DE3412980C2 - - Google Patents

Info

Publication number
DE3412980C2
DE3412980C2 DE3412980A DE3412980A DE3412980C2 DE 3412980 C2 DE3412980 C2 DE 3412980C2 DE 3412980 A DE3412980 A DE 3412980A DE 3412980 A DE3412980 A DE 3412980A DE 3412980 C2 DE3412980 C2 DE 3412980C2
Authority
DE
Germany
Prior art keywords
layer
reflection
transparent spacer
remaining
transparent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3412980A
Other languages
German (de)
English (en)
Other versions
DE3412980A1 (de
Inventor
Heinz 8225 Traunreut De Kraus
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Priority to DE19843412980 priority Critical patent/DE3412980A1/de
Priority to DE8585101400T priority patent/DE3564619D1/de
Priority to AT85101400T priority patent/ATE36761T1/de
Priority to EP85101400A priority patent/EP0160784B1/de
Priority to US06/716,396 priority patent/US4708437A/en
Priority to JP60069252A priority patent/JPS60225103A/ja
Publication of DE3412980A1 publication Critical patent/DE3412980A1/de
Application granted granted Critical
Publication of DE3412980C2 publication Critical patent/DE3412980C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1847—Manufacturing methods
    • G02B5/1857—Manufacturing methods using exposure or etching means, e.g. holography, photolithography, exposure to electron or ion beams
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S359/00—Optical: systems and elements
    • Y10S359/90—Methods

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Optical Transform (AREA)
DE19843412980 1984-04-06 1984-04-06 Auflichtphasengitter und verfahren zur herstellung eines auflichtphasengitters Granted DE3412980A1 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE19843412980 DE3412980A1 (de) 1984-04-06 1984-04-06 Auflichtphasengitter und verfahren zur herstellung eines auflichtphasengitters
DE8585101400T DE3564619D1 (en) 1984-04-06 1985-02-09 Reflection phase grating and process for its manufacture
AT85101400T ATE36761T1 (de) 1984-04-06 1985-02-09 Auflichtphasengitter und verfahren zur herstellung eines auflichtphasengitters.
EP85101400A EP0160784B1 (de) 1984-04-06 1985-02-09 Auflichtphasengitter und Verfahren zur Herstellung eines Auflichtphasengitters
US06/716,396 US4708437A (en) 1984-04-06 1985-03-27 Incident-light phase grid and method for making same
JP60069252A JPS60225103A (ja) 1984-04-06 1985-04-03 反射位相格子及び反射位相格子の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843412980 DE3412980A1 (de) 1984-04-06 1984-04-06 Auflichtphasengitter und verfahren zur herstellung eines auflichtphasengitters

Publications (2)

Publication Number Publication Date
DE3412980A1 DE3412980A1 (de) 1985-10-17
DE3412980C2 true DE3412980C2 (enrdf_load_html_response) 1990-05-03

Family

ID=6232847

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19843412980 Granted DE3412980A1 (de) 1984-04-06 1984-04-06 Auflichtphasengitter und verfahren zur herstellung eines auflichtphasengitters
DE8585101400T Expired DE3564619D1 (en) 1984-04-06 1985-02-09 Reflection phase grating and process for its manufacture

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE8585101400T Expired DE3564619D1 (en) 1984-04-06 1985-02-09 Reflection phase grating and process for its manufacture

Country Status (5)

Country Link
US (1) US4708437A (enrdf_load_html_response)
EP (1) EP0160784B1 (enrdf_load_html_response)
JP (1) JPS60225103A (enrdf_load_html_response)
AT (1) ATE36761T1 (enrdf_load_html_response)
DE (2) DE3412980A1 (enrdf_load_html_response)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63185101U (enrdf_load_html_response) * 1987-05-20 1988-11-29
US4828356A (en) * 1987-12-22 1989-05-09 Hughes Aircraft Company Method for fabrication of low efficiency diffraction gratings and product obtained thereby
DE4303975A1 (de) * 1993-02-11 1994-08-18 Heidenhain Gmbh Dr Johannes Teilungsträger
ATE210832T1 (de) * 1995-04-13 2001-12-15 Heidenhain Gmbh Dr Johannes Ma stab und verfahren zur herstellung eines ma stabes sowie positionsmesseinrichtung
DE59507969D1 (de) * 1995-11-11 2000-04-13 Heidenhain Gmbh Dr Johannes Auflicht-Phasengitter
DE19754595B4 (de) * 1997-12-10 2011-06-01 Dr. Johannes Heidenhain Gmbh Lichtelektrische Positionsmeßeinrichtung
DE10150099A1 (de) 2001-10-11 2003-04-17 Heidenhain Gmbh Dr Johannes Verfahren zur Herstellung eines Maßstabes, sowie derart hergestellter Maßstab und eine Positionsmesseinrichtung
DE10236788A1 (de) * 2002-08-10 2004-03-04 Dr. Johannes Heidenhain Gmbh Maßverkörperung in Form eines Amplitudengitters, sowie eine Positionsmesseinrichtung
US7085057B2 (en) * 2003-10-15 2006-08-01 Invenios Direct-write system and method for roll-to-roll manufacturing of reflective gratings
CN100397045C (zh) * 2004-01-26 2008-06-25 三丰株式会社 标尺的制造方法和光电式编码器
DE102016201068A1 (de) * 2016-01-26 2017-07-27 Dr. Johannes Heidenhain Gmbh Maßverkörperung und Positionsmesseinrichtung mit dieser Maßverkörperung
CN107015373B (zh) * 2017-06-16 2019-08-02 宁波维真显示科技股份有限公司 光栅对位贴合方法
WO2020223134A1 (en) * 2019-04-28 2020-11-05 Leia Inc. Method of fabricating diffractive backlight
CN111156906B (zh) * 2020-01-10 2021-06-11 中北大学 基于四象限光栅及探测器的二维微位移传感器
CN111595243A (zh) * 2020-06-03 2020-08-28 中北大学 一种基于四象限光栅的三维微位移传感器结构

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB896934A (en) * 1959-05-21 1962-05-23 Ass Elect Ind Improvements relating to diffraction gratings
GB1356430A (en) * 1971-08-09 1974-06-12 Rank Organisation Ltd Optical elements
US3768911A (en) * 1971-08-17 1973-10-30 Keuffel & Esser Co Electro-optical incremental motion and position indicator
US3777633A (en) * 1972-02-25 1973-12-11 Ibm Structure for making phase filters
US4124473A (en) * 1977-06-17 1978-11-07 Rca Corporation Fabrication of multi-level relief patterns in a substrate
JPS5455456A (en) * 1977-10-12 1979-05-02 Canon Inc Method of composing and separating plural beams
FR2470393A1 (fr) * 1979-11-19 1981-05-29 Labo Electronique Physique Procede de realisation d'une structure planaire a grande frequence spatiale et de grande longueur
US4426130A (en) * 1981-02-19 1984-01-17 Rca Corporation Semi-thick transmissive and reflective sinusoidal phase grating structures

Also Published As

Publication number Publication date
US4708437A (en) 1987-11-24
JPH0377961B2 (enrdf_load_html_response) 1991-12-12
ATE36761T1 (de) 1988-09-15
EP0160784A3 (en) 1986-12-03
DE3412980A1 (de) 1985-10-17
JPS60225103A (ja) 1985-11-09
DE3564619D1 (en) 1988-09-29
EP0160784A2 (de) 1985-11-13
EP0160784B1 (de) 1988-08-24

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee