DE3920219A1 - Betrieb eines optischen detektors bzw. optischer detektor geeignet fuer diesen betrieb - Google Patents
Betrieb eines optischen detektors bzw. optischer detektor geeignet fuer diesen betriebInfo
- Publication number
- DE3920219A1 DE3920219A1 DE3920219A DE3920219A DE3920219A1 DE 3920219 A1 DE3920219 A1 DE 3920219A1 DE 3920219 A DE3920219 A DE 3920219A DE 3920219 A DE3920219 A DE 3920219A DE 3920219 A1 DE3920219 A1 DE 3920219A1
- Authority
- DE
- Germany
- Prior art keywords
- layer
- optical detector
- active
- detector
- active layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/147—Shapes of bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
- H10F30/223—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PIN barrier
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
- H10F30/227—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a Schottky barrier
Landscapes
- Light Receiving Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3920219A DE3920219A1 (de) | 1989-06-21 | 1989-06-21 | Betrieb eines optischen detektors bzw. optischer detektor geeignet fuer diesen betrieb |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3920219A DE3920219A1 (de) | 1989-06-21 | 1989-06-21 | Betrieb eines optischen detektors bzw. optischer detektor geeignet fuer diesen betrieb |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3920219A1 true DE3920219A1 (de) | 1991-01-10 |
| DE3920219C2 DE3920219C2 (enExample) | 1993-07-29 |
Family
ID=6383188
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE3920219A Granted DE3920219A1 (de) | 1989-06-21 | 1989-06-21 | Betrieb eines optischen detektors bzw. optischer detektor geeignet fuer diesen betrieb |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3920219A1 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10040459A1 (de) * | 2000-08-18 | 2002-03-21 | Infineon Technologies Ag | PIN-Fotodiode in einer vertikal strukturierten Schichtenfolge und Verfahren zur Herstellung einer PIN-Diode |
| US6553157B2 (en) | 1999-09-07 | 2003-04-22 | Infineon Technologies Ag | Optoelectronic microelectronic system |
| WO2008145829A1 (en) * | 2007-05-31 | 2008-12-04 | Teknillinen Korkeakoulu | Absolute radiation power measurement |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2986591A (en) * | 1955-10-17 | 1961-05-30 | Ibm | Photovoltaic cell |
| US3508126A (en) * | 1964-08-19 | 1970-04-21 | Philips Corp | Semiconductor photodiode with p-n junction spaced from heterojunction |
| US3873828A (en) * | 1973-08-23 | 1975-03-25 | Hughes Aircraft Co | Integrated optical detector |
| DE2524769A1 (de) * | 1974-06-12 | 1976-01-02 | Philips Nv | Photodiode |
| US4174561A (en) * | 1976-02-09 | 1979-11-20 | Semicon, Inc. | Method of fabricating high intensity solar energy converter |
| DE3215083A1 (de) * | 1981-04-24 | 1982-11-18 | Western Electric Co., Inc., 10038 New York, N.Y. | Majoritaetsladungstraeger-photodetektor |
| DE3534483A1 (de) * | 1985-09-27 | 1987-04-02 | Battelle Institut E V | Halbleiter-photoleitungsdetektor |
| EP0260052A2 (en) * | 1986-09-11 | 1988-03-16 | AT&T Corp. | Semiconductor device including ordered layers |
-
1989
- 1989-06-21 DE DE3920219A patent/DE3920219A1/de active Granted
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2986591A (en) * | 1955-10-17 | 1961-05-30 | Ibm | Photovoltaic cell |
| US3508126A (en) * | 1964-08-19 | 1970-04-21 | Philips Corp | Semiconductor photodiode with p-n junction spaced from heterojunction |
| US3873828A (en) * | 1973-08-23 | 1975-03-25 | Hughes Aircraft Co | Integrated optical detector |
| DE2524769A1 (de) * | 1974-06-12 | 1976-01-02 | Philips Nv | Photodiode |
| US4174561A (en) * | 1976-02-09 | 1979-11-20 | Semicon, Inc. | Method of fabricating high intensity solar energy converter |
| DE3215083A1 (de) * | 1981-04-24 | 1982-11-18 | Western Electric Co., Inc., 10038 New York, N.Y. | Majoritaetsladungstraeger-photodetektor |
| DE3534483A1 (de) * | 1985-09-27 | 1987-04-02 | Battelle Institut E V | Halbleiter-photoleitungsdetektor |
| EP0260052A2 (en) * | 1986-09-11 | 1988-03-16 | AT&T Corp. | Semiconductor device including ordered layers |
Non-Patent Citations (11)
| Title |
|---|
| BAN, Vladimir S.: InGaAsP:The Next Generation in Photonics MaterialsIn: Solid State Technology, Febr. 1987, S.99-105 * |
| DE-Z: Schnelle Pin-Fotodioden. In: Funkschau 19, 1982, S.74 * |
| DOLLAR * |
| et al.: A monolithic GalnAsP/InP Photovoltaic Power Converter. In: IEEE Trans- actions on Electron Devices. Vol. ED-29, No.9, Sept. 1982, S.1449-1454 * |
| FUDURICH, Richard L.: Theoretical optimization and parametric study of n-on-p Alx-Ga1-xAs-GaAs graded band-gap solar cellIn: Journal of Applied Physics, Vol.47, No.7, July1976, S.3152-3158 * |
| GB-Z: DIAKIUK, V. * |
| GROVES, S.H.: Double-hetero- strukture InGaAs/InP PIN Photodetectors.In: Solid-State Electronics, Vol.29, 1986, S.229-233 * |
| US-Z: CHEO, P.K.: Optical waveguides and devices. In: J.Vac.Sci.Technol., Vol.12, No.4, July/Aug. 1975, S.916-918 * |
| US-Z: HUTCHBY, James A. * |
| US-Z: OLSEN, Gregory H. * |
| US-Z: WILLIE W. NG. * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6553157B2 (en) | 1999-09-07 | 2003-04-22 | Infineon Technologies Ag | Optoelectronic microelectronic system |
| DE10040459A1 (de) * | 2000-08-18 | 2002-03-21 | Infineon Technologies Ag | PIN-Fotodiode in einer vertikal strukturierten Schichtenfolge und Verfahren zur Herstellung einer PIN-Diode |
| WO2008145829A1 (en) * | 2007-05-31 | 2008-12-04 | Teknillinen Korkeakoulu | Absolute radiation power measurement |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3920219C2 (enExample) | 1993-07-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8127 | New person/name/address of the applicant |
Owner name: LICENTIA PATENT-VERWALTUNGS-GMBH, 6000 FRANKFURT, |
|
| 8120 | Willingness to grant licences paragraph 23 | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |