DE3481446D1 - Verfahren zur spektrometrischen analyse einer organometallischen zusammensetzung. - Google Patents

Verfahren zur spektrometrischen analyse einer organometallischen zusammensetzung.

Info

Publication number
DE3481446D1
DE3481446D1 DE8484304197T DE3481446T DE3481446D1 DE 3481446 D1 DE3481446 D1 DE 3481446D1 DE 8484304197 T DE8484304197 T DE 8484304197T DE 3481446 T DE3481446 T DE 3481446T DE 3481446 D1 DE3481446 D1 DE 3481446D1
Authority
DE
Germany
Prior art keywords
sample
spectrometric analysis
organometallic composition
analysing
volatile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8484304197T
Other languages
English (en)
Inventor
Ramon M Barnes
Istavan Bertenyl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATK Launch Systems LLC
Original Assignee
Morton Thiokol Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Morton Thiokol Inc filed Critical Morton Thiokol Inc
Application granted granted Critical
Publication of DE3481446D1 publication Critical patent/DE3481446D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N31/00Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00Chemistry: analytical and immunological testing
    • Y10T436/25Chemistry: analytical and immunological testing including sample preparation
    • Y10T436/25625Dilution

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE8484304197T 1983-06-24 1984-06-21 Verfahren zur spektrometrischen analyse einer organometallischen zusammensetzung. Expired - Lifetime DE3481446D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/507,597 US4688935A (en) 1983-06-24 1983-06-24 Plasma spectroscopic analysis of organometallic compounds

Publications (1)

Publication Number Publication Date
DE3481446D1 true DE3481446D1 (de) 1990-04-05

Family

ID=24019290

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484304197T Expired - Lifetime DE3481446D1 (de) 1983-06-24 1984-06-21 Verfahren zur spektrometrischen analyse einer organometallischen zusammensetzung.

Country Status (10)

Country Link
US (1) US4688935A (de)
EP (2) EP0132300B1 (de)
JP (1) JPS6020136A (de)
AT (1) ATE50643T1 (de)
AU (2) AU574368B2 (de)
BR (1) BR8403064A (de)
CA (1) CA1222074A (de)
DE (1) DE3481446D1 (de)
IL (1) IL72118A0 (de)
ZA (1) ZA844432B (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH662074A5 (en) * 1984-10-16 1987-09-15 Charmilles Technologies Method for controlling the sparking conditions during electrical discharge (spark erosion) machining and device for its implementation
US4926021A (en) * 1988-09-09 1990-05-15 Amax Inc. Reactive gas sample introduction system for an inductively coupled plasma mass spectrometer
DE69108763T2 (de) * 1990-02-27 1995-08-24 Cytec Tech Corp Verfahren und Vorrichtung zum Einspritzen von Komponenten in Plasma zur "ICP-OES"-Analyse.
US6201892B1 (en) 1997-02-26 2001-03-13 Acuity Imaging, Llc System and method for arithmetic operations for electronic package inspection
US5943125A (en) * 1997-02-26 1999-08-24 Acuity Imaging, Llc Ring illumination apparatus for illuminating reflective elements on a generally planar surface
US5828449A (en) * 1997-02-26 1998-10-27 Acuity Imaging, Llc Ring illumination reflective elements on a generally planar surface
US5926557A (en) * 1997-02-26 1999-07-20 Acuity Imaging, Llc Inspection method
US6118524A (en) * 1997-02-26 2000-09-12 Acuity Imaging, Llc Arc illumination apparatus and method
US6236747B1 (en) 1997-02-26 2001-05-22 Acuity Imaging, Llc System and method for image subtraction for ball and bumped grid array inspection
US6741345B2 (en) * 2001-02-08 2004-05-25 National Research Council Of Canada Method and apparatus for in-process liquid analysis by laser induced plasma spectroscopy
JP3821227B2 (ja) * 2002-09-19 2006-09-13 信越化学工業株式会社 有機金属化合物の気化供給装置
TW200407328A (en) * 2002-09-19 2004-05-16 Shinetsu Chemical Co Liquid organometallic compound vaporizing/feeding system
US8124207B2 (en) * 2004-03-02 2012-02-28 Sakhrani Vinay G Article with lubricated surface and method
US8084103B2 (en) * 2006-08-15 2011-12-27 Sakhrani Vinay G Method for treating a hydrophilic surface
US8134096B2 (en) 2006-10-20 2012-03-13 Mitsubishi Electric Corporation Power supply-control device for electrical discharge machining apparatus
US8481930B2 (en) 2010-06-15 2013-07-09 Saudi Arabian Oil Company Apparatus and method for replicating liquid blends and identifying the ratios of their liquid ingredients
JP5569336B2 (ja) * 2010-10-29 2014-08-13 宇部興産株式会社 高純度有機金属化合物の分析用処理液及び当該処理液を用いた微量不純物の分析方法、並びに当該分析方法を経た高純度有機金属化合物
US9133412B2 (en) 2012-07-09 2015-09-15 Tribofilm Research, Inc. Activated gaseous species for improved lubrication
JP6398206B2 (ja) * 2013-02-21 2018-10-03 宇部興産株式会社 微量不純物を分析する方法、及び当該分析に用いるプラズマトーチ
JP5862701B2 (ja) * 2014-04-24 2016-02-16 宇部興産株式会社 高純度有機金属化合物を合格品とする方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3922475A (en) * 1970-06-22 1975-11-25 Rockwell International Corp Process for producing nitride films
US3824016A (en) * 1972-06-16 1974-07-16 R Woodriff Combined sample collection and vaporization system for spectro-chemical analysis
US3888628A (en) * 1972-08-03 1975-06-10 J Wallace Graham Analytical method and apparatus
US3911723A (en) * 1974-08-08 1975-10-14 Us Commerce Exponential dilution flask
JPS5135387A (ja) * 1974-09-20 1976-03-25 Nippon Electron Optics Lab Shiryogenshikasochi
US4259573A (en) * 1979-11-05 1981-03-31 E. I. Du Pont De Nemours And Company Method of determining small concentrations of chemical compounds by plasma chromatography
US4300393A (en) * 1979-12-14 1981-11-17 Stearns Stanley D Sample introduction apparatus for gas chromatographic analysis using packed or capillary bore open tubular columns and method of testing
JPS5726734A (en) * 1980-07-24 1982-02-12 Toshiba Corp Analysis of si in gaas
US4334882A (en) * 1981-04-01 1982-06-15 Mobil Oil Corporation Determination of pyrite and siderite content of formation deposits
JPS58106443A (ja) * 1981-12-18 1983-06-24 Seiko Instr & Electronics Ltd 高周波誘導プラズマ発光分析装置用試料導入装置
US4454095A (en) * 1982-07-21 1984-06-12 Harbor Branch Foundation, Inc. Automatic chemical analysis devices and methods
JPH106443A (ja) * 1996-06-26 1998-01-13 Mitsubishi Materials Corp セラミックスグリーンシート成形用キャリアーフィルム

Also Published As

Publication number Publication date
EP0132300B1 (de) 1990-02-28
EP0132300A3 (en) 1986-05-14
EP0310149A1 (de) 1989-04-05
CA1222074A (en) 1987-05-19
EP0132300A2 (de) 1985-01-30
IL72118A0 (en) 1984-10-31
US4688935A (en) 1987-08-25
ATE50643T1 (de) 1990-03-15
BR8403064A (pt) 1985-05-28
AU2956284A (en) 1985-01-03
AU574368B2 (en) 1988-07-07
ZA844432B (en) 1985-01-30
JPS6020136A (ja) 1985-02-01
AU1569388A (en) 1988-07-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee