DE3850454D1 - Gerät und vorrichtung zur prüfung von kontaktunterbrechungen von schaltungszwischenverbindungen. - Google Patents
Gerät und vorrichtung zur prüfung von kontaktunterbrechungen von schaltungszwischenverbindungen.Info
- Publication number
- DE3850454D1 DE3850454D1 DE3850454T DE3850454T DE3850454D1 DE 3850454 D1 DE3850454 D1 DE 3850454D1 DE 3850454 T DE3850454 T DE 3850454T DE 3850454 T DE3850454 T DE 3850454T DE 3850454 D1 DE3850454 D1 DE 3850454D1
- Authority
- DE
- Germany
- Prior art keywords
- testing contact
- interconnect connections
- contact interruptions
- interruptions
- interconnect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
- G01R29/0273—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/013,323 US4751721A (en) | 1987-02-11 | 1987-02-11 | Apparatus and method for testing contact interruptions of circuit interconnection devices |
PCT/US1988/000422 WO1988006284A1 (en) | 1987-02-11 | 1988-02-10 | Apparatus and method for testing contact interruptions of circuit interconnection devices |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3850454D1 true DE3850454D1 (de) | 1994-08-04 |
Family
ID=21759377
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3850454T Expired - Lifetime DE3850454D1 (de) | 1987-02-11 | 1988-02-10 | Gerät und vorrichtung zur prüfung von kontaktunterbrechungen von schaltungszwischenverbindungen. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4751721A (de) |
EP (1) | EP0301084B1 (de) |
JP (1) | JPH01502531A (de) |
CA (1) | CA1273999A (de) |
DE (1) | DE3850454D1 (de) |
WO (1) | WO1988006284A1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4956781A (en) * | 1989-02-15 | 1990-09-11 | Delco Electronics Corporation | Counter driven RAM engine control |
US5227984A (en) * | 1991-03-08 | 1993-07-13 | John Fluke Mfg. Co., Inc. | Instrument with continuity capture feature |
US5646948A (en) * | 1993-09-03 | 1997-07-08 | Advantest Corporation | Apparatus for concurrently testing a plurality of semiconductor memories in parallel |
US5608769A (en) * | 1995-09-21 | 1997-03-04 | White Consolidated Industries, Inc. | Pause testing circuit for dishwasher controller |
JP2888291B2 (ja) * | 1996-12-05 | 1999-05-10 | 日本電気株式会社 | 信号断検出回路 |
FR2873448B1 (fr) * | 2004-07-23 | 2006-11-10 | Valeo Electronique Sys Liaison | Dispositif et procede de test d'au moins un joint conducteur formant une liaison electrique d'un composant electrique avec un circuit imprime |
US7120220B2 (en) * | 2004-12-23 | 2006-10-10 | Ramtron International Corporation | Non-volatile counter |
US8345816B1 (en) | 2011-12-06 | 2013-01-01 | International Business Machines Corporation | RAM-based event counters using transposition |
CN111257689B (zh) * | 2020-02-11 | 2020-11-27 | 西南交通大学 | 一种at供电接触网电气性能评估方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3575659A (en) * | 1969-04-23 | 1971-04-20 | Eg & G Inc | Apparatus for measuring characteristics of a signal pulse |
US3993949A (en) * | 1975-03-27 | 1976-11-23 | Magno Douglas J | Method and apparatus for detecting non-parallel reed switch contacts |
DE2909268C2 (de) * | 1979-03-09 | 1980-09-11 | Wandel & Goltermann Gmbh & Co, 7412 Eningen | Verfahren und Einrichtung zur Oberwachung der Funktion der in einem MeIistellenumschalter befindlichen Schalter |
US4288687A (en) * | 1979-08-16 | 1981-09-08 | Wallace Murray Corporation | Multipoint digital tachograph |
US4301360A (en) * | 1979-10-25 | 1981-11-17 | Tektronix, Inc. | Time interval meter |
JPS56153430A (en) * | 1980-04-30 | 1981-11-27 | Matsushita Electric Works Ltd | Bounce waveform memory circuit |
JPS57119261A (en) * | 1981-01-16 | 1982-07-24 | Canon Inc | Measuring device for dynamic characteristic of switch |
DE3213800A1 (de) * | 1982-04-15 | 1983-10-27 | Alfred Teves Gmbh, 6000 Frankfurt | Verfahren zur ausgabe von jeweils der impulsfrequenz und der periode zweier aufeinanderfolgender impulse einer impulsfolge entsprechender werte und vorrichtung zur durchfuehrung des verfahrens |
US4670891A (en) * | 1985-03-06 | 1987-06-02 | Westinghouse Electric Corp. | Storage of data in compressed form |
JPS61292570A (ja) * | 1985-06-20 | 1986-12-23 | Ando Electric Co Ltd | 複数のサンプリング系をもつロジックアナライザ |
-
1987
- 1987-02-11 US US07/013,323 patent/US4751721A/en not_active Expired - Lifetime
-
1988
- 1988-02-10 CA CA000558586A patent/CA1273999A/en not_active Expired - Fee Related
- 1988-02-10 WO PCT/US1988/000422 patent/WO1988006284A1/en active IP Right Grant
- 1988-02-10 EP EP88902312A patent/EP0301084B1/de not_active Expired - Lifetime
- 1988-02-10 JP JP63502285A patent/JPH01502531A/ja active Granted
- 1988-02-10 DE DE3850454T patent/DE3850454D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
WO1988006284A1 (en) | 1988-08-25 |
JPH0577989B2 (de) | 1993-10-27 |
EP0301084A4 (de) | 1989-06-13 |
JPH01502531A (ja) | 1989-08-31 |
US4751721A (en) | 1988-06-14 |
EP0301084A1 (de) | 1989-02-01 |
EP0301084B1 (de) | 1994-06-29 |
CA1273999A (en) | 1990-09-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |