DE3750236T2 - Gerät zur In-line-Abfragesteuerung für Datenprozessorprüfung. - Google Patents

Gerät zur In-line-Abfragesteuerung für Datenprozessorprüfung.

Info

Publication number
DE3750236T2
DE3750236T2 DE3750236T DE3750236T DE3750236T2 DE 3750236 T2 DE3750236 T2 DE 3750236T2 DE 3750236 T DE3750236 T DE 3750236T DE 3750236 T DE3750236 T DE 3750236T DE 3750236 T2 DE3750236 T2 DE 3750236T2
Authority
DE
Germany
Prior art keywords
control device
data processor
query control
line query
processor testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3750236T
Other languages
English (en)
Other versions
DE3750236D1 (de
Inventor
Richard F Boyle
Leonard E Overhouse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tandem Computers Inc
Original Assignee
Tandem Computers Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tandem Computers Inc filed Critical Tandem Computers Inc
Publication of DE3750236D1 publication Critical patent/DE3750236D1/de
Application granted granted Critical
Publication of DE3750236T2 publication Critical patent/DE3750236T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318335—Test pattern compression or decompression
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE3750236T 1986-03-31 1987-03-17 Gerät zur In-line-Abfragesteuerung für Datenprozessorprüfung. Expired - Fee Related DE3750236T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/845,918 US4718065A (en) 1986-03-31 1986-03-31 In-line scan control apparatus for data processor testing

Publications (2)

Publication Number Publication Date
DE3750236D1 DE3750236D1 (de) 1994-08-25
DE3750236T2 true DE3750236T2 (de) 1994-12-15

Family

ID=25296422

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3750236T Expired - Fee Related DE3750236T2 (de) 1986-03-31 1987-03-17 Gerät zur In-line-Abfragesteuerung für Datenprozessorprüfung.

Country Status (5)

Country Link
US (1) US4718065A (de)
EP (1) EP0240199B1 (de)
JP (1) JPS62236043A (de)
AU (1) AU588982B2 (de)
DE (1) DE3750236T2 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0785099B2 (ja) * 1986-08-04 1995-09-13 三菱電機株式会社 半導体集積回路装置
JP2556017B2 (ja) * 1987-01-17 1996-11-20 日本電気株式会社 論理集積回路
US4780874A (en) * 1987-04-20 1988-10-25 Tandem Computers Incorporated Diagnostic apparatus for a data processing system
DE3719497A1 (de) * 1987-06-11 1988-12-29 Bosch Gmbh Robert System zur pruefung von digitalen schaltungen
JPH0255331U (de) * 1988-10-11 1990-04-20
US5029171A (en) * 1989-05-25 1991-07-02 Hughes Aircraft Company Test vector generation system
IL94115A (en) * 1990-04-18 1996-06-18 Ibm Israel Dynamic process for creating pseudo-random test templates for pompous hardware design violence
US5150366A (en) * 1990-08-01 1992-09-22 International Business Machines Corp. Reduced delay circuits for shift register latch scan strings
US5293123A (en) * 1990-10-19 1994-03-08 Tandem Computers Incorporated Pseudo-Random scan test apparatus
DE69126199T2 (de) * 1991-02-21 1997-10-16 Ibm Integrierter Schaltkreis mit eingebautem Selbsttest für die Erkennung logischer Fehler
JPH0785101B2 (ja) * 1991-03-20 1995-09-13 株式会社東芝 論理信号検査方法及び検査装置
US5515383A (en) * 1991-05-28 1996-05-07 The Boeing Company Built-in self-test system and method for self test of an integrated circuit
GR920100088A (el) * 1992-03-05 1993-11-30 Consulting R & D Corp Koloni S Διαφανής έλεγχος ολοκληρωμένων κυκλωμάτων.
JP2550837B2 (ja) * 1992-09-25 1996-11-06 日本電気株式会社 スキャンパスのテスト制御回路
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
EP0632467A1 (de) * 1993-06-30 1995-01-04 International Business Machines Corporation Integrierte Schaltung mit prozessorgestützer Selbsttestschaltung
US5416783A (en) * 1993-08-09 1995-05-16 Motorola, Inc. Method and apparatus for generating pseudorandom numbers or for performing data compression in a data processor
US5557619A (en) * 1994-04-04 1996-09-17 International Business Machines Corporation Integrated circuits with a processor-based array built-in self test circuit
US5694401A (en) * 1994-06-27 1997-12-02 Tandem Computers Incorporated Fault isolation using pseudo-random scan
JP3281211B2 (ja) * 1995-01-31 2002-05-13 富士通株式会社 同期式メモリを有する情報処理装置および同期式メモリ
US5991909A (en) * 1996-10-15 1999-11-23 Mentor Graphics Corporation Parallel decompressor and related methods and apparatuses
WO2000065364A1 (fr) * 1999-04-23 2000-11-02 Hitachi, Ltd. Ci a semi-conducteur et son procede d'elaboration
US6530057B1 (en) * 1999-05-27 2003-03-04 3Com Corporation High speed generation and checking of cyclic redundancy check values
GB2367912B (en) * 2000-08-08 2003-01-08 Sun Microsystems Inc Apparatus for testing computer memory
US6904553B1 (en) 2000-09-26 2005-06-07 Hewlett-Packard Development Company, L.P. Deterministic testing of edge-triggered logic
GB2395302B (en) * 2002-11-13 2005-12-28 Advanced Risc Mach Ltd Hardware driven state save/restore in a data processing system
US7174486B2 (en) * 2002-11-22 2007-02-06 International Business Machines Corporation Automation of fuse compression for an ASIC design system
DE102004004808A1 (de) * 2004-01-30 2005-08-25 Infineon Technologies Ag Verfahren und Vorrichtung zum Sichern und Einstellen eines Schaltungszustandes einer mikroelektronischen Schaltung
US8995417B2 (en) * 2008-06-09 2015-03-31 Qualcomm Incorporated Increasing capacity in wireless communication
JP6468846B2 (ja) * 2015-01-07 2019-02-13 ルネサスエレクトロニクス株式会社 画像符号化復号システムおよびその診断方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
US4326290A (en) * 1979-10-16 1982-04-20 Burroughs Corporation Means and methods for monitoring the storage states of a memory and other storage devices in a digital data processor
US4312066A (en) * 1979-12-28 1982-01-19 International Business Machines Corporation Diagnostic/debug machine architecture
JPS58205265A (ja) * 1982-05-26 1983-11-30 Fujitsu Ltd スキヤンル−プ・チエツク方式
ZA834008B (en) * 1982-06-11 1984-03-28 Int Computers Ltd Data processing system
US4513418A (en) * 1982-11-08 1985-04-23 International Business Machines Corporation Simultaneous self-testing system
JPS59174953A (ja) * 1983-03-25 1984-10-03 Fujitsu Ltd スキヤンイン／アウト制御方式
US4575674A (en) * 1983-07-01 1986-03-11 Motorola, Inc. Macrocell array having real time diagnostics
US4534028A (en) * 1983-12-01 1985-08-06 Siemens Corporate Research & Support, Inc. Random testing using scan path technique
US4602210A (en) * 1984-12-28 1986-07-22 General Electric Company Multiplexed-access scan testable integrated circuit

Also Published As

Publication number Publication date
AU7040987A (en) 1987-10-08
DE3750236D1 (de) 1994-08-25
EP0240199A2 (de) 1987-10-07
EP0240199B1 (de) 1994-07-20
US4718065A (en) 1988-01-05
EP0240199A3 (en) 1989-11-15
JPS62236043A (ja) 1987-10-16
AU588982B2 (en) 1989-09-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee