DE3811854A1 - Vorrichtung zur 4-pol-kontaktierung - Google Patents

Vorrichtung zur 4-pol-kontaktierung

Info

Publication number
DE3811854A1
DE3811854A1 DE3811854A DE3811854A DE3811854A1 DE 3811854 A1 DE3811854 A1 DE 3811854A1 DE 3811854 A DE3811854 A DE 3811854A DE 3811854 A DE3811854 A DE 3811854A DE 3811854 A1 DE3811854 A1 DE 3811854A1
Authority
DE
Germany
Prior art keywords
contact
springs
spreading
contact springs
lever
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE3811854A
Other languages
German (de)
English (en)
Other versions
DE3811854C2 (enExample
Inventor
Klaus Flessa
Thomas Dipl Ing Fuss
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ITF ENGINEERING GMBH, 79249 MERZHAUSEN, DE
Original Assignee
ITRONIC FUCHS GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ITRONIC FUCHS GmbH filed Critical ITRONIC FUCHS GmbH
Priority to DE3811854A priority Critical patent/DE3811854A1/de
Publication of DE3811854A1 publication Critical patent/DE3811854A1/de
Application granted granted Critical
Publication of DE3811854C2 publication Critical patent/DE3811854C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
DE3811854A 1988-04-08 1988-04-08 Vorrichtung zur 4-pol-kontaktierung Granted DE3811854A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE3811854A DE3811854A1 (de) 1988-04-08 1988-04-08 Vorrichtung zur 4-pol-kontaktierung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3811854A DE3811854A1 (de) 1988-04-08 1988-04-08 Vorrichtung zur 4-pol-kontaktierung

Publications (2)

Publication Number Publication Date
DE3811854A1 true DE3811854A1 (de) 1989-10-26
DE3811854C2 DE3811854C2 (enExample) 1990-06-07

Family

ID=6351645

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3811854A Granted DE3811854A1 (de) 1988-04-08 1988-04-08 Vorrichtung zur 4-pol-kontaktierung

Country Status (1)

Country Link
DE (1) DE3811854A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4433693A1 (de) * 1993-11-17 1995-05-18 Rohm Co Ltd Chipwiderstand, Schaltung und Verfahren zur Stromerfassung, die diesen Chipwiderstand verwenden, sowie Verfahren zum Einstellen des Wertes dieses Chipwiderstandes
DE19736564B4 (de) * 1997-08-22 2013-05-29 Karl-Heinz Hoppe Kontaktvorrichtung

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
4 Draht Kelvin Kontaktierungssystem: Prospekt der Fa. Itronic-Fuchs GmbH *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4433693A1 (de) * 1993-11-17 1995-05-18 Rohm Co Ltd Chipwiderstand, Schaltung und Verfahren zur Stromerfassung, die diesen Chipwiderstand verwenden, sowie Verfahren zum Einstellen des Wertes dieses Chipwiderstandes
US5548269A (en) * 1993-11-17 1996-08-20 Rohm Co. Ltd. Chip resistor and method of adjusting resistance of the same
DE4433693C2 (de) * 1993-11-17 2000-01-05 Rohm Co Ltd Chipwiderstand und dessen Verwendung
DE19736564B4 (de) * 1997-08-22 2013-05-29 Karl-Heinz Hoppe Kontaktvorrichtung

Also Published As

Publication number Publication date
DE3811854C2 (enExample) 1990-06-07

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: ITF ROBOTIC GMBH, 79224 UMKIRCH, DE

8327 Change in the person/name/address of the patent owner

Owner name: ITF ENGINEERING GMBH, 79249 MERZHAUSEN, DE

8339 Ceased/non-payment of the annual fee