DE3887953D1 - Verfahren und Vorrichtung zum Nachweis von Ungleichheiten in der zyklischen Länge von gedruckten Mustern. - Google Patents

Verfahren und Vorrichtung zum Nachweis von Ungleichheiten in der zyklischen Länge von gedruckten Mustern.

Info

Publication number
DE3887953D1
DE3887953D1 DE88116887T DE3887953T DE3887953D1 DE 3887953 D1 DE3887953 D1 DE 3887953D1 DE 88116887 T DE88116887 T DE 88116887T DE 3887953 T DE3887953 T DE 3887953T DE 3887953 D1 DE3887953 D1 DE 3887953D1
Authority
DE
Germany
Prior art keywords
inequalities
detecting
printed patterns
cyclic length
cyclic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88116887T
Other languages
English (en)
Other versions
DE3887953T2 (de
Inventor
Ryuji - Ohnishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Futec Inc
Original Assignee
Futec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Futec Inc filed Critical Futec Inc
Application granted granted Critical
Publication of DE3887953D1 publication Critical patent/DE3887953D1/de
Publication of DE3887953T2 publication Critical patent/DE3887953T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F33/00—Indicating, counting, warning, control or safety devices
    • B41F33/0036—Devices for scanning or checking the printed matter for quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/993—Evaluation of the quality of the acquired pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896—Circuits specially adapted for system specific signal conditioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30144—Printing quality

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Multimedia (AREA)
  • Biochemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
DE3887953T 1987-10-15 1988-10-12 Verfahren und Vorrichtung zum Nachweis von Ungleichheiten in der zyklischen Länge von gedruckten Mustern. Expired - Fee Related DE3887953T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62260157A JP2539856B2 (ja) 1987-10-15 1987-10-15 印刷パタ―ン周期長のずれ検知方法

Publications (2)

Publication Number Publication Date
DE3887953D1 true DE3887953D1 (de) 1994-03-31
DE3887953T2 DE3887953T2 (de) 1994-08-25

Family

ID=17344108

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3887953T Expired - Fee Related DE3887953T2 (de) 1987-10-15 1988-10-12 Verfahren und Vorrichtung zum Nachweis von Ungleichheiten in der zyklischen Länge von gedruckten Mustern.

Country Status (5)

Country Link
US (1) US5060281A (de)
EP (1) EP0311990B1 (de)
JP (1) JP2539856B2 (de)
DE (1) DE3887953T2 (de)
IE (1) IE61546B1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI85308C (fi) * 1990-06-07 1992-03-25 Rautaruukki Oy Foerfarande och anordning foer optisk granskning av ark- och banformiga produkter.
DE69231408T2 (de) * 1991-05-14 2001-02-15 Canon K.K., Tokio/Tokyo Verfahren und Vorrichtung zur Druckschätzung
CH684590A5 (de) * 1991-09-26 1994-10-31 Grapha Holding Ag Verfahren zur Einheitlichkeitsprüfung von Druckbogen und Vorrichtung zur Durchführung desselben.
US5452368A (en) * 1993-08-02 1995-09-19 Motorola, Inc. Method of detecting defects in semiconductor package leads
EP0816554B1 (de) * 1996-06-26 2003-04-02 Mahlo GmbH & Co. KG Verfahren zur Verzugskorrektur
DE19640023B4 (de) * 1996-06-26 2006-06-29 Mahlo Gmbh & Co Kg Verfahren zur Verzugskorrektur
WO1998015919A1 (fr) * 1996-10-09 1998-04-16 Dai Nippon Printing Co., Ltd. Procede et appareil de detection de defauts de raies sur des documents imprimes
KR100295814B1 (ko) 1997-06-05 2001-10-24 윤종용 작은용지의퀵(Quick)스캐닝방법

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4136332A (en) * 1976-01-30 1979-01-23 Hitachi, Ltd. Device for detecting displacement between patterns
JPS53110547A (en) * 1977-03-08 1978-09-27 Omron Tateisi Electronics Co Printing drop-out detection method
US4349880A (en) * 1979-03-19 1982-09-14 Rca Corporation Inspection system for detecting defects in regular patterns
GB2159622B (en) * 1981-07-29 1986-05-21 Dainippon Printing Co Ltd Print inspecting method
GB2115145B (en) * 1981-07-29 1986-05-29 Dainippon Printing Co Ltd Method and device for inspecting printed matter
JPS59226981A (ja) * 1983-06-08 1984-12-20 Fujitsu Ltd パタ−ンマツチング方法および装置
EP0135597B1 (de) * 1983-09-23 1987-07-22 Ibm Deutschland Gmbh Verfahren und Einrichtung zum gegenseitigen Ausrichten von Objekten
JPS6083328A (ja) * 1983-10-13 1985-05-11 Fujitsu Ltd フオトマスクの検査方法
JPS62138740A (ja) * 1985-12-13 1987-06-22 Hiyuutec:Kk シ−ト面の欠陥検出方法
JPH0621769B2 (ja) * 1985-12-13 1994-03-23 大日本スクリ−ン製造株式会社 パタ−ン欠陥検出方法およびその装置
US4835720A (en) * 1986-03-11 1989-05-30 Adolph Coors Company Obstructed-field-indicia-sensing device

Also Published As

Publication number Publication date
IE61546B1 (en) 1994-11-16
JPH01101406A (ja) 1989-04-19
DE3887953T2 (de) 1994-08-25
JP2539856B2 (ja) 1996-10-02
EP0311990A3 (en) 1990-05-30
US5060281A (en) 1991-10-22
EP0311990B1 (de) 1994-02-23
EP0311990A2 (de) 1989-04-19
IE883067L (en) 1989-04-15

Similar Documents

Publication Publication Date Title
DE3886683D1 (de) Verfahren und Vorrichtung zum Erfassen von Tinten.
DE3877815D1 (de) Verfahren und vorrichtung zum messen von fluessigkeit.
DE3676798D1 (de) Verfahren und vorrichtung zum verfestigen von verbundwerkstoffen.
DE3687220D1 (de) Verfahren und vorrichtung zur detektion von musterfehlern.
DE3674656D1 (de) Verfahren und vorrichtung zum filtern.
DE3850792D1 (de) Verfahren und Vorrichtung zum Filtrieren.
DE69013203D1 (de) Verfahren und Vorrichtung zum Überbringen von Plättchen.
DE3764803D1 (de) Verfahren und vorrichtung zum feststellen der identitaet und stellung von gegenstaenden.
DE3781628D1 (de) Verfahren und vorrichtung zum filtrieren.
DE3775417D1 (de) Verfahren und vorrichtung zum nachweis von musterfehlern fuer mikroelektronische anordnungen.
DE3888522D1 (de) Vorrichtung und verfahren zum filtrieren.
DE3851329D1 (de) Verfahren und vorrichtung zum sammeln von blutmustern.
DE3773770D1 (de) Verfahren und vorrichtung zum behandeln von oberflaechen.
DE59008889D1 (de) Verfahren und Vorrichtung zum Bedrucken von Objekten.
DE3863895D1 (de) Verfahren und vorrichtung zur erzielung von seismischen messwerten.
DE3673917D1 (de) Verfahren und vorrichtung zum absoluten wegmessen.
DE3672027D1 (de) Verfahren und vorrichtung zum ausrichten.
DE3689277D1 (de) Verfahren und vorrichtung zum adaptieren der auflösung von vorlagen.
DE3870655D1 (de) Vorrichtung und verfahren zum pressspritzen.
DE3771416D1 (de) Verfahren und vorrichtung zum mikroloeten.
DE68914776D1 (de) Vorrichtung und Verfahren zum Erfassen der Echtheit von Banknoten.
DE3668305D1 (de) Verfahren und vorrichtung zum ausrichten von gegenstaenden.
DE3782382D1 (de) Vorrichtung und verfahren zum zerteilen von schlacke.
DE3776821D1 (de) Vorrichtung und verfahren zum beschichten.
DE3775645D1 (de) Verfahren und vorrichtung zum reinigen von gold.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee