und Schaltungsanordnung zur Fest-stellung fehlerhafter Impulsregenerierverstaerker
DE2917126C2 (de) Verfahren zum Prüfen einer integrierten Schaltung und Anordnung zur Durchführung des Verfahrens
DE69128509T2 (de) Zeitgeber
EP1176607A2 (de) Verfahrenund Vorrichtung zum Testen von Setup-Zeit und Hold-Zeit von Signalen einer Schaltung mit getakteter Datenübertragung
DE60008800T2 (de) Programmierbare pufferschaltung
DE112006001444T5 (de) Gegenkopplungsschaltung und Verfahren und Vorrichtung zur Realisierung von Impedanzanpassung auf dem Chip für eine Übertragungsleitung mittels derselben
DE4007978C2 (enExample)
DE19528733C1 (de) Integrierte Schaltung
DE3715163A1 (de) Elektrische pruefschaltung
EP1020733B1 (de) Integrierte Halbleiterschaltung zur Funktionsüberprüfung von Pad-Zellen

Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: CREDENCE SYSTEMS CORP. (N.D.GESETZEN D.STAATES DEL

8339 Ceased/non-payment of the annual fee