DE3878297D1 - Beruehrungslose bestimmung der lage eines geradlinigen merkmals eines gegenstandes. - Google Patents

Beruehrungslose bestimmung der lage eines geradlinigen merkmals eines gegenstandes.

Info

Publication number
DE3878297D1
DE3878297D1 DE8888200772T DE3878297T DE3878297D1 DE 3878297 D1 DE3878297 D1 DE 3878297D1 DE 8888200772 T DE8888200772 T DE 8888200772T DE 3878297 T DE3878297 T DE 3878297T DE 3878297 D1 DE3878297 D1 DE 3878297D1
Authority
DE
Germany
Prior art keywords
mean value
zone
elements
camera
bright
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888200772T
Other languages
English (en)
Other versions
DE3878297T2 (de
Inventor
Bruce Robert Morrison
John Stuart Henry Lake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
John Lysaght Australia Pty Ltd
Original Assignee
John Lysaght Australia Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27157362&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3878297(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by John Lysaght Australia Pty Ltd filed Critical John Lysaght Australia Pty Ltd
Application granted granted Critical
Publication of DE3878297D1 publication Critical patent/DE3878297D1/de
Publication of DE3878297T2 publication Critical patent/DE3878297T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/04—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Control And Safety Of Cranes (AREA)
  • Image Analysis (AREA)
  • Testing Of Coins (AREA)
  • Sorting Of Articles (AREA)
  • Control Of Metal Rolling (AREA)
  • Control Of Position Or Direction (AREA)
  • Image Processing (AREA)
  • Automobile Manufacture Line, Endless Track Vehicle, Trailer (AREA)
DE8888200772T 1987-04-22 1988-04-21 Beruehrungslose bestimmung der lage eines geradlinigen merkmals eines gegenstandes. Expired - Lifetime DE3878297D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AUPI153687 1987-04-22
AUPI312487 1987-07-14
AUPI312387 1987-07-14

Publications (2)

Publication Number Publication Date
DE3878297D1 true DE3878297D1 (de) 1993-03-25
DE3878297T2 DE3878297T2 (de) 1993-08-12

Family

ID=27157362

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888200772T Expired - Lifetime DE3878297D1 (de) 1987-04-22 1988-04-21 Beruehrungslose bestimmung der lage eines geradlinigen merkmals eines gegenstandes.

Country Status (11)

Country Link
US (1) US5033096A (de)
EP (1) EP0289084B2 (de)
JP (1) JPH0799322B2 (de)
KR (1) KR960010674B1 (de)
AT (1) ATE85702T1 (de)
AU (1) AU597485B2 (de)
BR (1) BR8801911A (de)
CA (1) CA1320548C (de)
DE (1) DE3878297D1 (de)
ES (1) ES2037198T3 (de)
NZ (1) NZ224323A (de)

Families Citing this family (47)

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BE1001440A4 (fr) * 1988-02-12 1989-10-31 Nationale Herstal Fn Sa Fab Procede de mesure de longueurs par camera a reseau photosensible.
JP2801628B2 (ja) * 1989-03-10 1998-09-21 株式会社トプコン 位置検出装置
AU619402B2 (en) * 1989-10-24 1992-01-23 Australian Wool Testing Authority Ltd Measuring dimensions of out-of-focus images
WO1991006827A1 (en) * 1989-10-24 1991-05-16 Australian Wool Testing Authority Ltd. Image analysis
DE4029013A1 (de) * 1990-09-13 1992-03-19 Thyssen Stahl Ag Messverfahren zur bestimmung der bruchdehnung einer zugprobe im rechnergesteuerten zugversuch
JPH04181105A (ja) * 1990-11-15 1992-06-29 Nec Kyushu Ltd 画像処理方法
JP2769750B2 (ja) * 1991-04-23 1998-06-25 リックス株式会社 ワークの寸法検査装置
US5149980A (en) * 1991-11-01 1992-09-22 Hewlett-Packard Company Substrate advance measurement system using cross-correlation of light sensor array signals
US5323473A (en) * 1992-04-02 1994-06-21 Ncr Corporation Method and apparatus for detecting the leading and trailing edges of a document in an image based system
US5345399A (en) * 1992-07-06 1994-09-06 Union Camp Corporation System and method for monitoring and controlling the width of a product
US5402049A (en) * 1992-12-18 1995-03-28 Georgia Tech Research Corporation System and method for controlling a variable reluctance spherical motor
US5410232A (en) * 1992-12-18 1995-04-25 Georgia Tech Research Corporation Spherical motor and method
CN1037026C (zh) * 1993-08-10 1998-01-14 中国科学院上海光学精密机械研究所 亚微米分辨率的光电混合测量装置及其测量方法
DE19707968C2 (de) * 1997-02-27 2000-06-21 Rainer Renz Verfahren und Vorrichtung zur Untersuchung der mechanisch-dynamischen Eigenschaften eines Werkstückes
JPH1134187A (ja) * 1997-07-15 1999-02-09 Mitsubishi Heavy Ind Ltd 製函用シート材の接合部判定方法及び製函用シート材の接合部判定装置
DE19839999C1 (de) * 1998-09-02 2000-05-04 Siemens Ag Verfahren und Vorrichtung zum Kalibrieren eines Verfahrwegs und/oder einer Winkellage einer Haltevorrichtung in einer Einrichtung zur Herstellung von elektrischen Baugruppen sowie Kalibriersubstrat
DE19848079A1 (de) * 1998-10-19 2000-04-20 M & F Maschinen Und Fertigungs Vorrichtung zur Werkzeugvoreinstellung
DE19902401C2 (de) * 1999-01-22 2001-02-01 Wohlenberg Schneidesysteme Gmb Verfahren und Vorrichtung zur Bestimmung der Geometrie von blattförmigem Gut oder Stapeln davon
US6912304B1 (en) * 1999-08-02 2005-06-28 Applied Materials, Inc. Two-dimensional scatter plot technique for defect inspection
US6525333B1 (en) * 2000-07-18 2003-02-25 Intelligent Machine Concepts, L.L.C. System and method for inspecting containers with openings with pipeline image processing
EP1225756A1 (de) * 2001-01-03 2002-07-24 Synoptics Limited Verfahren zur Herstellung eines Bildes
US20030118230A1 (en) * 2001-12-22 2003-06-26 Haoshi Song Coiled tubing inspection system using image pattern recognition
US6792811B2 (en) * 2002-03-04 2004-09-21 The Regents Of The University Of Michigan Method and system for measuring vibration of an object
US8180464B2 (en) * 2002-04-18 2012-05-15 Cleveland State University Extended active disturbance rejection controller
US6992756B1 (en) * 2002-10-21 2006-01-31 Og Technologies, Inc. Apparatus and method for movement measurement and position tracking of long, non-textured metal objects at an elevated temperature
US20040243341A1 (en) * 2003-05-30 2004-12-02 Le Cocq Christian A. Feature extraction methods and systems
KR100529334B1 (ko) 2003-07-04 2005-11-17 삼성전자주식회사 폐토너 이송장치 및 이를 채용한 전자사진방식 인쇄기
KR100503811B1 (ko) 2003-10-30 2005-07-26 삼성전자주식회사 전자사진방식 인쇄기의 이물질 방지부재
KR100934757B1 (ko) * 2004-07-20 2009-12-30 길현배 엑스레이 사진 보관용 촬영장치
US7423280B2 (en) 2004-08-09 2008-09-09 Quad/Tech, Inc. Web inspection module including contact image sensors
DE102004046752B4 (de) * 2004-09-24 2010-10-21 GOM, Gesellschaft für optische Meßtechnik mit beschränkter Haftung Verfahren zur dreidimensionalen Erfassung von Messobjekten
PL2244086T3 (pl) * 2006-04-08 2021-11-22 F. Hoffmann-La Roche Ag Analiza danych optycznych za pomocą histogramów
JP2011112512A (ja) * 2009-11-26 2011-06-09 Mitsubishi Heavy Ind Ltd 形状計測装置及び方法並びにプログラム
JP5563942B2 (ja) * 2010-09-29 2014-07-30 大日本スクリーン製造株式会社 エッジ位置検出装置およびエッジ位置検出方法
US8666188B2 (en) * 2011-03-23 2014-03-04 Xerox Corporation Identifying edges of web media using textural contrast between web media and backer roll
WO2012171627A1 (en) * 2011-06-14 2012-12-20 Tata Steel Nederland Technology B.V. Method and device of determining a tracking characteristic and/or strip width of a moving strip
RU2461142C1 (ru) * 2011-06-16 2012-09-10 Вячеслав Михайлович Смелков Телевизионная система для наблюдения за перемещением горячего проката
RU2472303C1 (ru) * 2011-11-18 2013-01-10 Вячеслав Михайлович Смелков Телевизионная система для наблюдения за перемещением горячего проката
DE102012003620B4 (de) * 2012-02-20 2014-02-27 Salzgitter Mannesmann Grobblech Gmbh Verfahren und Vorrichtung zur berührungslosen geometrischen Vermessung eines Messobjektes
JP6001911B2 (ja) * 2012-04-20 2016-10-05 ケイミュー株式会社 建材の寸法測定装置及び建材の寸法測定方法
RU2502211C1 (ru) * 2012-06-19 2013-12-20 Вячеслав Михайлович Смелков Телевизионная система для наблюдения за перемещением горячего проката
WO2014006147A1 (de) 2012-07-04 2014-01-09 Hexagon Technology Center Gmbh Optischer positionsgeber mit analogem speicher
WO2014104983A1 (en) * 2012-12-27 2014-07-03 Sieva, Podjetje Za Razvoj In Trzenje V Avtomobilski Industriji, D.O.O. Process and apparatus for measuring of thickness of a probe during a tension test
JP6182942B2 (ja) * 2013-04-04 2017-08-23 新日鐵住金株式会社 鋼板の寸法測定支援システム及び方法、情報処理装置
US9528945B2 (en) * 2014-08-28 2016-12-27 The Boeing Company Systems and methods for detecting crack growth
EP3104116A1 (de) * 2015-06-10 2016-12-14 Primetals Technologies Germany GmbH Optische erfassung einer bandgrösse mit bewegungskorrektur
US11803943B2 (en) * 2019-06-25 2023-10-31 Illinois Tool Works Inc. Brightness and contrast correction for video extensometer systems and methods

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU55975A1 (de) * 1968-04-26 1969-11-14
DE2819395C2 (de) * 1978-05-03 1980-01-10 Hoesch Werke Ag, 4600 Dortmund Verfahren und Vorrichtung zum Bestimmen der Breite von Walzerzeugnissen
GB2021762B (en) * 1978-05-17 1982-09-02 British Steel Corp Determining the dimensions of workpieces
US4490617A (en) * 1979-11-26 1984-12-25 European Electronic Systems Limited Optical width measuring system using two cameras
EP0094522A3 (de) * 1980-03-19 1984-07-18 European Electronic Systems Limited Randpositionsdetektion
GB2083214B (en) * 1980-09-03 1984-01-11 Baker Perkins Holdings Ltd Dimension monitoring apparatus
US4609934A (en) * 1984-04-06 1986-09-02 Advanced Micro Devices, Inc. Semiconductor device having grooves of different depths for improved device isolation

Also Published As

Publication number Publication date
AU597485B2 (en) 1990-05-31
AU1512888A (en) 1988-10-27
KR960010674B1 (ko) 1996-08-07
BR8801911A (pt) 1988-11-22
EP0289084A2 (de) 1988-11-02
EP0289084A3 (en) 1990-09-26
NZ224323A (en) 1989-10-27
ES2037198T3 (es) 1993-06-16
US5033096A (en) 1991-07-16
JPS63298101A (ja) 1988-12-05
DE3878297T2 (de) 1993-08-12
KR880012982A (ko) 1988-11-29
ATE85702T1 (de) 1993-02-15
CA1320548C (en) 1993-07-20
EP0289084B1 (de) 1993-02-10
EP0289084B2 (de) 1997-04-09
JPH0799322B2 (ja) 1995-10-25

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8366 Restricted maintained after opposition proceedings
8332 No legal effect for de