DE3380776D1 - X-ray imaging system having radiation scatter compensation and method - Google Patents

X-ray imaging system having radiation scatter compensation and method

Info

Publication number
DE3380776D1
DE3380776D1 DE8383305110T DE3380776T DE3380776D1 DE 3380776 D1 DE3380776 D1 DE 3380776D1 DE 8383305110 T DE8383305110 T DE 8383305110T DE 3380776 T DE3380776 T DE 3380776T DE 3380776 D1 DE3380776 D1 DE 3380776D1
Authority
DE
Germany
Prior art keywords
imaging system
ray imaging
radiation scatter
scatter compensation
compensation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383305110T
Other languages
English (en)
Inventor
Albert Nmi Macovski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leland Stanford Junior University
Original Assignee
Leland Stanford Junior University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leland Stanford Junior University filed Critical Leland Stanford Junior University
Application granted granted Critical
Publication of DE3380776D1 publication Critical patent/DE3380776D1/de
Expired legal-status Critical Current

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/483—Diagnostic techniques involving scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/482—Diagnostic techniques involving multiple energy imaging

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Veterinary Medicine (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Toxicology (AREA)
  • Public Health (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Drying Of Semiconductors (AREA)
DE8383305110T 1982-09-07 1983-09-02 X-ray imaging system having radiation scatter compensation and method Expired DE3380776D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US41533382A 1982-09-07 1982-09-07

Publications (1)

Publication Number Publication Date
DE3380776D1 true DE3380776D1 (en) 1989-11-30

Family

ID=23645274

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383305110T Expired DE3380776D1 (en) 1982-09-07 1983-09-02 X-ray imaging system having radiation scatter compensation and method

Country Status (5)

Country Link
EP (1) EP0105618B1 (de)
JP (1) JPS59131151A (de)
DE (1) DE3380776D1 (de)
ES (1) ES8500540A1 (de)
IL (1) IL69647A (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0123276B1 (de) * 1983-04-25 1988-03-02 Kabushiki Kaisha Toshiba Röntgendiagnostikgerät
US4649559A (en) * 1983-10-31 1987-03-10 Xonics Imaging, Inc. Digital radiography device
JPS60111637A (ja) * 1983-11-22 1985-06-18 株式会社東芝 Ｘ線診断装置
JPS60181638A (ja) * 1984-02-29 1985-09-17 Toshiba Corp 放射線像撮影装置
JPS60210087A (ja) * 1984-04-03 1985-10-22 Toshiba Corp Ｘ線診断装置
JPS61249452A (ja) * 1985-04-30 1986-11-06 株式会社東芝 Ｘ線診断装置
US4727562A (en) * 1985-09-16 1988-02-23 General Electric Company Measurement of scatter in x-ray imaging
JPS62191972A (ja) * 1986-02-18 1987-08-22 Toshiba Corp Ｘ線画像処理装置
DE3764315D1 (de) * 1986-05-28 1990-09-20 Heimann Gmbh Roentgenscanner.
DE3705605A1 (de) * 1986-08-14 1988-02-18 Kurt Dr Sauerwein Verfahren und vorrichtung zum verbessern der qualitaet von durchstrahlungsbildern
DE3763460D1 (de) * 1986-11-26 1990-08-02 Heimann Gmbh Roentgenscanner.
JPH02114946A (ja) * 1988-10-24 1990-04-27 Toshiba Corp Ｘ線診断装置
JPH0469681U (de) * 1990-10-23 1992-06-19
US6052433A (en) * 1995-12-29 2000-04-18 Advanced Optical Technologies, Inc. Apparatus and method for dual-energy x-ray imaging
US5648997A (en) * 1995-12-29 1997-07-15 Advanced Optical Technologies, Inc. Apparatus and method for removing scatter from an x-ray image
FR2766044B1 (fr) * 1997-07-11 1999-10-08 Ge Medical Syst Sa Procede de traitement d'une sequence d'images radiologiques d'un objet
JP3999179B2 (ja) * 2003-09-09 2007-10-31 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置
US7263164B2 (en) * 2004-04-30 2007-08-28 Siemens Medical Solutions Usa, Inc. Imaging system to compensate for x-ray scatter
CN101421799A (zh) * 2006-04-11 2009-04-29 皇家飞利浦电子股份有限公司 产生包含比例减少的散射辐射的x射线图像
US8000512B2 (en) * 2007-10-03 2011-08-16 General Electric Company Slit collimator scatter correction
US9364191B2 (en) 2013-02-11 2016-06-14 University Of Rochester Method and apparatus of spectral differential phase-contrast cone-beam CT and hybrid cone-beam CT

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2452166A1 (de) * 1974-11-02 1976-05-13 Philips Patentverwaltung Anordnung zum verringern des streustrahleneinflusses
GB1571800A (en) * 1976-01-15 1980-07-16 Emi Ltd Radiography
DE2821083A1 (de) * 1978-05-13 1979-11-22 Philips Patentverwaltung Anordnung zur ermittlung der raeumlichen absorptionsverteilung in einem ebenen untersuchungsbereich
DE2944147A1 (de) * 1979-11-02 1981-05-14 Philips Patentverwaltung Gmbh, 2000 Hamburg Anordnung zur ermittlung der streudichteverteilung in einem ebenen untersuchungsbereich
FR2526575A1 (fr) * 1982-05-04 1983-11-10 Thomson Csf Procede de traitement d'image radiologique en vue de corriger ladite image des defauts dus au rayonnement diffuse

Also Published As

Publication number Publication date
JPH0233975B2 (de) 1990-07-31
JPS59131151A (ja) 1984-07-27
EP0105618A3 (en) 1985-11-27
EP0105618B1 (de) 1989-10-25
IL69647A (en) 1986-11-30
EP0105618A2 (de) 1984-04-18
ES525814A0 (es) 1984-10-01
IL69647A0 (en) 1983-12-30
ES8500540A1 (es) 1984-10-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee