DE3887947D1 - Messanordnung von entfernungen. - Google Patents

Messanordnung von entfernungen.

Info

Publication number
DE3887947D1
DE3887947D1 DE88903130T DE3887947T DE3887947D1 DE 3887947 D1 DE3887947 D1 DE 3887947D1 DE 88903130 T DE88903130 T DE 88903130T DE 3887947 T DE3887947 T DE 3887947T DE 3887947 D1 DE3887947 D1 DE 3887947D1
Authority
DE
Germany
Prior art keywords
distances
measuring arrangement
measuring
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88903130T
Other languages
English (en)
Other versions
DE3887947T2 (de
Inventor
Timothy Peter Dabbs
Stephen Heggedus
Graham John Higgerson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commonwealth Scientific and Industrial Research Organization CSIRO
Original Assignee
Commonwealth Scientific and Industrial Research Organization CSIRO
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commonwealth Scientific and Industrial Research Organization CSIRO filed Critical Commonwealth Scientific and Industrial Research Organization CSIRO
Publication of DE3887947D1 publication Critical patent/DE3887947D1/de
Application granted granted Critical
Publication of DE3887947T2 publication Critical patent/DE3887947T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE3887947T 1987-03-24 1988-03-24 Messanordnung von entfernungen. Expired - Fee Related DE3887947T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AUPI104487 1987-03-24
AUPI474987 1987-10-07
PCT/AU1988/000084 WO1988007657A1 (en) 1987-03-24 1988-03-24 Distance measuring device

Publications (2)

Publication Number Publication Date
DE3887947D1 true DE3887947D1 (de) 1994-03-31
DE3887947T2 DE3887947T2 (de) 1994-06-01

Family

ID=25643249

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3887947T Expired - Fee Related DE3887947T2 (de) 1987-03-24 1988-03-24 Messanordnung von entfernungen.

Country Status (7)

Country Link
US (1) US5054926A (de)
EP (1) EP0308466B1 (de)
JP (1) JPH01502849A (de)
CA (1) CA1300369C (de)
DE (1) DE3887947T2 (de)
NZ (1) NZ223988A (de)
WO (1) WO1988007657A1 (de)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2839784B2 (ja) * 1992-04-03 1998-12-16 株式会社東海理化電機製作所 形状測定用光源装置
JP3206843B2 (ja) * 1992-12-18 2001-09-10 株式会社小松製作所 ３次元画像計測装置
US5455899A (en) * 1992-12-31 1995-10-03 International Business Machines Corporation High speed image data processing circuit
US5369284A (en) * 1993-03-30 1994-11-29 The Charles Stark Draper Laboratory, Inc. Active edge position measuring device
US5513276A (en) * 1994-06-02 1996-04-30 The Board Of Regents Of The University Of Oklahoma Apparatus and method for three-dimensional perspective imaging of objects
US5923465A (en) * 1994-10-28 1999-07-13 Marc J. Byrd System for scanning confocal image reconstruction from coherent recordings
US5543918A (en) * 1995-01-06 1996-08-06 International Business Machines Corporation Through-the-lens confocal height measurement
US5813987A (en) * 1995-08-01 1998-09-29 Medispectra, Inc. Spectral volume microprobe for analysis of materials
US5713364A (en) * 1995-08-01 1998-02-03 Medispectra, Inc. Spectral volume microprobe analysis of materials
US6104945A (en) * 1995-08-01 2000-08-15 Medispectra, Inc. Spectral volume microprobe arrays
US6847490B1 (en) 1997-01-13 2005-01-25 Medispectra, Inc. Optical probe accessory device for use in vivo diagnostic procedures
US6826422B1 (en) 1997-01-13 2004-11-30 Medispectra, Inc. Spectral volume microprobe arrays
DE19801511C2 (de) * 1998-01-16 2001-12-06 Wieland Werke Ag Verfahren zur Konturerfassung mittels Mikrowellen und Vorrichtung zur Durchführung des Verfahrens
US6388788B1 (en) 1998-03-16 2002-05-14 Praelux, Inc. Method and apparatus for screening chemical compounds
US20030036855A1 (en) * 1998-03-16 2003-02-20 Praelux Incorporated, A Corporation Of New Jersey Method and apparatus for screening chemical compounds
FR2779517B1 (fr) * 1998-06-05 2000-08-18 Architecture Traitement D Imag Procede et dispositif d'acquisition opto-electrique de formes par illumination axiale
AU759282B2 (en) 1998-12-23 2003-04-10 Medispectra, Inc. Systems and methods for optical examination of samples
AU760402B2 (en) 1998-12-23 2003-05-15 Medispectra, Inc. Optical methods and systems for cervical screening
US6548796B1 (en) * 1999-06-23 2003-04-15 Regents Of The University Of Minnesota Confocal macroscope
US7187810B2 (en) 1999-12-15 2007-03-06 Medispectra, Inc. Methods and systems for correcting image misalignment
US7260248B2 (en) 1999-12-15 2007-08-21 Medispectra, Inc. Image processing using measures of similarity
US20020007122A1 (en) 1999-12-15 2002-01-17 Howard Kaufman Methods of diagnosing disease
EP1126412B1 (de) * 2000-02-16 2013-01-30 FUJIFILM Corporation Bilderfassungsgerät und Abstandsmessverfahren
DE10026830A1 (de) 2000-05-30 2001-12-06 Zeiss Carl Jena Gmbh Optischer Sensor zur Messung des Abstands und/oder der Neigung einer Fläche
US6839661B2 (en) 2000-12-15 2005-01-04 Medispectra, Inc. System for normalizing spectra
US6856399B2 (en) * 2001-04-11 2005-02-15 Modern Optical Technologies L.L.C. Method and apparatus for measuring pressure
WO2003091661A1 (en) * 2002-04-26 2003-11-06 Massachussetts Institute Of Technology Adjustable focusing composite for use in an optical profilometer system and method
US7282723B2 (en) 2002-07-09 2007-10-16 Medispectra, Inc. Methods and apparatus for processing spectral data for use in tissue characterization
US6818903B2 (en) * 2002-07-09 2004-11-16 Medispectra, Inc. Method and apparatus for identifying spectral artifacts
US7459696B2 (en) 2003-04-18 2008-12-02 Schomacker Kevin T Methods and apparatus for calibrating spectral data
US7309867B2 (en) 2003-04-18 2007-12-18 Medispectra, Inc. Methods and apparatus for characterization of tissue samples
US7136518B2 (en) 2003-04-18 2006-11-14 Medispectra, Inc. Methods and apparatus for displaying diagnostic data
US6933154B2 (en) 2002-07-09 2005-08-23 Medispectra, Inc. Optimal windows for obtaining optical data for characterization of tissue samples
US7469160B2 (en) 2003-04-18 2008-12-23 Banks Perry S Methods and apparatus for evaluating image focus
US6768918B2 (en) 2002-07-10 2004-07-27 Medispectra, Inc. Fluorescent fiberoptic probe for tissue health discrimination and method of use thereof
US7103401B2 (en) 2002-07-10 2006-09-05 Medispectra, Inc. Colonic polyp discrimination by tissue fluorescence and fiberoptic probe
US7327440B2 (en) 2004-08-16 2008-02-05 James N. Horn Distance measuring device
JP2006226869A (ja) * 2005-02-18 2006-08-31 Sunx Ltd 光学測定装置、光学顕微鏡及び光学測定方法
WO2007033851A1 (de) * 2005-09-22 2007-03-29 Robert Bosch Gmbh Interferometrische schichtdickenbestimmung
EP2065752A1 (de) * 2007-11-23 2009-06-03 Koninklijke Philips Electronics N.V. Optisches Beleuchtungsgerät zum Beleuchten einer Probe mit einem Linienstrahl
WO2012154627A2 (en) * 2011-05-06 2012-11-15 California Institute Of Technology Light delivery device and related compositions, methods and systems
US10895727B1 (en) 2019-10-19 2021-01-19 SequLITE Genomics US, Inc. Microscope for locating structures on the inner surface of a fluidic channel

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4148587A (en) * 1977-10-03 1979-04-10 The Boeing Company Laser gauge for measuring changes in the surface contour of a moving part
AU4879579A (en) * 1978-07-11 1980-03-06 Commonwealth Scientific And Industrial Research Organisation Profile measurement
JPS56133602A (en) * 1980-03-24 1981-10-19 Ritsuo Hasumi Noncontacting optical roughness gauge
JPS57113311A (en) * 1980-12-29 1982-07-14 Matsushita Electric Works Ltd Measuring device for surface coarseness of object
EP0071667A1 (de) * 1981-08-11 1983-02-16 Karl-Erik Morander Vorrichtung zur Bestimmung des reellen oder virtuellen Abstands einer Lichtquelle von einer Messebene
JPS58122410A (ja) * 1982-01-13 1983-07-21 Fujitsu Ltd 表面形状測定方法
US4657393A (en) * 1983-12-29 1987-04-14 Robotic Vision Systems, Inc. Pattern optimization when measuring depth to a surface using lens focusing
US4626103A (en) * 1984-03-29 1986-12-02 At&T Bell Laboratories Focus tracking system
US4650333A (en) * 1984-04-12 1987-03-17 International Business Machines Corporation System for measuring and detecting printed circuit wiring defects
GB2158228A (en) * 1984-05-05 1985-11-06 Spectron Dev Lab Inc Astigmatic non-contact optical probe
DE3523411A1 (de) * 1985-06-29 1987-02-05 Ymos Ag Ind Produkte Verfahren und vorrichtung zum ermitteln der kontur eines profiles, insbesondere eines kunststoffummantelten oder coextrudierten, asymmetrischen kunststoffprofiles

Also Published As

Publication number Publication date
NZ223988A (en) 1990-11-27
US5054926A (en) 1991-10-08
JPH01502849A (ja) 1989-09-28
EP0308466B1 (de) 1994-02-23
WO1988007657A1 (en) 1988-10-06
EP0308466A4 (en) 1991-09-04
AU1621288A (en) 1988-11-02
DE3887947T2 (de) 1994-06-01
AU596306B2 (en) 1990-04-26
EP0308466A1 (de) 1989-03-29
CA1300369C (en) 1992-05-12

Similar Documents

Publication Publication Date Title
DE3887947T2 (de) Messanordnung von entfernungen.
DE3779824T2 (de) Koordinaten-messung.
ES2019877B3 (es) Estrangulador de medida.
DE3879806D1 (de) Polymerisierung von aethylen.
DK709288A (da) Hidtil ukendte forbindelser
DK691488A (da) Hidtil ukendte forbindelser
FI871401A0 (fi) Foer laongstraeckta instrument avsedd snaeppbar haollare.
DE3861579D1 (de) Messkopf.
DE3783971D1 (de) Messung von feuchtigkeitsgeschichtetem material.
FI883382A0 (fi) Anvaendning av olefinfoereningar.
ATE112172T1 (de) Targetformer von antitumor-methyltrithioagenzien.
DE3777219D1 (de) Messwertaufnehmer.
FI880492A0 (fi) Synkroniseringssystem foer en halvdigital signal.
NO883955D0 (no) Xx
DE3879240D1 (de) Vermessungsinstrument.
DK468788D0 (da) Hidtil ukendt forbindelser
DK578088A (da) Hidtil ukendte forbindelser
DK702588A (da) Hidtil ukendte forbindelser
NO860960L (no) Avsetningsinhibitorer.
DK709388A (da) Hidtil ukendte forbindelser
DE3877222D1 (de) Messfuehler.
ATE101918T1 (de) Messanordnung von entfernungen.
FI852876L (fi) Anordning foer undervattensarbete.
DE3881393D1 (de) Dehydrobromierung von substituiertem alpha-halocumol.
FI841148A0 (fi) Skaeranordning foer nedskrotning.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee