DE3683701D1 - Pruefung von integrierten schaltungen mittels elektronenstrahl. - Google Patents

Pruefung von integrierten schaltungen mittels elektronenstrahl.

Info

Publication number
DE3683701D1
DE3683701D1 DE8686304317T DE3683701T DE3683701D1 DE 3683701 D1 DE3683701 D1 DE 3683701D1 DE 8686304317 T DE8686304317 T DE 8686304317T DE 3683701 T DE3683701 T DE 3683701T DE 3683701 D1 DE3683701 D1 DE 3683701D1
Authority
DE
Germany
Prior art keywords
electron beam
integrated circuits
testing integrated
testing
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686304317T
Other languages
English (en)
Inventor
Denis Spicer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of DE3683701D1 publication Critical patent/DE3683701D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2443—Scintillation detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2448—Secondary particle detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24571—Measurements of non-electric or non-magnetic variables
    • H01J2237/24585—Other variables, e.g. energy, mass, velocity, time, temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24592—Inspection and quality control of devices

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE8686304317T 1985-06-17 1986-06-06 Pruefung von integrierten schaltungen mittels elektronenstrahl. Expired - Lifetime DE3683701D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB858515250A GB8515250D0 (en) 1985-06-17 1985-06-17 Testing of integrated circuits

Publications (1)

Publication Number Publication Date
DE3683701D1 true DE3683701D1 (de) 1992-03-12

Family

ID=10580844

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686304317T Expired - Lifetime DE3683701D1 (de) 1985-06-17 1986-06-06 Pruefung von integrierten schaltungen mittels elektronenstrahl.

Country Status (5)

Country Link
US (1) US4801879A (de)
EP (1) EP0209236B1 (de)
JP (1) JP2723215B2 (de)
DE (1) DE3683701D1 (de)
GB (1) GB8515250D0 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0663060B2 (ja) * 1986-06-09 1994-08-17 スカイアルミニウム株式会社 アルミニウム合金圧延板の製造方法
US4996659A (en) * 1986-08-20 1991-02-26 Hitachi, Ltd. Method of diagnosing integrated logic circuit
DE3708787A1 (de) * 1987-03-18 1988-09-29 Standard Elektrik Lorenz Ag Integrierte schaltung sowie verfahren und einrichtung zu ihrer pruefung
US5192378A (en) * 1990-11-13 1993-03-09 Aluminum Company Of America Aluminum alloy sheet for food and beverage containers
US6144037A (en) * 1998-06-18 2000-11-07 International Business Machines Corporation Capacitor charging sensor
US6359451B1 (en) 2000-02-11 2002-03-19 Image Graphics Incorporated System for contactless testing of printed circuit boards
WO2001058558A2 (en) 2000-02-14 2001-08-16 Eco 3 Max Inc. Process for removing volatile organic compounds from an air stream and apparatus therefor
US6967492B2 (en) * 2003-11-26 2005-11-22 Asm Assembly Automation Ltd. Spring contact probe device for electrical testing
US7891015B2 (en) * 2007-07-31 2011-02-15 Bruker Nano, Inc. High-bandwidth actuator drive for scanning probe microscopy

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2011193C3 (de) * 1970-03-10 1974-03-28 Siemens Ag, 1000 Berlin U. 8000 Muenchen Vorrichtung für die Elektronen-Rastermikroskopie und die Elektronenstrahl-Mikroanalyse
DE2823642A1 (de) * 1978-05-30 1980-01-03 Siemens Ag Verfahren zur beruehrungslosen potentialmessung an einem elektronischen bauelement
JPS55156867A (en) * 1979-05-28 1980-12-06 Hitachi Ltd Potential measuring device
DE3235484A1 (de) * 1982-09-24 1984-03-29 Siemens AG, 1000 Berlin und 8000 München Verfahren zur unterdrueckung einer stoerung bei der messung von signalverlaeufen mit einer korpuskularsonde und vorrichtung zur durchfuehrung eines solchen verfahrens
DE3334530A1 (de) * 1983-09-23 1985-04-04 Siemens AG, 1000 Berlin und 8000 München Verfahren zum raschen messen von elektrischen signalen an schaltungsknoten integrierter schaltungen, bei dem auch stoersignale erfasst werden, und vorrichtung zur durchfuehrung eines solchen verfahrens
GB8327737D0 (en) * 1983-10-17 1983-11-16 Texas Instruments Ltd Electron detector
US4721910A (en) * 1986-09-12 1988-01-26 American Telephone And Telegraph Company, At&T Bell Laboratories High speed circuit measurements using photoemission sampling

Also Published As

Publication number Publication date
EP0209236A1 (de) 1987-01-21
JPS6254183A (ja) 1987-03-09
US4801879A (en) 1989-01-31
JP2723215B2 (ja) 1998-03-09
GB8515250D0 (en) 1985-07-17
EP0209236B1 (de) 1992-01-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee